Group-III nitride semiconductor device and method for fabricating the same
The present application discloses a group-III nitride semiconductor device, which comprises a substrate, a buffer layer, a semiconductor stack structure, and a passivation film. The buffer layer is disposed on the substrate. The semiconductor stack structure is disposed on the buffer layer and comprises a gate, a source, and a drain. In addition, a gate insulating layer is disposed between the gate and the semiconductor stack structure for forming a HEMT. The passivation film covers the HEMT and includes a plurality of openings corresponding to the gate, the source, and the drain, respectively. The material of the passivation film is silicon oxynitride.
1. A semiconductor stack structure of Ga-face AlGaN/GaN, comprising:
a substrate;
a buffer layer, disposed on said substrate;
an i-GaN layer, located on said buffer layer;
an i-Al(y)GaN buffer layer, located on said i-GaN layer;
an i-GaN channel layer, located on said i-Al(y)GaN buffer layer; and
an i-Al(x)GaN layer, located on said i-GaN channel layer;
where x=0.1-0.3; y=0.05-0.3, and x>y, a distance from said i-Al(x)GaN layer to said i-GaN (C-doped) layer is less than 250 nm, the material of said buffer layer is carbon doped gallium nitride, said i-GaN layer is doped by carbon and is a highest carbon doping level to other layers, said i-GaN, said i-Al(y)GaN buffer, said i-GaN channel and said i-Al(x)GaN layers are formed as a high electron mobility transistor while said buffer layer is doped by carbon to increase a resistance thereof.
2. A group-III nitride semiconductor device, comprising:
a substrate;
a buffer layer, disposed on said substrate;
a first semiconductor stack structure, disposed on said buffer layer, comprising a gate, a source, and a drain, a gate insulating layer disposed between said gate and said first semiconductor stack structure for forming a high electron mobility transistor;
a second semiconductor stack structure, disposed on said buffer layer and comprising an anode and a cathode for forming a Schottky barrier diode, said anode connected to said gate and said cathode connected to said drain;
and said gate connected to said anode and said drain connected to said cathode;
a passivation film, covering said high electron mobility transistor and said Schottky barrier diode, and including a plurality of openings corresponding to said source and said anode, respectively
wherein said first semiconductor stack structure further comprising:
an i-GaN layer, located on said buffer layer;
an i-Al(y)GaN buffer layer, located on said i-GaN layer;
an i-GaN channel layer, located on said i-Al(y)GaN buffer layer; and
an i-Al(x)GaN layer, located on said i-GaN channel layer;
where x=0.1-0.3; y=0.05-0.3, and x>y, a distance from said i-Al(x)GaN layer to said i-GaN layer is less than 250 nm, the material of said buffer layer is carbon doped gallium nitride, said i-GaN layer is doped by carbon and is a highest carbon doping level to other layers, said i-GaN, said i-Al(y)GaN buffer, said i-GaN channel and said i-Al(x)GaN layers are formed to be said first and second semiconductor stack structures while said buffer layer is doped by carbon to increase a resistance thereof.
3. The semiconductor device of claim 1 , wherein said first semiconductor stack structure, is an enhancement mode high electron mobility transistor by using fluorine-ion injection method.
4. The semiconductor device of claim 1 , wherein said first semiconductor stack structure, is a depletion mode high electron mobility transistor.
5. A group-III nitride semiconductor device, comprising:
a substrate;
a buffer layer, disposed on said substrate;
a first semiconductor stack structure, disposed on said buffer layer, comprising a first gate, a first source, and a first drain, a first gate insulating layer disposed between said first gate and said first semiconductor stack structure for forming a first high electron mobility transistor;
a second semiconductor stack structure, disposed on said buffer layer, comprising a second gate, a second source, and a second drain, a second gate insulating layer disposed between said second gate and said second semiconductor stack structure for forming a second high electron mobility transistor, and said first gate connected to said second source and said first source connected to said second drain; and
a passivation film, covering said first high electron mobility transistor and said second high electron mobility transistor, and including a plurality of openings corresponding to said first drain, said second gate, and said second source, respectively,
wherein said first semiconductor stack structure and said second semiconductor stack structure each further comprising:
an i-GaN layer, located on said buffer layer;
an i-Al(y)GaN buffer layer, located on said i-GaN layer;
an i-GaN channel layer, located on said i-Al(y)GaN buffer layer; and
an i-Al(x)GaN layer, located on said i-GaN channel layer;
where x=0.1-0.3; y=0.05-0.3, and x>y, a distance from said i-Al(x)GaN layer to said i-GaN layer is less than 250 nm, the material of said buffer layer is carbon doped gallium nitride, said i-GaN layer is doped by carbon and is a highest carbon doping level to other layers, said i-GaN, said i-Al(y)GaN buffer, said i-GaN channel and said i-Al(x)GaN layers are formed to be said first and second semiconductor stack structures while said buffer layer is doped by carbon to increase a resistance thereof.
6. The semiconductor device of claim 4 , wherein said second semiconductor stack structure, is an enhancement mode high electron mobility transistor by using fluorine-ion injection method.