Automatic sample preparation apparatus and automatic sample preparation method
An automatic sample preparation apparatus that automatically prepares a sample piece from a sample includes: a focused ion beam irradiation optical system configured to irradiate a focused ion beam; an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam; a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample; a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam and/or the electron beam; and a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the transfer device.
1. An automatic sample preparation apparatus which automatically prepares a sample piece from a sample, comprising:
a focused ion beam irradiation optical system configured to irradiate a focused ion beam;
an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam;
a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample;
a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam or/and the electron beam; and
a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and drive the sample piece transfer device.
2. The automatic sample preparation apparatus according to claim 1 ,
wherein the computer recognizes a reference mark formed on the sample and moves the sample piece transfer device toward a target position associated with a position of the reference mark.
3. The automatic sample preparation apparatus according to claim 2 ,
wherein the computer recognizes the reference mark by image-recognition using image data of the focused ion beam and the electron beam generated by irradiating the reference mark with the focused ion beam and the electron beam.
4. The automatic sample preparation apparatus according to claim 2 ,
wherein the reference mark is a mark which indicates a position reference of processing of the sample.
5. The automatic sample preparation apparatus according to claim 1 ,
wherein the image data for image-recognition is an image data of the focused ion beam and the electron beam acquired by irradiating the sample piece transfer device and the sample piece with the focused ion beam and the electron beam at a posture state in which the sample piece transfer device to which the sample piece is connected is rotated.
6. An automatic sample preparation apparatus which automatically prepares a sample piece from a sample, comprising:
a focused ion beam irradiation optical system configured to irradiate a focused ion beam;
an electron beam irradiation optical system configured to irradiate an electron beam from a direction different from a direction of the focused ion beam;
a sample piece transfer device configured to hold and transfer the sample piece separated and extracted from the sample;
a detector configured to detect secondary charged particles emitted from an irradiation object by irradiating the irradiation object with the focused ion beam or/and the electron beam; and
a computer configured to recognize a position of the sample piece transfer device by image-recognition using an image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam, and process the sample piece transfer device using the focused ion beam.
7. An automatic sample preparation method, comprising:
emitting a focused ion beam from a focused ion beam irradiation optical system;
emitting an electron beam from an electron beam irradiation optical system in a direction different from a direction of the focused ion beam;
transferring a sample piece separated and extracted from the sample using a sample piece transfer device;
irradiating an irradiation object with the focused ion beam and/or the electron beam;
detecting secondary charged particles emitted from the irradiation object;
irradiating the sample piece transfer device with the focused ion beam and the electron beam;
recognizing, by a computer, a position of the sample piece transfer device by image-recognition using image data of the focused ion beam and the electron beam generated by irradiating the sample piece transfer device with the focused ion beam and the electron beam; and
driving the sample piece transfer device by the computer.