IP Library Granted Patent US 11,760,046
Granted Patent B2
US 11,760,046 · App. 16/951,091 · Granted Sep 19, 2023

Multi-layered microlens systems and related methods

Inventor: Min Jang (Meridian, ID)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
B29D11/00365B29D11/00298G02B1/041G02B1/11G02B3/0012
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Quick Facts
Patent No.
US 11,760,046
App. No.
16/951,091
Granted
Sep 19, 2023
Kind
B2
Abstract

Implementations of a microlens system may include a first layer including a first refractive index, the first layer including one or more substantially hemispherical elements formed therein; a second layer including a second refractive index coupled over the substantially hemispherical elements of the first layer; and a third layer including a third refractive index coupled over the second layer. A value of the first refractive index may be larger than a value of the third refractive index and a value of the second refractive index and the value of the second refractive index may be less than a value of the third refractive index.

Claims (41)

1. A microlens system comprising:

a first layer comprising a first refractive index, the first layer comprising one or more substantially hemispherical elements;

a second layer comprising a second refractive index over the one or more substantially hemispherical elements of the first layer; and

a third layer comprising a third refractive index over the second layer, wherein the second layer is between the first layer and the third layer;

wherein a surface of the third layer facing away from the second layer comprises one or more curves corresponding in location to the one or more substantially hemispherical elements;

wherein a value of the first refractive index is larger than a value of the third refractive index and a value of the second refractive index; and

wherein the value of the second refractive index is less than the value of the third refractive index.

2. The system of claim 1 , wherein the first layer comprises a first single and continuous layer, wherein the second layer comprises a second single and continuous layer, and wherein the third layer comprises a third single and continuous layer.

3. The system of claim 1 , wherein the value of the first refractive index is 1.56 with 550 nm wavelength electromagnetic radiation.

4. The system of claim 1 , wherein the value of the second refractive index is 1.38 with 550 nm wavelength electromagnetic radiation.

5. The system of claim 1 , wherein the value of the third refractive index is 1.4 with 550 nm wavelength electromagnetic radiation.

6. The system of claim 1 , wherein the third layer comprises an antireflective coating.

7. The system of claim 1 , wherein a thickness of the second layer is 500 nm.

8. A microlens system comprising:

a first layer comprising a first refractive index, the first layer comprising one or more substantially hemispherical elements;

a second layer comprising a second refractive index contacting the one or more substantially hemispherical elements of the first layer; and

a third layer comprising a third refractive index contacting the second layer, wherein the second layer is between the first layer and the third layer;

wherein a surface of the first layer facing away from the second layer is substantially flat;

wherein the first layer comprises a single and continuous layer;

wherein a value of the first refractive index is larger than a value of the third refractive index and a value of the second refractive index; and

wherein the value of the second refractive index is less than the value of the third refractive index.

9. The system of claim 8 , wherein the second layer comprises a fluoropolymer.

10. The system of claim 8 , wherein the value of the first refractive index is 1.56 with 550 nm wavelength electromagnetic radiation.

11. The system of claim 8 , wherein the value of the second refractive index is 1.38 with 550 nm wavelength electromagnetic radiation.

12. The system of claim 8 , wherein the value of the third refractive index is 1.4 with 550 nm wavelength electromagnetic radiation.

13. The system of claim 8 , wherein the third layer comprises an antireflective coating.

14. The system of claim 8 , wherein a thickness of the second layer is 500 nm.

15. A microlens system comprising:

a first layer comprising a first refractive index, the first layer comprising one or more substantially hemispherical elements;

a second layer comprising a second refractive index contacting the one or more substantially hemispherical elements of the first layer; and

a third layer comprising a third refractive index contacting the second layer, wherein the second layer is between the first layer and the third layer;

wherein a surface of the first layer facing away from the second layer is substantially flat;

wherein the first layer comprises a single and continuous layer;

wherein a surface of the third layer facing away from the first layer comprises a plurality of curves;

wherein a value of the first refractive index is larger than a value of the third refractive index and a value of the second refractive index; and

wherein the value of the second refractive index is less than the value of the third refractive index.

16. The system of claim 15 , wherein the second layer comprises a fluoropolymer.

17. The system of claim 15 , wherein the value of the first refractive index is 1.56 with 550 nm wavelength electromagnetic radiation.

18. The system of claim 15 , wherein the value of the second refractive index is 1.38 with 550 nm wavelength electromagnetic radiation.

19. The system of claim 15 , wherein the value of the third refractive index is 1.4 with 550 nm wavelength electromagnetic radiation.

20. The system of claim 15 , wherein a thickness of the second layer is 500 nm.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 055315, FRAME 0350 Recorded Aug 17, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064618/0881 →
SECURITY INTEREST Recorded Feb 17, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 055315/0350 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2020
From: JANG, MIN
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 054402/0657 →