IP Library Assignment 064618/0881
Patent Assignment
Reel/Frame 064618/0881

Release of Security Interest in Patents Previously Recorded at Reel 055315, Frame 0350

Recorded: 2023-08-17 Pages: 19
Assignor
Assignees
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
5005 EAST MCDOWELL ROAD, MAILDROP A700, PHOENIX, ARIZONA, 85008
FAIRCHILD SEMICONDUCTOR CORPORATION
5005 EAST MCDOWELL ROAD, MAILDROP A700, PHOENIX, ARIZONA, 85008
Covered Properties (134)
Low Power Shared Image Pixel Architecture
Application: 16/948,784 →
Publication: US 2022/0014694
Gate Contact Interlayer for Hemt Devices with Self-Aligned Electrodes
Application: 16/948,785 →
Publication: US 2022/0020857
Common-Mode Transient Immunity (Cmti) Circuit and Method of Operation Therefor
Application: 16/948,786 →
Publication: US 2022/0014016
Lateral Transistor with Extended Source Finger Contact
Application: 16/948,788 →
Publication: US 2022/0037485
High-Speed Successive Approximation Analog-to-Digital Converter with Improved Mismatch Tolerance
Application: 16/948,790 →
Publication: US 2021/0376850
Method for Defining a Gap Height Within an Image Sensor Package
Application: 16/948,792 →
Publication: US 2022/0020800
Termination Structures for Trench-Gate Field-Effect Transistors
Application: 16/948,793 →
Publication: US 2022/0013647
Strengthened Wire-Bond
Application: 16/948,794 →
Publication: US 2022/0020717
Isolated 3D Semiconductor Device Package with Transistors Attached to Opposing Sides of Leadframe Sharing Leads
Application: 16/948,796 →
Publication: US 2022/0020740
Methods for Using a Gas Permeable Layer to Form Air Gaps in an Image Sensor
Application: 16/948,799 →
Publication: US 2022/0013563
Monolithic Semiconductor Device Assemblies
Application: 16/948,801 →
Publication: US 2022/0020848
Image Sensor with Dark Reference Pixel Oversampling
Application: 16/948,802 →
Publication: US 2022/0014696
Multi-Segment Wire-Bond
Application: 16/948,803 →
Publication: US 2022/0020720
Gate Control for Hemt Devices Using Dielectric Between Gate Edges and Gate Field Plates
Application: 16/948,804 →
Publication: US 2022/0052163
Methods and Apparatus for Computing Parasitic Resistance in a Battery System
Application: 16/948,805 →
Publication: US 2021/0382118
Up-Diffusion Suppression in a Power Mosfet
Application: 16/948,806 →
Publication: US 2022/0020851
Methods and Apparatus for a Battery System
Application: 16/948,808 →
Publication: US 2021/0391740
Methods and Apparatus for a Battery System to Control Leakage at Terminals
Application: 16/948,809 →
Publication: US 2022/0014034
Lateral Surge Protection Devices
Application: 16/948,817 →
Publication: US 2021/0118870
Self-Aligned Contact Openings for Backside Through Substrate Vias
Application: 16/948,874 →
Publication: US 2021/0111102
Structures and Methods for Source-Down Vertical Semiconductor Device
Application: 16/948,880 →
Publication: US 2021/0296482
Methods and Apparatus for an Amplifier Circuit
Application: 16/948,900 →
Publication: US 2021/0021244
Methods and Systems of Power Management for an Integrated Circuit
Application: 16/948,901 →
Publication: US 2021/0273560
Methods and Apparatus for a Successive Approximation Register Analog-to-Digital Converter
Application: 16/948,954 →
Publication: US 2021/0021276
Methods and Apparatus for Successive Intra Block Prediction
Application: 16/949,007 →
Publication: US 2021/0029380
Resonant Recharge for Synchronous Pulsed Laser Operation
Application: 16/949,119 →
Publication: US 2022/0045479
Power Device Module with Dummy Pad Die Layout
Application: 16/949,130 →
Publication: US 2021/0118774
Noise Filter
Application: 16/949,167 →
Publication: US 2022/0123734
Image Sensors with Adaptive Filtering for Row Noise Mitigation
Application: 16/949,179 →
Publication: US 2022/0124267
Semiconductor Devices with Single-Photon Avalanche Diodes, Light Scattering Structures, and Multiple Deep Trench Isolation Structures
Application: 16/949,228 →
Publication: US 2021/0175265
Adaptable Low Dropout (Ldo) Voltage Regulator and Method Therefor
Application: 16/949,249 →
Publication: US 2022/0019253
Power Module
Application: 16/949,262 →
Publication: US 2022/0130740
Power Device with a Contact Hole on a Sloped Ild Region
Application: 16/949,272 →
Publication: US 2022/0130969
Propagation Delay Compensation and Interpolation Filter
Application: 16/949,281 →
Publication: US 2021/0285753
Gate Driver Circuit
Application: 16/949,285 →
Isolation in a Semiconductor Device
Application: 16/949,321 →
Publication: US 2022/0131002
Isolation in a Semiconductor Device
Application: 16/949,322 →
Stitched Integrated Circuit Dies
Application: 16/949,323 →
Publication: US 2021/0202555
Stitched Integrated Circuit Dies
Application: 16/949,324 →
Publication: US 2022/0132101
Imaging Systems for Multi-Spectral Imaging
Application: 16/949,384 →
Publication: US 2022/0132089
Image Sensors with a Physical Unclonable Function
Application: 16/949,386 →
Publication: US 2022/0132062
Charge Balanced Rectifier with Shielding
Application: 16/949,394 →
Publication: US 2022/0131016
Sic Mosfet with Built-in Schottky Diode
Application: 16/949,395 →
Publication: US 2022/0131015
Methods and Apparatus for a Battery
Application: 16/949,522 →
Publication: US 2022/0137141
Image Sensors with Variable Read Out Circuitry
Application: 16/949,540 →
Publication: US 2021/0243397
Electronic Device Including High Electron Mobility Transistors and a Resistor and a Method of Using the Same
Application: 16/949,735 →
Publication: US 2022/0149037
Voltage Reference with Temperature Compensation
Application: 16/949,836 →
Publication: US 2022/0050488
Semiconductor Packages with an Array of Single-Photon Avalanche Diodes Split Between Multiple Semiconductor Dice
Application: 16/949,837 →
Publication: US 2022/0157871
Semiconductor Packages with Single-Photon Avalanche Diodes and Prisms
Application: 16/949,845 →
Publication: US 2022/0158019
Power Module Package Baseplate with Step Recess Design
Application: 16/949,869 →
Publication: US 2022/0157696
Direct-Cooling for Semiconductor Device Modules
Application: 16/949,894 →
Publication: US 2022/0157688
Power Module Package for Direct Cooling Multiple Power Modules
Application: 16/949,896 →
Publication: US 2022/0157801
Jet Ablation Die Singulation Systems and Related Methods
Application: 16/950,097 →
Publication: US 2021/0074586
Multi-Layered Microlens Systems and Related Methods
Application: 16/951,091 →
Publication: US 2021/0202559
Multiphase Controller with Failure Diagnostic Mechanism
Application: 17/060,216 →
Semiconductor Devices with Low Resistance Gate and Shield Electrodes and Methods
Application: 17/060,280 →
Publication: US 2022/0045206
Out of Order Packet Scheduler
Application: 17/060,754 →
Publication: US 2021/0306279
Wap Uplink Optimization by Selection of Mimo Antennas Spatial States
Application: 17/060,895 →
Publication: US 2021/0021306
Backside Metal Patterning Die Singulation Systems and Related Methods
Application: 17/063,287 →
Publication: US 2021/0020514
Press-Fit Power Module and Related Methods
Application: 17/064,663 →
Publication: US 2021/0021065
Methods of Aligning a Semiconductor Wafer for Singulation
Application: 17/068,129 →
Publication: US 2021/0028064
Polymer Resin and Compression Mold Chip Scale Package
Application: 17/068,172 →
Publication: US 2021/0028133
Semiconductor Package Stress Balance Structures and Related Methods
Application: 17/072,521 →
Publication: US 2021/0035807
Systems and Methods for Designing a Discrete Device Product
Application: 17/076,039 →
Publication: US 2021/0117598
Systems and Methods for Designing a Module Semiconductor Product
Application: 17/076,072 →
Publication: US 2021/0117599
Quad Flat No Leads Package with Locking Feature
Application: 17/077,145 →
Publication: US 2021/0043550
Semiconductor Device and Method of Forming Micro Interconnect Structures
Application: 17/082,512 →
Publication: US 2021/0043553
Backside Metal Patterning Die Singulation Systems and Related Methods
Application: 17/082,579 →
Publication: US 2021/0043509
Semiconductor Device and Method Therefor
Application: 17/083,754 →
Publication: US 2022/0140761
Comparator System Having Internal Input Offset Voltage
Application: 17/085,247 →
Publication: US 2021/0048457
Semiconductor Package System and Related Methods
Application: 17/086,932 →
Publication: US 2021/0050272
Multi Wire Bonding with Current Sensing Method
Application: 17/089,842 →
Publication: US 2022/0137102
Timing Circuit for Locking a Voltage Controlled Oscillator to a High Frequency by Use of Low Frequency Quotients and Resistor to Switched Capacitor Matching
Application: 17/095,085 →
Publication: US 2022/0021361
Rc Time Based Locked Voltage Controlled Oscillator
Application: 17/095,117 →
Publication: US 2022/0021338
Steering Matrix Derivation
Application: 17/099,208 →
Publication: US 2021/0359738
Semiconductor Capacitor Devices and Methods
Application: 17/101,981 →
Publication: US 2021/0168312
Adaptive Spatial Reuse
Application: 17/102,172 →
Publication: US 2021/0076221
Wireless Preamble Design
Application: 17/104,288 →
Publication: US 2021/0185154
Singulation Systems and Related Methods
Application: 17/104,302 →
Publication: US 2022/0165622
Abbreviated Header Communication
Application: 17/109,547 →
Publication: US 2022/0174134
Inductor Current Emulation for Output Current Monitoring
Application: 17/110,011 →
Publication: US 2021/0091657
Clip Interconnect with Micro Contact Heads
Application: 17/110,413 →
Publication: US 2022/0181290
Self-Aligned Trench MOSFET Contacts Having Widths Less Than Minimum Lithography Limits
Application: 17/114,668 →
Publication: US 2021/0090953
Process of Forming an Electronic Device Including a Doped Gate Electrode
Application: 17/123,264 →
Publication: US 2022/0189780
Defect Reduction of Semiconductor Layers and Semiconductor Devices by Anneal and Related Methods
Application: 17/123,269 →
Publication: US 2021/0104415
Wireless Data Transmission
Application: 17/124,137 →
Publication: US 2022/0014215
Multiple Substrate Package Systems and Related Methods
Application: 17/126,433 →
Publication: US 2022/0199502
Transmutable Mimo Wireless Transceiver
Application: 17/126,462 →
Publication: US 2021/0143872
Direct Sampling for Digital Pre-Distortion Calibration
Application: 17/131,465 →
Publication: US 2021/0242949
Mobile Wireless Repeater
Application: 17/132,023 →
Publication: US 2021/0119691
Instability Management in a Signal Driver Circuit
Application: 17/132,092 →
Publication: US 2022/0029616
Average Current and Frequency Control
Application: 17/132,343 →
Publication: US 2021/0160985
Backside Metal Photolithographic Patterning Die Singulation Systems and Related Methods
Application: 17/134,717 →
Publication: US 2021/0118675
Imaging System with Time-of-Flight Sensing
Application: 17/134,726 →
Publication: US 2021/0333404
Image Sensors with Hybrid Analog-to-Digital Converter Architecture
Application: 17/134,761 →
Publication: US 2022/0210358
Metal-Oxide-Semiconductor Capacitor Based Passive Amplifier
Application: 17/134,809 →
Publication: US 2022/0208814
Semiconductor Package with Wettable Flank
Application: 17/136,136 →
Publication: US 2022/0208658
Tape Heating Methods
Application: 17/136,183 →
Publication: US 2021/0118718
Semiconductor Substrate Singulation Systems and Related Methods
Application: 17/136,243 →
Publication: US 2021/0118666
Spacer with Pattern Layout for Dual Side Cooling Power Module
Application: 17/136,286 →
Publication: US 2022/0208635
Dual-Side Cooling Semiconductor Packages and Related Methods
Application: 17/136,299 →
Publication: US 2022/0208653
Method of Reducing Residual Contamination in Singulated Semiconductor Die
Application: 17/136,319 →
Publication: US 2021/0118739
Power Module and Related Methods
Application: 17/136,340 →
Publication: US 2022/0208654
Lidar Systems with Improved Tunable Optical Delay Lines
Application: 17/136,383 →
Publication: US 2022/0206355
Semiconductor Design Optimization Using at Least One Neural Network
Application: 17/137,773 →
Publication: US 2022/0207351
High Dynamic Range Image Sensors
Application: 17/137,860 →
Publication: US 2022/0210353
Semiconductor Device
Application: 17/139,748 →
Publication: US 2022/0209008
Reducing Stress Cracks in Substrates
Application: 17/247,094 →
Publication: US 2022/0173049
Power State Control for Multi-Channel Interfaces
Application: 17/247,095 →
Publication: US 2022/0171452
Methods and Apparatus for Histogramming
Application: 17/247,097 →
Publication: US 2022/0171037
Speaker Excursion Prediction and Protection
Application: 17/247,156 →
Publication: US 2021/0258688
Connecting Clip Design for Pressure Sintering
Application: 17/247,200 →
Publication: US 2021/0090975
Fin Transistors with Semiconductor Spacers
Application: 17/247,212 →
Publication: US 2022/0181462
System with a Spad-Based Semiconductor Device Having Dark Pixels for Monitoring Sensor Parameters
Application: 17/247,276 →
Publication: US 2021/0223098
Offset Compensation Circuitry for an Amplification Circuit
Application: 17/247,279 →
Publication: US 2022/0045657
Circuit and Method for Programming a One-Time Programmable Memory
Application: 17/247,282 →
Image Sensor with Active Clamp to Suppress Transfer Gate Feedthrough
Application: 17/247,288 →
Publication: US 2022/0181368
Packaging Structure for a Sensor Having a Sealing Layer
Application: 17/247,408 →
Publication: US 2021/0098518
Methods and Apparatus for Selective Histogramming
Application: 17/247,409 →
Publication: US 2021/0294274
Imaging System with Time-of-Flight Sensing
Application: 17/247,522 →
Publication: US 2021/0337149
Module with Substrate Recess for Conductive-Bonding Component
Application: 17/247,525 →
Publication: US 2022/0189848
Integration of Semiconductor Device Assemblies with Thermal Dissipation Mechanisms
Application: 17/247,585 →
Publication: US 2021/0249332
Image Sensor with Black Level Correction
Application: 17/247,590 →
Publication: US 2022/0201229
Metal-Oxide-Semiconductor Capacitor Based Charge Sharing Successive Approximation Register Data Converter
Application: 17/247,794 →
Termination Structures with Reduced Dynamic Output Capacitance Loss
Application: 17/247,796 →
Publication: US 2022/0199764
Dual Cool Power Module with Stress Buffer Layer
Application: 17/247,797 →
Publication: US 2022/0199602
Offset Cancel Method for a Resolver Type Sensor
Application: 63/109,181 →
Ultrasonic Sensor System
Application: 63/124,266 →
Ultrasonic Sensor System
Application: 63/127,599 →
Zvs Flyback
Application: 63/198,200 →
Equalizing Channels in Ultrasonic Dual Channel System
Application: 63/198,768 →
Trench Poly Diode and Resistor Layouts for Shielded Gate Mosfets
Application: 63/199,130 →
Methods and Apparatus for Optical Image Stabilization
Application: 63/199,256 →
Short Circuit Detection Circuit
Application: 63/199,351 →
Related Assignments (21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 1, 2020
From: JOHNSON, RICHARD SCOTT; GURUARIBAM, DEBASHREE
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053950/0637 →
Assignment of Assignor's Interest Oct 1, 2020
From: CONSTANT, AURORE; COPPENS, PETER
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053950/0796 →
Assignment of Assignor's Interest Oct 1, 2020
From: JIN, WOOKANG
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053950/0876 →
Assignment of Assignor's Interest Oct 1, 2020
From: JEON, WOOCHUL
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053950/0967 →
Assignment of Assignor's Interest Oct 1, 2020
From: HSIEH, YU-TE
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053951/0313 →
Assignment of Assignor's Interest Oct 1, 2020
From: OGURA, TAKASHI; HIROSHIMA, TAKASHI; TANIGUCHI, TOSHIMITSU
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053951/0868 →
Assignment of Assignor's Interest Oct 1, 2020
From: XIA, WUXING; LIU, JINGYAN; LI, HUAPING; JIA, ZHENGXU
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0040 →
Assignment of Assignor's Interest Oct 1, 2020
From: MALDO, TIBURCIO A.; LEE, KEUNHYUK; TEYSSEYRE, JEROME
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0253 →
Assignment of Assignor's Interest Oct 1, 2020
From: CHAPMAN, NATHAN WAYNE; VAARTSTRA, BRIAN ANTHONY; VU, AMANDA THUY TRANG
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0362 →
Assignment of Assignor's Interest Oct 1, 2020
From: MOENS, PETER; GRIVNA, GORDON M.; LIN, YUSHENG
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0511 →
Assignment of Assignor's Interest Oct 1, 2020
From: BAYRON, ELMER CUNANAN
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0834 →
Assignment of Assignor's Interest Oct 1, 2020
From: COPPENS, PETER; CONSTANT, AURORE; VANMEERBEEK, PIET
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0936 →
Assignment of Assignor's Interest Oct 1, 2020
From: KONDO, HIDEO
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053952/0982 →
Assignment of Assignor's Interest Oct 1, 2020
From: VENKATRAMAN, PRASAD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053953/0072 →
Assignment of Assignor's Interest Oct 1, 2020
From: KONDO, HIDEO
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053953/0181 →
Assignment of Assignor's Interest Oct 1, 2020
From: KONDO, HIDEO
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053953/0245 →
Assignment of Assignor's Interest Oct 1, 2020
From: MUDEGOWDAR, ISHWAR CHANDRA; PANKRAC, TOMAS
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053966/0769 →
Assignment of Assignor's Interest Oct 1, 2020
From: SPIESSENS, PETER
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053967/0278 →
Assignment of Assignor's Interest Oct 5, 2020
From: GRIVNA, GORDON M.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053971/0253 →
Assignment of Assignor's Interest Oct 5, 2020
From: ONISHI, AKINBOU
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 053977/0038 →
Security Interest Feb 17, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 055315/0350 →