IP Library Granted Patent US 11,508,579
Granted Patent B2
US 11,508,579 · App. 17/134,717 · Granted Nov 22, 2022

Backside metal photolithographic patterning die singulation systems and related methods

Inventors: Takashi Noma (Ota, JP); Michael J. Seddon (Gilbert, AZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01L21/0275H01L21/31138H01L21/32134H01L21/78
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Quick Facts
Patent No.
US 11,508,579
App. No.
17/134,717
Granted
Nov 22, 2022
Kind
B2
Abstract

Implementations of die singulation systems and related methods may include forming a plurality of die on a first side of a substrate, forming a backside metal layer on a second side of a substrate, applying a photoresist layer over the backside metal layer, patterning the photoresist layer along a die street of the substrate, and forming a groove at the pattern of the photoresist layer only partially through a thickness of the backside metal layer. The groove may be located in the die street of the substrate. The method may also include etching through a remaining portion of the backside metal layer located in the die street, removing the photoresist layer, and singulating the plurality of die included in the substrate by removing substrate material in the die street.

Claims (44)

1. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a backside metal layer on a second side of the substrate;

applying a patternable layer over the backside metal layer;

patterning the patternable layer along a die street of the substrate;

forming a groove at a pattern of the patternable layer only partially through a thickness of the backside metal layer, wherein the groove is located in the die street of the substrate;

after forming the groove, etching through a remaining portion of the backside metal layer located in the die street;

removing the patternable layer; and

singulating the plurality of die comprised in the substrate by removing substrate material in the die street.

2. The method of claim 1 , further comprising thinning the second side of the substrate.

3. The method of claim 1 , wherein a thickness of the backside metal layer is 15 micrometers.

4. The method of claim 1 , wherein the groove is formed using one of a laser beam or a saw blade.

5. The method of claim 1 , wherein etching further comprises wet etching through the remaining portion of the backside metal layer, wherein the backside metal layer comprises copper.

6. The method of claim 1 , wherein removing substrate material in the die street further comprises using one of a laser beam or a saw blade.

7. The method of claim 6 , further comprising remote plasma healing a sidewall of the plurality of die.

8. The method of claim 1 , wherein removing substrate material in the die street further comprises plasma etching.

9. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a backside metal layer on a second side of the substrate;

applying a patternable layer over the backside metal layer;

patterning the patternable layer along a die street of the substrate;

forming a groove at a pattern of the patternable layer only partially through a thickness of the backside metal layer, wherein the groove is located in a die street of the substrate;

after forming the groove, etching the backside metal layer, wherein the etching exposes a portion of the substrate in the die street;

removing the patternable layer; and

singulating the plurality of die comprised in the substrate through plasma etching at the portion of the substrate exposed by the etching.

10. The method of claim 9 , further comprising thinning the second side of the substrate, wherein the substrate is thinned to less than 50 micrometers thick.

11. The method of claim 9 , further comprising thinning the second side of the substrate, wherein the substrate is thinned to less than 30 micrometers thick.

12. The method of claim 9 , further comprising aligning the substrate from a backside of a substrate.

13. The method of claim 9 , wherein etching further comprises wet etching the backside metal layer, wherein the backside metal layer comprises copper.

14. The method of claim 9 , wherein a portion of the backside metal layer is between the groove and the substrate, the portion having a thickness of five micrometers.

15. The method of claim 9 , wherein the backside metal layer has a thickness of 15 micrometers.

16. A method of singulating a plurality of die comprised in a substrate, the method comprising:

forming a plurality of die on a first side of a substrate;

forming a backside metal layer on a second side of the substrate;

applying a patternable layer over the backside metal layer;

patterning the patternable layer along a die street of the substrate;

forming a groove partially through the backside metal layer in a die street using one of a laser beam or a saw blade at the pattern of the patternable layer;

wet etching the backside metal layer, wherein the etching exposes a portion of the substrate in the die street;

removing the patternable layer; and

singulating the plurality of die comprised in the substrate by removing substrate material in the die street.

17. The method of claim 16 , wherein removing substrate material in the die street further comprises plasma etching.

18. The method of claim 16 , wherein the backside metal layer comprises copper.

19. The method of claim 16 , further comprising aligning the substrate from a backside of the substrate.

20. The method of claim 16 , further comprising monitoring the forming of the groove using a camera facing the second side of the substrate.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 055315, FRAME 0350 Recorded Aug 17, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064618/0881 →
SECURITY INTEREST Recorded Feb 17, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 055315/0350 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2020
From: NOMA, TAKASHI; SEDDON, MICHAEL J.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 054752/0374 →
Continuity (3)
Continuation 16505925 · Jul 9, 2019
Provisional Application 62796671 · Jan 25, 2019
Related Publication 20210118675A1 · Apr 22, 2021