Substrate processing apparatus capable of adjusting inner pressure of process chamber thereof and method therefor

1. A substrate processing apparatus comprising:

a process chamber in which a substrate is processed;

a main exhaust line comprising:

a first pipe configured to discharge a gas from the process chamber;

a first opening degree adjusting valve provided at the first pipe;

an opening/closing valve provided at the first pipe; and

a pressure sensor provided at the first pipe and configured to detect an inner pressure of the process chamber;

a bypass exhaust line comprising:

a second pipe connected to the main exhaust line; and

a second opening degree adjusting valve provided at the second pipe; wherein a diameter of the second pipe is less than that of the first pipe and

a controller configured to adjust the inner pressure of the process chamber to a process pressure by performing:

(a) reducing the inner pressure of the process chamber from an atmospheric pressure to a first pressure via the bypass exhaust line, by adjusting an opening degree of the second opening degree adjusting valve based on information from the pressure sensor;

(b) reducing the inner pressure of the process chamber to a second pressure lower than the first pressure via the bypass exhaust line, by closing the second opening degree adjusting valve and opening the opening/closing valve and the first opening degree adjusting valve when the inner pressure of the process chamber reaches the first pressure; and

(c) when the process pressure is lower than the second pressure, adjusting the inner pressure of the process chamber to the process pressure by closing the first opening degree adjusting valve and the opening/closing valve and opening the second opening degree adjusting valve while adjusting the opening degree of the second opening degree adjusting valve; and when the process pressure is higher than the second pressure, adjusting the inner pressure of the process chamber to the process pressure by adjusting an opening degree of the first opening degree adjusting valve.

2. The substrate processing apparatus of claim 1 , wherein the pressure sensor comprises a first vacuum sensor and a second vacuum sensor, the inner pressure of the process chamber is reduced to the second pressure based on information from the first vacuum sensor in (b), and the inner pressure of the process chamber is adjusted from the second pressure to the process pressure based on information from the second vacuum sensor in (c).

3. The substrate processing apparatus of claim 1 , wherein the opening/closing valve and the first opening degree adjusting valve are closed in (a).

4. The substrate processing apparatus of claim 3 , wherein an opening degree of the first opening degree adjusting valve is maintained at 0% in (a).

5. The substrate processing apparatus of claim 1 , wherein an opening degree of the first opening degree adjusting valve is maintained at 100% in (b).

6. The substrate processing apparatus of claim 1 , wherein a ratio of a diameter of the first pipe to a diameter of the second pipe is 1.0:0.2 or more and 1.0:0.8 or less.

7. The substrate processing apparatus of claim 1 , wherein a diameter of the second pipe is 80 mm or more and 100 mm or less.

8. The substrate processing apparatus of claim 1 , wherein a purge gas is supplied in at least one among (a), (b) and (c).

9. The substrate processing apparatus of claim 1 , wherein, when the process pressure is less than the second pressure, the inner pressure of the process chamber is adjusted to the process pressure by: reducing the inner pressure of the process chamber to a vacuum pressure less than the second pressure; and adjusting the inner pressure of the process chamber from the vacuum pressure to the process pressure by adjusting the opening degree of the second opening degree adjusting valve while supplying a purge gas.