IP Library Granted Patent US 11,710,805
Granted Patent B2
US 11,710,805 · App. 17/031,143 · Granted Jul 25, 2023

Light emitting diode containing oxidized metal contacts

Inventors: Fariba Danesh (Los Altos Hills, CA); Tsun Lau (Sunnyvale, CA); Richard P. Schneider, Jr. (Albuquerque, NM); Michael Jansen (Palo Alto, CA); Max Batres (Sunnyvale, CA)
Assignee: NANOSYS, INC.
H01L33/42H01L25/0753H01L27/1214H01L33/007H01L33/0093H01L33/0095H01L33/06H01L33/32H01L33/46H01L33/62H01L33/24H01L33/405H01L2933/0016H01L2933/0025H01L2933/0066
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Quick Facts
Patent No.
US 11,710,805
App. No.
17/031,143
Granted
Jul 25, 2023
Kind
B2
Abstract

A method of forming a light emitting device includes forming a semiconductor light emitting diode, forming a metal layer stack including a first metal layer and a second metal layer on the light emitting diode, and oxidizing the metal layer stack to form transparent conductive layer including at least one conductive metal oxide.

Claims (36)

1. A method of forming a direct view display device, comprising:

forming a first light emitting diode, wherein the step of forming the first light emitting diode comprises:

forming a growth mask layer having an opening over a top surface of a doped compound semiconductor layer;

forming a semiconductor core through the opening in the growth mask layer;

forming an active region over the semiconductor core;

forming a second conductivity type semiconductor material layer over the active region;

forming a metal layer stack including a first metal layer and a second metal layer on the second conductivity type semiconductor material layer;

oxidizing the metal layer stack to form a transparent conductive layer including at least one conductive metal oxide; and

forming a silver or aluminum reflector layer over the transparent conductive layer;

providing the first light emitting diode onto a backplane; and

providing a second light emitting diode onto the backplane, wherein the second light emitting diode contains a gold reflector layer directly contacting a gold doped semiconductor region in a second conductivity type semiconductor material layer of the second light emitting diode, the gold reflector layer having a thickness of at least 100 nm.

2. The method of claim 1 , wherein:

the first metal layer comprises nickel and has a thickness in a range from 1 nm to 10 nm; and

the second metal layer comprises gold and has a thickness in a range from 1 nm to 10 nm.

3. The method of claim 2 , wherein:

the first metal layer consists essentially of nickel;

the second metal layer consists essentially of gold;

forming the metal layer stack comprises vacuum evaporating the first metal layer followed by vacuum evaporating the second metal layer without breaking vacuum between vacuum evaporating the first metal layer and vacuum evaporating the second metal layer; and

the step of oxidizing comprises oxidizing the metal stack in an ambient comprising water vapor.

4. The method of claim 2 , wherein the transparent conductive layer comprises one of an underlying nickel oxide layer and an overlying gold layer, a composite of nickel oxide and gold or a composite of nickel oxide and gold in which a concentration of the nickel oxide increases from bottom toward top of the transparent conductive layer.

5. The method of claim 2 , wherein:

the transparent conductive layer comprises a nickel oxide layer contacting a gold doped semiconductor region in the second conductivity type semiconductor material layer of the first light emitting diode; and

the gold doped semiconductor region in the second conductivity type semiconductor material layer of the first light emitting diode is formed by diffusion of the gold layer into the second conductivity type semiconductor material layer of the first light emitting diode through the nickel layer during the step of oxidizing.

6. The method of claim 1 , wherein the semiconductor core comprises at least one of a semiconductor nanowire core, a semiconductor nanodisc, or a semiconductor microdisc.

7. A method of forming a direct view display device, comprising:

forming a first light emitting diode, wherein the step of forming the first light emitting diode comprises:

forming a first conductivity type semiconductor material region over a substrate;

forming an active region over the first conductivity type semiconductor material region;

forming a second conductivity type semiconductor material layer over the active region;

forming a nickel layer having a thickness in a range from 1 nm to 10 nm on the second conductivity type semiconductor material layer;

forming a gold having a thickness in a range from 1 nm to 10 nm on the nickel layer;

oxidizing the nickel layer at an elevated temperature to form transparent conductive layer comprising nickel oxide while diffusing the gold layer into the second conductivity type semiconductor material layer through the nickel layer during the step of oxidizing to form a gold doped semiconductor region in the second conductivity type semiconductor material layer; and

forming a silver or aluminum reflector layer over the transparent conductive layer;

providing the first light emitting diode onto a backplane; and

providing a second light emitting diode onto the backplane, wherein the second light emitting diode contains a gold reflector layer directly contacting a gold doped semiconductor region in a second conductivity type semiconductor material layer of the second light emitting diode, the gold reflector layer having a thickness of at least 100 nm.

8. The method of claim 7 , wherein the first conductivity type semiconductor material region comprises at least one of a semiconductor nanowire core, a semiconductor nanodisc, a semiconductor microdisc or a semiconductor layer.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2024
From: GLO TECHNOLOGIES LLC
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 068297/0220 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2023
From: SYSONAN, INC.
To: GLO TECHNOLOGIES LLC
Reel/Frame 065178/0210 →
CHANGE OF NAME Recorded Oct 5, 2023
From: NANOSYS, INC.
To: SYSONAN, INC.
Reel/Frame 065156/0416 →
TERMINATION AND RELEASE OF PATENT SECURITY AGREEMENT RECORDED AT REEL 059569 / FRAME 0840 Recorded Sep 7, 2023
From: FORTRESS CREDIT CORP.,
To: NANOSYS, INC.
Reel/Frame 064836/0263 →
SECURITY INTEREST Recorded Apr 1, 2022
From: NANOSYS, INC.
To: FORTRESS CREDIT CORP., AS AGENT
Reel/Frame 059569/0840 →
NUNC PRO TUNC ASSIGNMENT Recorded Aug 13, 2021
From: GLO AB
To: NANOSYS, INC.
Reel/Frame 057184/0564 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 24, 2020
From: DANESH, FARIBA; LAU, TSUN; SCHNEIDER, JR., RICHARD P.; JANSEN, MICHAEL; BATRES, MAX
To: GLO AB
Reel/Frame 053874/0777 →
Continuity (3)
Division 16153062 · Oct 5, 2018
Provisional Application 62569256 · Oct 6, 2017
Related Publication 20210066550A1 · Mar 4, 2021