Solid-state image pickup unit and electronic apparatus

1. A solid-state image pickup unit comprising:

a substrate made of a first semiconductor;

a photoelectric conversion device provided on the substrate and including a first electrode, a photoelectric conversion layer, and a second electrode in order from the substrate; and

a plurality of field-effect transistors configured to perform signal reading from the photoelectric conversion device,

wherein the plurality of transistors include a reset transistor and an amplification transistor,

wherein the reset transistor includes an active layer containing a second semiconductor with a larger band gap than that of the first semiconductor, and

wherein the first electrode or the second electrode of the photoelectric conversion device is connected to one terminal of a source or a drain of the reset transistor, and is connected to a gate of the amplification transistor,

wherein the reset transistor includes a wide gap semiconductor layer containing the second semiconductor, and a gate electrode disposed to face a part of the wide gap semiconductor layer,

wherein the plurality of transistors further include a selection transistor,

wherein a source or a drain of the selection transistor is connected to a source or a drain of the amplification transistor, and

wherein the wide gap semiconductor layer further includes a portion functioning as active layers, sources, and drains of the amplification transistor and the selection transistor.

2. The solid-state image pickup unit according to claim 1 , wherein the amplification transistor is provided on a circuit formation surface of the substrate.

3. The solid-state image pickup unit according to claim 1 , wherein

the first semiconductor includes silicon, and

the second semiconductor includes an oxide semiconductor including one or more of indium (In), gallium (Ga), and zinc (Zn).

4. The solid-state image pickup unit according to claim 3 , wherein a light-shielding layer made of a material different from that of the photoelectric conversion layer is provided above the wide gap semiconductor layer in a region other than a light reception region of the photoelectric conversion device.

5. The solid-state image pickup unit according to claim 3 , wherein an ultraviolet-cut filter is provided on a light incident side.

6. The solid-state image pickup unit according to claim 3 , wherein the photoelectric conversion layer is provided to cover a formation region of the wide gap semiconductor layer.

7. A solid-state image pickup unit comprising:

a substrate made of a first semiconductor;

a photoelectric conversion device provided on the substrate and including a first electrode, a photoelectric conversion layer, and a second electrode in order from the substrate; and

a plurality of field-effect transistors configured to perform signal reading from the photoelectric conversion device,

wherein the plurality of transistors include a reset transistor and an amplification transistor,

wherein the reset transistor includes an active layer containing a second semiconductor with a larger band gap than that of the first semiconductor,

wherein the first electrode or the second electrode of the photoelectric conversion device is connected to one terminal of a source or a drain of the reset transistor, and is connected to a gate of the amplification transistor,

wherein the reset transistor includes a wide gap semiconductor layer containing the second semiconductor, and a gate electrode disposed to face a part of the wide gap semiconductor layer,

wherein the first semiconductor is silicon,

wherein the second semiconductor is an oxide semiconductor including one or more of indium (In), gallium (Ga), and zinc (Zn), and

wherein the photoelectric conversion layer is provided to cover a formation region of the wide gap semiconductor layer.

8. The solid-state image pickup unit according to claim 7 , wherein the amplification transistor is provided on a circuit formation surface of the substrate.

9. The solid-state image pickup unit according to claim 7 , wherein the plurality of transistors further include a selection transistor, and

wherein a source or a drain of the selection transistor is connected to a source or a drain of the amplification transistor.

10. The solid-state image pickup unit according to claim 9 , wherein the wide gap semiconductor layer further includes a portion functioning as active layers, sources, and drains of the amplification transistor and the selection transistor.

11. The solid-state image pickup unit according to claim 7 , wherein a light-shielding layer made of a material different from that of the photoelectric conversion layer is provided above the wide gap semiconductor layer in a region other than a light reception region of the photoelectric conversion device.

12. The solid-state image pickup unit according to claim 7 , wherein an ultraviolet-cut filter is provided on a light incident side.

13. An electronic apparatus comprising:

a solid-state image pickup unit, the solid-state image pickup unit comprising:

a substrate made of a first semiconductor;

a photoelectric conversion device provided on the substrate and including a first electrode, a photoelectric conversion layer, and a second electrode in order from the substrate; and

a plurality of field-effect transistors configured to perform signal reading from the photoelectric conversion device,

wherein the plurality of transistors include a reset transistor and an amplification transistor,

the reset transistor includes an active layer containing a second semiconductor with a larger band gap than that of the first semiconductor, and

wherein the first electrode or the second electrode of the photoelectric conversion device is connected to one terminal of a source or a drain of the reset transistor, and is connected to a gate of the amplification transistor,

wherein the reset transistor includes a wide gap semiconductor layer containing the second semiconductor, and a gate electrode disposed to face a part of the wide gap semiconductor layer,

wherein the plurality of transistors further include a selection transistor,

wherein a source or a drain of the selection transistor is connected to a source or a drain of the amplification transistor, and

wherein the wide gap semiconductor layer further includes a portion functioning as active layers, sources, and drains of the amplification transistor and the selection transistor.

14. An electronic apparatus comprising:

a solid-state image pickup unit, the solid-state image pickup unit comprising:

a substrate made of a first semiconductor;

a photoelectric conversion device provided on the substrate and including a first electrode, a photoelectric conversion layer, and a second electrode in order from the substrate; and

a plurality of field-effect transistors configured to perform signal reading from the photoelectric conversion device,

wherein the plurality of transistors include a reset transistor and an amplification transistor,

wherein the reset transistor includes an active layer containing a second semiconductor with a larger band gap than that of the first semiconductor,

wherein the first electrode or the second electrode of the photoelectric conversion device is connected to one terminal of a source or a drain of the reset transistor, and is connected to a gate of the amplification transistor,

wherein the reset transistor includes a wide gap semiconductor layer containing the second semiconductor, and a gate electrode disposed to face a part of the wide gap semiconductor layer,

wherein the first semiconductor is silicon,

wherein the second semiconductor is an oxide semiconductor including one or more of indium (In), gallium (Ga), and zinc (Zn), and

wherein the photoelectric conversion layer is provided to cover a formation region of the wide gap semiconductor layer.