Solid-state imaging apparatus and electronic apparatus
A solid-state imaging apparatus includes a pixel array part in which a plurality of pixels are two-dimensionally arranged, in which each pixel has a first photoelectric conversion region formed above a semiconductor layer, a second photoelectric conversion region formed in the semiconductor layer, a first filter configured to transmit a light in a predetermined wavelength region corresponding to a color component, and a second filter having different transmission characteristics from the first filter, one photoelectric conversion region out of the first photoelectric conversion region and the second photoelectric conversion region photoelectrically converts a light in a visible light region, the other photoelectric conversion region photoelectrically converts a light in an infrared region, the first filter is formed above the first photoelectric conversion region, and the second filter has transmission characteristics of making wavelengths of lights in an infrared region absorbed in the other photoelectric conversion region formed below the first filter the same.
1. A light detecting device, comprising:
a photoelectric conversion layer;
a substrate disposed below the photoelectric conversion layer, the substrate comprising a first photoelectric conversion region and a second photoelectric conversion region,
wherein, in a plan view, a first portion of the photoelectric conversion layer overlaps the first photoelectric conversion region,
wherein, in a plan view, a second portion of the photoelectric conversion layer overlaps the second photoelectric conversion region, and
wherein the first portion of the photoelectric conversion layer is configured to receive light in a wavelength region which is different than the second portion of the photoelectric conversion layer; and
a first filter disposed between the photoelectric conversion layer and the substrate, the first filter being configured to allow wavelengths of light in an infrared region to be received by the first photoelectric conversion region and the second photoelectric conversion region.
2. The light detecting device according to claim 1 , wherein, in a plan view, the first portion of the photoelectric conversion layer entirely overlaps the first photoelectric conversion region and wherein, in a plan view, the second portion of the photoelectric conversion layer entirely overlaps the second photoelectric conversion region.
3. The light detecting device according to claim 1 , further comprising a second filter disposed above the photoelectric conversion layer, the second filter being configured to transmit light in a predetermined wavelength region corresponding to a color component.
4. The light detecting device according to claim 1 , wherein the photoelectric conversion layer photoelectrically converts light in a visible light region and the first and second photoelectric conversion regions photoelectrically convert light in the infrared region.
5. The light detecting device according to claim 1 , wherein the first filter has characteristics of transmitting light through a wavelength region in the infrared light region.
6. The light detecting device according to claim 1 , wherein the photoelectric conversion layer comprises an organic photoelectric conversion layer.
7. The light detecting device according to claim 1 , wherein the first filter includes an inorganic film.
8. The light detecting device according to claim 1 , wherein the first filter is a multilayered filter formed by laminating a plurality of materials with different refractive indexes.
9. The light detecting device according to claim 1 , wherein the first filter is a metal thin-film filter in which a predetermined microstructural pattern is formed for a metal thin-film.
10. An electronic apparatus, comprising:
a light detecting device comprising:
a photoelectric conversion layer;
a substrate disposed below the photoelectric conversion layer, the substrate comprising a first photoelectric conversion region and a second photoelectric conversion region,
wherein, in a plan view, a first portion of the photoelectric conversion layer overlaps the first photoelectric conversion region,
wherein, in a plan view, a second portion of the photoelectric conversion layer overlaps the second photoelectric conversion region, and
wherein the first portion of the photoelectric conversion layer is configured to receive light in a wavelength region which is different than the second portion of the photoelectric conversion layer; and
a first filter disposed between the photoelectric conversion layer and the substrate, the first filter being configured to allow wavelengths of light in an infrared region to be received by the first photoelectric conversion region and the second photoelectric conversion region; and
a digital signal processor.
11. The electronic apparatus according to claim 10 , wherein, in a plan view, the first portion of the photoelectric conversion layer entirely overlaps the first photoelectric conversion region and wherein, in a plan view, the second portion of the photoelectric conversion layer entirely overlaps the second photoelectric conversion region.
12. The electronic apparatus according to claim 10 , further comprising a second filter disposed above the photoelectric conversion layer, the second filter being configured to transmit light in a predetermined wavelength region corresponding to a color component.
13. The electronic apparatus according to claim 10 , wherein the photoelectric conversion layer photoelectrically converts light in a visible light region and the first and second photoelectric conversion regions photoelectrically convert light in the infrared region.
14. The electronic apparatus according to claim 10 , wherein the first filter has characteristics of transmitting light through a wavelength region in the infrared light region.
15. The electronic apparatus according to claim 10 , wherein the photoelectric conversion layer comprises an organic photoelectric conversion layer.
16. The electronic apparatus according to claim 10 , wherein the first filter includes an inorganic film.
17. The electronic apparatus according to claim 10 , wherein the first filter is a multilayered filter formed by laminating a plurality of materials with different refractive indexes.
18. The electronic apparatus according to claim 10 , wherein the first filter is a metal thin-film filter in which a predetermined microstructural pattern is formed for a metal thin-film.