IP Library Granted Patent US 11,437,547
Granted Patent B2
US 11,437,547 · App. 17/102,171 · Granted Sep 6, 2022

Electrode structure of light emitting device

Inventors: De-Shan Kuo (Hsinchu, TW); Ting-Chia Ko (Hsinchu, TW); Chun-Hsiang Tu (Hsinchu, TW); Po-Shun Chiu (Hsinchu, TW)
Assignee: EPISTAR CORPORATION
H01L33/42H01L27/15H01L33/06H01L33/08H01L33/30H01L33/32H01L33/405H01L33/60H01L33/62H01L27/156H01L33/0095H01L33/22H01L33/40
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,437,547
App. No.
17/102,171
Granted
Sep 6, 2022
Kind
B2
Abstract

A light-emitting device, comprising: a substrate; a semiconductor stacking layer comprising a first type semiconductor layer on the substrate, an active layer on the first semiconductor layer, and a second semiconductor layer on the active layer; and an electrode structure on the second semiconductor layer, wherein the electrode structure comprises a bonding layer, a conductive layer, and a first barrier layer between the bonding layer and the conductive layer; wherein the conductive layer has higher standard oxidation potential than that of the bonding layer.

Claims (34)

1. A light-emitting device, comprising:

a first semiconductor layer;

an active layer on the first semiconductor layer;

a second semiconductor layer on the active layer; and

an electrode structure on the second semiconductor layer,

wherein the electrode structure comprises a conductive layer on the second semiconductor layer, a bonding layer on the conductive layer, and a first barrier layer between the bonding layer and the conductive layer,

wherein the first barrier layer comprises a material selected from a group consisting of Cr, Pt, Ti, TiW, W, and Zn, and

wherein a ratio of the thickness of the conductive layer to the total thickness of the electrode structure is between 0.4 and 0.7, or the total thickness of the conductive layer and the bonding layer is about 0.4˜0.7 times the total thickness of the electrode structure.

2. A light-emitting device according to claim 1 , wherein the conductive layer comprises a first conductive layer and a second conductive layer, and a second barrier layer is between the first conductive layer and the second conductive layer.

3. A light-emitting device according to claim 2 , wherein the thickness of the first conductive layer is of the same order as that of the second conductive layer.

4. A light-emitting device according to claim 1 , wherein the electrode structure further comprises an adhesion layer between the second semiconductor layer and the conductive layer.

5. A light-emitting device according to claim 4 , wherein the adhesion layer comprises Cr or Rh.

6. A light-emitting device according to claim 5 , wherein the adhesion layer comprises a thickness between 5 Å and 50 Å.

7. A light-emitting device according to claim 1 , further comprising a mirror layer between the second semiconductor layer and the conductive layer, wherein the mirror layer comprises Al or Ag.

8. A light-emitting device according to claim 7 , wherein the mirror layer comprises a thickness between 500 Å and 5000 Å.

9. A light-emitting device according to claim 1 , wherein the bonding layer comprises a first metal comprising Au, and the conductive layer comprises a second metal comprising Al, Ag or Cu.

10. A light-emitting device according to claim 1 , wherein the first barrier layer comprises a first metal layer and a second metal layer.

11. A light-emitting device according to claim 10 , wherein the first metal layer is one to three times thicker than the second metal layer.

12. A light-emitting device according to claim 10 , wherein the first metal layer comprises a material different from that of the second metal layer.

13. A light-emitting device according to claim 7 , further comprising a third barrier layer between the mirror layer and the conductive layer.

14. A light-emitting device according to claim 13 , wherein the third barrier layer comprises a plurality of metal layers, and one of the metal layers comprises a material selected from a group consisting of Cr, Pt, Ti, TiW, W, and Zn.

15. A light-emitting device according to claim 13 , wherein the third barrier layer comprises the third metal layer and a fourth metal layer stacked on the third metal layer, and the fourth metal layer comprises a material different from that of the third metal layer.

16. A light-emitting device according to claim 1 , further comprising a third conductive layer on the second semiconductor layer, and a fourth barrier layer between the second conductive layer and the third conductive layer.

17. A light-emitting device according to claim 16 , wherein the fourth barrier layer comprises a fifth metal layer and a sixth metal layer stacked on the fifth metal layer, wherein the sixth metal layer comprises a material different from that of the fifth metal layer.

18. A light-emitting device according to claim 2 , wherein the thickness of the first conductive layer is of the same order as that of the second conductive layer.

19. A light-emitting device according to claim 16 , wherein the thickness of the third conductive layer is of the same order as those of the second conductive layer and the first conductive layer.

20. A light-emitting device, comprising:

a first semiconductor layer;

an active layer on the first semiconductor layer;

a second semiconductor layer on the active layer; and

an electrode structure on the second semiconductor layer,

wherein the electrode structure comprises a conductive layer on the second semiconductor layer, a bonding layer on the conductive layer, and a first barrier layer between the bonding layer and the conductive layer,

wherein the first barrier layer comprises a material selected from a group consisting of Cr, Pt, Ti, TiW, W, and Zn, and

wherein the total thickness of the conductive layer and the bonding layer is about 0.6˜0.9 or 0.75˜0.95 times the total thickness of the electrode structure.

Assignments (2)
CHANGE OF NAME Recorded Feb 26, 2026
From: EPISTAR CORPORATION
To: ENNOSTAR CORPORATION
Reel/Frame 075152/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2020
From: KUO, DE-SHAN; KO, TING-CHIA; TU, CHUN-HSIANG; CHIU, PO-SHUN
To: EPISTAR CORPORATION
Reel/Frame 054459/0204 →
Continuity (8)
Continuation 16510502 · Jul 12, 2019
Continuation 16019136 · Jun 26, 2018
Continuation 15854462 · Dec 26, 2017
Continuation 15357334 · Nov 21, 2016
Continuation 15049917 · Feb 22, 2016
Continuation 13854212 · Apr 1, 2013
Provisional Application 61721737 · Nov 2, 2012
Related Publication 20210074890A1 · Mar 11, 2021