Integrated circuit with current limit testing circuitry

1. An integrated circuit, comprising:

a signal path configured to conduct path current;

a switching device coupled between a first node and a second node along the signal path;

a comparator having a first input coupled to the first node and a second input coupled to the second node, the comparator configured to receive a reference voltage and to compare to the reference voltage a differential voltage between the first input and the second input;

disable circuitry configured to open the switching device while a voltage is applied between the first node and the second node and the voltage is ramped until an output of the comparator transitions; and

enable circuitry configured to close the switching device while a device current is applied through the switching device.

2. The integrated circuit of claim 1 wherein the disable circuitry configured to open the switching device is configured to open the switching device only during testing of the integrated circuit.

3. The integrated circuit of claim 1 wherein the switching device comprises a field effect transistor.

4. The integrated circuit of claim 3 wherein the disable circuitry configured to open the switching device and the enable circuitry configured to close the switching device include a node configured to couple to automated test equipment to receive a field effect gate signal from the automated test equipment.

5. The integrated circuit of claim 1 wherein the disable circuitry configured to open the switching device and the enable circuitry configured to close the switching device include a node configured to couple to automated test equipment to receive a switch enable and switch disable signal.

6. The integrated circuit of claim 5 wherein the node is internal to the integrated circuit and not directly connected to an IC external pad.

7. The integrated circuit of claim 1 and further including automated test equipment configured to couple to the integrated circuit and to determine a maximum current specification for the path current in response to a measure of the voltage level that causes the output of the comparator to transition and a measure of a resistance of the switching device.

8. The integrated circuit of claim 7 wherein the automated test equipment is further configured to determine resistance of the switching device.

9. The integrated circuit of claim 7 wherein the automated test equipment is further configured to:

measure a voltage across the switching device while the device current is applied through the switching device; and

determine resistance of the switching device in response to a ratio of the measured voltage and a magnitude of the device current.

10. The integrated circuit of claim 1 and further including a plurality of functional circuits coupled to signal path.

11. The integrated circuit of claim 1 wherein the disable circuitry and the enable circuitry comprise a same circuit.

12. A method, comprising:

operating an integrated circuit during a test mode by creating an open circuit between a first node and a second node that are both along a signal path of the integrated circuit during non-test mode operations;

with the open circuit, iteratively applying a respectively adjusted differential voltage between the first node and the second node until a responsive state change occurs in response to a corresponding respectively adjusted differential voltage;

coupling a resistance between the first node and the second node;

with the resistance between the first node and the second node, applying a current through the resistance and measuring a voltage across the resistance;

determining in an apparatus a value of the resistance in response to the corresponding respectively adjusted differential voltage and the current; and

determining in the apparatus an anticipated specification current limit for the signal path of the integrated circuit in response to the corresponding respectively adjusted differential voltage and the determined resistance.

13. The method of claim 12 wherein the step that includes creating an open circuit includes disabling a field effect transistor having a source/drain path between the first node and the second node.

14. The method of claim 12 wherein the responsive state change is provided in response to an output of a differential comparator having a first input coupled to the first node and a second input coupled to the second node.

15. The method of claim 12 :

wherein the step that includes creating an open circuit includes disabling a field effect transistor having a source/drain path between the first node and the second node; and

wherein the responsive state change is provided in response to an output of a differential comparator on the integrated circuit and having a first input coupled to the first node and a second input coupled to the second node.

16. The method of claim 12 wherein the step of, with the resistance between the first node and the second node, applying a current through the resistance includes applying a current no greater than ten percent of the anticipated specification current limit.

17. The method of claim 12 wherein the apparatus is coupled to the integrated circuit.

18. The method of claim 17 wherein the apparatus is an automated test equipment (ATE).

19. A non-transitory computer-readable program storage medium having stored thereon program instructions that when executed by processing logic have the processing logic configured to:

couple a test signal to an integrated circuit during a test mode to create an open circuit between a first node and a second node that are both along a signal path of the integrated circuit during non-test mode operations;

with the open circuit, iteratively apply a respectively adjusted differential voltage between the first node and the second node until a responsive state change occurs in response to a corresponding respectively adjusted differential voltage;

enable a resistance between the first node and the second node;

with the resistance enabled between the first node and the second node, apply a resistance current through the resistance and measure a voltage across the resistance;

determine a value of the resistance in response to the corresponding respectively adjusted differential voltage and the resistance current; and

determine an anticipated specification current limit for the signal path of the integrated circuit in response to the corresponding respectively adjusted differential voltage and the determined resistance.

20. The non-transitory computer-readable program storage medium of claim 19 wherein the test signal coupled to an integrated circuit is for coupling to a gate of a field effect transistor having a source/drain path between the first node and the second node.

21. The non-transitory computer-readable program storage medium of claim 19 wherein the iteratively applied respectively adjusted differential voltage is coupled between inputs of a comparator and the responsive state occurs at an output of the comparator.

22. The non-transitory computer-readable program storage medium of claim 19 :

wherein the test signal coupled to an integrated circuit is for coupling to a gate of a field effect transistor having a source/drain path between the first node and the second node; and

wherein the iteratively applied respectively adjusted differential voltage is coupled between inputs of a comparator and the responsive state occurs at an output of the comparator.

23. The non-transitory computer-readable program storage medium of claim 19 wherein the applied resistance current is no greater than ten percent of the anticipated specification current limit.