IP Library Granted Patent US 12,599,988
Granted Patent B2
US 12,599,988 · App. 17/216,729 · Granted Apr 14, 2026

Process of making components for electronic and optical devices using laser processing

Inventors: Nicholas R. Glavin (Springboro, OH); Philip R. Buskohl (Beavercreek, OH); Kimberly A. Gliebe (Mentor, OH); Christopher Muratore (Kettering, OH); Drake Austin (Beavercreek, OH)
Assignee: United States of America as represented by the Secretary of the Air Force
B23K26/0006H01L21/02675H01L21/324H01L21/428
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,599,988
App. No.
17/216,729
Granted
Apr 14, 2026
Kind
B2
Abstract

The present invention relates to processes of making components for electronic and optical devices using laser processing and devices comprising such components. Such process uses a laser to introduce chemical and/or structural changes in substrates and films that are the raw materials from which components for electronic and optical devices are made. Such process yields components that can have one or more electronic and/or optical functionalities that are integrated on the same substrate or film. In addition, such process does not require large-scale clean rooms and is easily configurable. Thus, rapid device prototyping, design change and evolution in the lab and on the production side is realized.

Claims (33)

1 . A process of making an electrical component, an optical component, or a combined electrical and optical component, said process comprising:

pattern illumination-based annealing at a intensity and for a time, at least one material that comprises, prior to said annealing, two or more regions that are amorphous, nanocrystalline, microcrystalline or crystalline with the proviso that at least two of said regions are not identical with respect being amorphous, nanocrystalline, microcrystalline or crystalline, said at least one material comprising a transition metal and an element selected from the group consisting of hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof, using a laser or lamp, to form on, within or on and within said material:

(i) at least two electronic elements selected from a conductor, semiconductor and an insulator;

(ii) two or more different conductors having at least one of the following: different electrical properties or different optical properties;

(iii) two or more different semiconductors having at least one of the following: different electrical properties or different optical properties; or

(iv) two or more different insulators having at least one of the following: different electrical properties or different optical properties;

said process being performed under one of the following conditions: vacuum of less than 100 torr, air, or under a fluid blanket other than air;

said pattern illumination-based annealing resulting in at least one of a chemical change or structural change in at least one of said materials that results in an electrical component, an optical component or a combined electrical and optical component being created to form on, within or on and within said material.

2 . The process of claim 1 wherein said at least one material is a single material.

3 . The process of claim 1 wherein said transition metal is selected from the group consisting of: molybdenum, tungsten, niobium, tantalum, vanadium, titanium, chromium, iron, rhodium, hafnium, rhenium, and mixtures thereof.

4 . The process of claim 1 wherein said process is performed only under atmospheric air.

5 . The process of claim 1 wherein said process is performed under a fluid blanket other than air, and said fluid blanket comprises:

a) an element selected from the group consisting of krypton, xenon, radon, argon, neon, helium, hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof;

b) based on total fluid volume greater than 0% to about 19% or from 21% to 100% oxygen; and/or

c) greater than 0% to about 78% or from 80% to 100% nitrogen.

6 . A process according to claim 1 wherein said two or more regions are nanocrystalline, microcrystalline, or crystalline.

7 . A process according to claim 1 wherein said pattern illumination-based annealing is achieved by using a laser to subject said material for a time of about 1 femtosecond to 60 seconds, said laser having power of from about 1 W/cm 2 to about 1×10 15 W/cm 2 over said time of about 1 femtosecond to 60 seconds.

8 . A process according to claim 1 wherein said pattern illumination-based annealing is achieved by using a continuous wave laser to subject said material for a time of about 0.1 milliseconds to 60 seconds to said laser, said laser having power of from about 1 W/cm 2 to about 1×10 8 W/cm 2 over said time of about 0.1 milliseconds to 60 seconds.

9 . A process according to claim 1 wherein said pattern illumination-based annealing is achieved by using a continuous wave laser to subject said material for a time of about 1 femtosecond to 60 seconds to said laser, said laser having power of from about 1×10 8 W/cm 2 to about 1×10 16 W/cm 2 over said time of about 1 femtosecond to 60 seconds.

10 . The process of claim 1 wherein, said material comprises a film having a thickness of from about 0.1 nanometers to about 1 centimeter.

11 . The process of claim 1 wherein, said material comprises a film having a thickness of from about 0.3 nanometers to about 10 micrometers.

12 . The process of claim 1 wherein, said electrical and/or optical component is selected from the group consisting of an inductor, a capacitor, a resistor, a diode, a transistor, a trace, a battery, an optical filter, and a solar cell.

13 . A process of making electrical device, an optical device or a combined electrical and optical device, said process comprising combining:

a) two or more electrical, an optical or a combined electrical and optical components produced according to the process of claim 1 ; or

b) at least one electrical, optical or combined electrical and optical component produced according to the process of claim 1 , and one or more additional electrical, optical or combined electrical and optical components, said one or more additional electrical, optical or combined electrical and optical components are not produced according to the processes of claim 1 .

14 . An electrical device, an optical device or a combined electrical and optical device:

a) on, within or on and within at least one material that comprises two or more regions that are amorphous, nanocrystalline, microcrystalline or crystalline with the proviso that at least two of said regions are not identical with respect being amorphous, nanocrystalline, microcrystalline or crystalline, said at least one material comprising a transition metal and an element selected from the group consisting of hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof; or

b) on, within or on and within at least one material that comprises at least one region that is amorphous, nanocrystalline, microcrystalline or crystalline, said at least one material comprising a transition metal and an element selected from the group consisting of hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof;

said electrical device, an optical device or a combined electrical and optical device being produced according to the process of claim 1 .

15 . The process of claim 1 wherein said pattern illumination-based annealing results in a chemical change in at least one of said materials that results in an electrical component, an optical component or a combined electrical and optical component being created to form on, or within said material.

16 . The process of claim 2 wherein said single material is a single substrate or film, and said process provides multiple functions that are integrated on, within, or on and within said single substrate or film.

17 . The process of claim 1 wherein said pattern illumination-based annealing results in a change in the molecular composition in a region of at least one of said materials that results in an electrical component, an optical component or a combined electrical and optical component being formed on, within or on and within said material.

18 . The process of claim 17 wherein the transition metal is Mo, and the element is oxygen, and the process forms different oxide phases MoO 2 and MoO 3 on, within, or on and within said material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2021
From: BUSKOHL, PHILIP R, DR; MURATORE, CHRISTOPHER, DR; GLIEBE, KIMBERLY A; GLAVIN, NICHOLAS R, DR; AUSTIN, DRAKE
To: GOVERNMENT OF THE UNITED STATES, AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE
Reel/Frame 055760/0891 →
Continuity (2)
Provisional Application 63001604 · Mar 30, 2020
Related Publication 20210299781A1 · Sep 30, 2021
References Cited (70)
US 3138743A · Kilby · 1964 [cited by applicant]
US 5515241A · Werther · 1996 [cited by applicant]
US 5526280A · Consadori et al. · 1996 [cited by applicant]
US 10429381B2 · Hoffman · 2019 [cited by applicant]
US 10770483B2 · Sugawara · 2020 [cited by examiner]
US 10875339B1 · Claussen · 2020 [cited by applicant]
US 11469351B2 · Li · 2022 [cited by examiner]
US 12123845B2 · Mahjouri-Samani · 2024 [cited by applicant]
US 20060246632A1 · Okumura · 2006 [cited by applicant]
US 20120043546A1 · Oh · 2012 [cited by applicant]
US 20180308692A1 · Muratore · 2018 [cited by applicant]
US 20200090933A1 · Muratore · 2020 [cited by applicant]
US 20210299789A1 · Glavin et al. · 2021 [cited by applicant]
US 20210301381A1 · Glavin et al. · 2021 [cited by applicant]
US 20210313188A1 · Glavin et al. · 2021 [cited by applicant]
US 20210325380A1 · Muthukumar · 2021 [cited by applicant]
US 20220140147A1 · Choe · 2022 [cited by applicant]
US 20220270891A1 · Currie · 2022 [cited by applicant]
US 20230045818A1 · Glavin et al. · 2023 [cited by applicant]
US 20230148461A9 · Glavin et al. · 2023 [cited by applicant]
US 20230152309A9 · Glavin et al. · 2023 [cited by applicant]
“Mine, H. et al., Laser-Beam-Patterned Topological Insulating States on Thin Semiconducting MoS2,” Oct. 2, 2019, American Physical Society, vol. 123, p. 146803 (Year: 2019). [cited by examiner]
“Tan, Y. et al., Controllable 2H-to-1T Phase Transition in Few-Layer MoTe2,” Oct. 10, 2018, Royal Society of Chemistry, 10, pp. 19964-19970 (Year: 2018). [cited by examiner]
Mcconny, M.E. et al.; “Direct synthesis of ultra-thin large area transition metal dichalcogenides and their heterostructures on stretchable polymer surfaces,” J. of Mat. Res., 2016, 0, 0, 1-8. [cited by applicant]
Sirota, B. et al. “Room temperature magnetron sputtering and laser annealing of ultrathin MoS2 for flexible transistors,” Vacuum, 2019, 160, 133-138. [cited by applicant]
Kim, R. H. et al.; “Photonic Crystallization of MoS2 for Stretchable Photodetectors,” Nanoscale, Nov. 2019, 13260-13268. [cited by applicant]
Galvin, N. R.; IEEE Presentation Rapid Conference in Miramar Beach, FL. Aug. 20, 2019, 1-44. [cited by applicant]
Ahmadi, Z. et al “Self-limiting laser crystallization and direct writing of 2D materials” Int. J. Extrem. Manuf. Jan. 2019, 015001, 1-8. [cited by applicant]
Vilá, R. A. . . . et al.“In situ crystallization kinetics of two-dimensional MoS2” 2D Mater. May 2018, 5, 011009, 1-8. [cited by applicant]
Muratore, C. “Biofunctionalized Two-dimensional MoS2 Receptors for Rapid Response Modular Electronic SARS-CoV-2 and Influenza A Antigen Sensors” medrxivorg., Nov. 20, 2020, 1-11. [cited by applicant]
Muratore, C. “Beyond point of care diagnostics: Lowdimensional nanomaterials for electronic virus sensing” J. Vac. Sci. Technol. A 2020, 38, 050804, 1-16. [cited by applicant]
Austin Drake et al: “Laser writing of electronic circuitry in thin film molybdenum disulfide: A transformative manufacturing approach”, Materials Today 2020, 43, pp. 17-26. [cited by applicant]
Yi Rang Lim et al: “Roll-to-Roll Production of Layer-Controlled Molybdenum Disulfide: A Platform for 2D Semiconductor-Based Industrial Applications”, Advanced Materials, 2018, 30,1705270, pp. 1-8. [cited by applicant]
Rai Rachel H et al: “Pulsed laser annealing of amorphous two-dimensional transition metal dichalcogenides” J. Vac. Sci. Technol. 2020, A 38, 052201, pp. 1-7. [cited by applicant]
PCT International Search Report for PCT/US22/20850. [cited by applicant]
PCT Written Opinion of The International Searching Authority for PCT/US22/20850. [cited by applicant]
U.S. Appl. No. 17/216,729, filed Nov. 25, 2024 Non-final Rejection. [cited by applicant]
Mine, H.; Kobayashi, A.; Nakamura, T.; Inoue, T.; Pakdel, S.; Marian, D.; Gonzalez-Marin, E.; Maruyama, S.; Katsumoto, S.; Fortunelli, A.; Palacios, J.J.; Haruyama, J.; Laser-Beam-Patterned Topological Insulating States… [cited by applicant]
Tan, Y.; Luo, F.; Zhu, M.; Xu, X.; Ye, Y.; Li, B.; Wang, G.; Luo, W.; Zheng, X.; Wu, N.; Yu, Y.; Qin, S.; Zhang, X.; Controllable 2H-to-1T phase transition in few-layer MoTe2 Nanoscale Oct. 2018, 19964-19971. [cited by applicant]
PCT International Search Report for PCT/US22/20851. [cited by applicant]
PCT Written Opinion of The International Searching Authority for PCT/US22/20851. [cited by applicant]
PCT International Search Report for PCT/US22/20853. [cited by applicant]
PCT Written Opinion of The International Searching Authority for PCT/US22/20853. [cited by applicant]
PCT International Search Report for PCT/US22/20854. [cited by applicant]
PCT Written Opinion of The International Searching Authority for PCT/US22/20854. [cited by applicant]
Castellanos-Gomez et al. (“Laser-thinning of MoS2: On-Demand Generation of a Single-Layer Semiconductor.” Nano Letters. vol. 12, No. 6, 3187-3192 (2012). DOI: 10.1021/nl301164v). [cited by applicant]
Kukkar et al. (“A New Electrolytic Synthesis Method for Few Layered MoS2 Nanosheets and Their Robust Biointerfacing With Reduced Antibodies.” ACS Applied Materials & Interfaces, 8, 16555-16563 (2016). DOI: 10.1021/acsam… [cited by applicant]
U.S. Appl. No. 17/336,855, filed Feb. 13, 2025 Non-final Rejection. [cited by applicant]
U.S. Appl. No. 17/336,799, filed Mar. 3, 2025 Non-final Rejection. [cited by applicant]
U.S. Appl. No. 17/216,729, filed Apr. 21, 2025 Final Rejection. [cited by applicant]
U.S. Appl. No. 17/336,799, filed Mar. 31, 2025 Non-final Rejection. [cited by applicant]
U.S. Appl. No. 17/523,705, filed Jun. 5, 2025 Non-final Rejection. [cited by applicant]
U.S. Appl. No. 17/523,721, filed Apr. 15, 2025 Non-final Rejection. [cited by applicant]
U.S. Appl. No. 17/957,293, filed Apr. 15, 2025 Non-final Rejection. [cited by applicant]
Supplemental information for Kukkar, et al. “A New Electrolytic Synthesis Method for Few Layered MoS2 Nanosheets and Their Reduced Antibodies”, ACS Applied Materials & Interfaces, 8, 16555-16563 (2016). DOI: 10.1021/acs… [cited by applicant]
Zhang, et al. “Protocell arrays for simulatneous detection of diverse analytes”, Nat Commun 12, 5724 (2001). DOE: 10.1038/s41467-021-25989-3. (Year: 2021). [cited by applicant]
Lee, et al. “Two-dimensional Layered MoS2 Biosensors Enable Highly Sensitive Detection of Biomolecules”, Sci Rep 4, 7352 (2014). DOI: 10.1038/srep07352. (Year: 2014). [cited by applicant]
Windom, et al. “A Raman Spectroscopic Study of MoS2 and MoO3: Applications to Tribological Systems”, Tribol Lett 42, 301-310 (2011). DOI: 10.1007/s11249-011-9774-x) (Year: 2011). [cited by applicant]
Lu, et al., “Layer-by-layer thinning of MoS2 by thermal annealing”, Nanoscale 5, 8904-8908 (2013). DOI: 10.1039/c3nr03101b (Year: 2013). [cited by applicant]
Li, et al., “The Stability of Metallic MoS2 Nanosheets and Their Property Change by Annealing”, Nanomaterials, 9, 1366 (2019). DOI: 10.3390/nano9101366. (Year: 2019). [cited by applicant]
Kang, et al., “High-performance MoS2 transistors with low-resistance molybdenum contacts”, Applied Physics Letters 104, 093106 (2014). DOI: 10.1063/1.4866340. (Year: 2014). [cited by applicant]
U.S. Appl. No. 17/336,855, filed Sep. 12, 2025 Non-final Rejection. [cited by applicant]
U.S. Appl. No. 17/523,705, filed Oct. 31, 2025 Final Rejection. [cited by applicant]
U.S. Appl. No. 17/957,293, filed Nov. 28, 2025 Final Rejection. [cited by applicant]
Naylor et al. (“Scalable Production of Molybdenum Disulfide Based Biosensors.” ACS Nano, 10(6), 6173-6179 (2016). DOI: 10.1021 /acsnano.6b02137). (Year: 2016). [cited by applicant]
Rajeev et al. (“Laser patterned polymer/nanotube composite electrodes for nanowire transistors on flexible substrates.” arXiv: Applied Physics (2017). DOI: 10.48550/arXiv.1711.06925). (Year: 2017). [cited by applicant]
Kang et al. (“Controllable atomic-ratio of CVD-grown MoS2-MoO2 hybrid catalyst by soft annealing for enhancing hydrogen evolution reaction.” International Journal of Hydrogen Energy, 45, 1399-1408 (2020). DOI: 10.1016/j… [cited by applicant]
Li et al. (“Fibroin-like Peptides Self-Assembling on Two-Dimensional Materials as a Molecular Scaffold for Potential Biosensing.” ACS Applied Materials & Interfaces, 11, 20670-20677 (2019). DOI: 10.1021/acsami.9b04079).… [cited by applicant]
Wells et al. (“Roll-to-Roll Deposition of Semiconducting 20 Nanoflake Films of Transition Metal Dichalcogenides for Optoelectronic Applications.” ACS Appl. Nano Mater., 2, 7705-7712 (2019). DOI: 10.1021/acsanm.9b01774).… [cited by applicant]
Park et al. (“Laser-directed synthesis of strain-induced crumpled MoS2 structure for enhanced triboelectrification toward haptic sensors.” Nano Energy, 78, 105266 (2020). DOI: 10.1016/j.nanoen.2020.105266). (Year: 2020). [cited by applicant]