Gate cut with integrated etch stop layer
A method of forming a power rail to semiconductor devices comprising removing a portion of the gate structure forming a gate cut trench separating a first active region of fin structures from a second active region of fin structures. A conformal etch stop layer is formed in the gate cut trench. A fill material is formed on the conformal etch stop layer filling at least a portion of the gate cut trench. The fill material has a composition that is etched selectively to the conformal etch stop layer. A power rail is formed in the gate cut trench. The conformal etch stop layer obstructs lateral etching during forming the power rail to substantially eliminate power rail to gate structure shorting.
1. A method of forming a semiconductor device, comprising:
providing a substrate;
providing a sacrificial gate structure above the substrate, the sacrificial gate structure having a sacrificial gate cap on a top surface of the sacrificial gate structure,
wherein the sacrificial gate structure comprises sacrificial gate structure materials, and
wherein the sacrificial gate cap comprises sacrificial gate cap materials;
etching through the sacrificial gate cap and the sacrificial gate structure to form a gate cut trench and separate first and second sacrificial gate segments, each sacrificial gate segment comprising sacrificial gate structure materials and sacrificial gate cap materials;
depositing a first etch stop layer on the exposed surfaces of the gate cut trench;
filling the gate cut trench by depositing a first dielectric material to form a first dielectric fill region;
etching an upper portion of the first dielectric fill region to form a first recess;
depositing a second etch stop layer on a bottom surface and the sidewalls of the first recess; and
depositing a second dielectric material on the second etch stop layer to fill the first recess.
2. The method of claim 1 , further comprising:
etching the second dielectric material to form a second recess;
depositing an electrically conductive material in the second recess; and
planarizing the electrically conductive material.
3. The method of claim 1 , wherein the first etch stop layer comprises an oxide.
4. The method of claim 1 , wherein the first etch stop layer comprises hafnium oxide.
5. The method of claim 1 , wherein the second etch stop layer comprises an oxide.
6. The method of claim 1 , wherein the second etch stop layer comprises a rare earth oxide.
7. The method of claim 1 , wherein the second etch stop layer comprises hafnium oxide.
8. The method of claim 1 , wherein the second etch stop layer has a thickness of about 1 nm.
9. The method of claim 1 , wherein the second etch stop layer has a thickness of about 2 nm.
10. The method of claim 1 , wherein the second etch stop layer has a thickness of about 5 nm to about 25 nm.
11. The method of claim 2 , wherein the electrically conductive material comprises Tungsten.
12. The method of claim 2 , wherein the electrically conductive material comprises Cobalt.
13. The method of claim 2 , wherein the electrically conductive material comprises Ruthenium.
14. The method of claim 2 , wherein the electrically conductive material comprises Titanium, Aluminum, or Copper.
15. A method of forming a semiconductor device, comprising:
providing a substrate;
providing a sacrificial gate structure above the substrate;
etching through the sacrificial gate structure to form a gate cut trench and separate first and second sacrificial gate segments;
depositing a first etch stop layer on the exposed surfaces of the gate cut trench;
filling the gate cut trench by depositing a first dielectric material to form a first dielectric fill region;
planarizing the first dielectric material;
etching an upper portion of the first dielectric fill region to form a first recess;
depositing a second etch stop layer on a bottom surface and the sidewalls of the first recess;
depositing a second dielectric material on the second etch stop layer to fill the first recess; and
planarizing the second dielectric material.
16. The method of claim 15 , further comprising:
etching the second dielectric material to form a second recess;
depositing an electrically conductive material in the second recess; and
planarizing the electrically conductive material.
17. The method of claim 15 , wherein the second etch stop layer comprises an oxide.
18. The method of claim 15 , wherein the second etch stop layer comprises a rare earth oxide.
19. The method of claim 15 , wherein the second etch stop layer comprises hafnium oxide.
20. The method of claim 15 , wherein the second etch stop layer has a thickness of about 1 nm.
21. The method of claim 15 , wherein the second etch stop layer has a thickness of about 2 nm.
22. The method of claim 15 , wherein the second etch stop layer has a thickness of about 5 nm to about 25 nm.
23. The method of claim 16 , wherein the electrically conductive material comprises Cobalt.
24. The method of claim 16 , wherein the electrically conductive material comprises Ruthenium.
25. The method of claim 16 , wherein the electrically conductive material comprises Titanium, Aluminum, or Copper.