Granted Patent B2

US 12,329,527 · App. 17/223,498 · Granted Jun 17, 2025

Inventors: John Louis Parker (Artarmon, AU); Milan Obradovic (Artarmon, AU)

Assignee: Saluda Medical Pty Ltd

A61B5/24A61B5/316A61B5/388A61B5/407A61B5/7203A61B5/7214A61B5/7282G16H40/63A61B5/389A61B5/4836A61N1/36135

Abstract

Claims (47)

1. A method for detecting locally evoked neural responses in neural measurements obtained in the presence of distally evoked neural responses, the method comprising:

applying, by an implantable device, an electrical stimulus to a neural pathway;

obtaining, by the implantable device, a first neural measurement from a first sense electrode coupled to the implantable device;

obtaining, by the implantable device, a contemporaneous second neural measurement from a second sense electrode coupled to the implantable device and spaced apart from the first electrode along the neural pathway;

determining, by the implantable device, a neural response decay, the neural response decay being a measure of decay in a neural response from the first sense electrode to the second sense electrode, from the first neural measurement and the second neural measurement;

determining, by the implantable device, from the neural response decay whether a locally evoked neural response is present in the neural measurements; and

applying, by the implantable device, neurostimulation in response to the determining from the neural response decay whether a locally evoked neural response is present in the neural measurements.

2. The method of claim 1 , wherein the determined presence of the locally evoked neural response is used to characterize the performance of a local electrical stimulus regime.

3. The method of claim 1 , wherein the neural response decay is determined by determining a first amplitude of the first neural measurement, determining a second amplitude of the second neural measurement, and calculating a difference between the first amplitude and the second amplitude.

4. The method of claim 1 , wherein the neural response decay is determined by determining a first width of the first neural measurement, determining a second width of the second neural measurement, and calculating a difference between the first width and second width.

5. The method of claim 1 , wherein the neural response decay is determined as being a ratio of an amplitude or strength of the first neural measurement to an amplitude or strength of the second neural measurement.

6. The method of claim 3 , further comprising dividing the difference by an amplitude normalizing term comprising a sum of scalar variants of the first amplitude and second amplitude.

7. The method of claim 3 , wherein the first amplitude is determined at a first moment of the first measurement corresponding to an expected occurrence of the neural response, the first moment being determined by reference to a timing of the electrical stimulus and a distance from a stimulus site to the first sense electrode, and wherein the second amplitude is determined at a second moment of the second measurement corresponding to an expected occurrence of the neural response, the second moment being determined by reference to the timing of the electrical stimulus and a distance from the stimulus site to the second sense electrode.

8. The method of claim 5 , wherein the method is repeated in order to obtain a plurality of ratios resulting from repeated application of a given stimulus in order to give a probabilistic indication of the neural response decay to improve the determination of whether a locally evoked response is present.

9. The method of claim 5 , wherein the method is performed repeatedly in order to monitor changes in the ratio which occur over time.

10. The method of claim 1 , further comprising the step of using a signal quality indicator to detect whether any neural activity is present to avoid false positives.

11. The method of claim 1 , further comprising obtaining a contemporaneous third or additional neural measurement from a third or additional sense electrode(s) spaced apart from the first and second electrodes along the neural pathway.

12. A method for detecting locally evoked neural responses in neural measurements obtained in the presence of distally evoked neural responses, the method comprising:

applying, by an implantable device, an electrical stimulus to a neural pathway;

obtaining, by the implantable device, a first neural measurement from a first sense electrode coupled to the implantable device;

obtaining, by the implantable device, a contemporaneous second neural measurement from a second sense electrode coupled to the implantable device and spaced apart from the first electrode along the neural pathway;

determining, by the implantable device, a neural response decay, the neural response decay being a measure of decay in a neural response from the first sense electrode to the second sense electrode, from the first neural measurement and the second neural measurement; and

determining, by the implantable device, from the neural response decay whether a locally evoked neural response is present in the neural measurements by distinguishing the locally evoked neural response from distally evoked neural responses; and

applying, by the implantable device, neurostimulation in response to the determining from the neural response decay whether a locally evoked neural response is present in the neural measurements.

13. The method of claim 12 , wherein distinguishing the locally evoked response from the distally evoked responses comprises determining from the neural response decay that the locally evoked neural response is synchronized to the stimulus, or that the distally evoked neural response is not synchronized to the stimulus.

14. An implantable device for detecting locally evoked neural responses in neural measurements obtained in the presence of distally evoked neural responses, the device comprising:

a stimulus source for applying an electrical stimulus to a neural pathway;

measurement circuitry for obtaining a first neural measurement from a first sense electrode, and for obtaining a contemporaneous second neural measurement from a second sense electrode spaced apart from the first electrode along the neural pathway; and

a processor configured to:

determine from the first neural measurement and the second neural measurement a neural response decay, the neural response decay being a measure of decay in a neural response from the first sense electrode to the second sense electrode;

determine from the neural response decay whether a locally evoked neural response is present in the neural measurement; and

apply neurostimulation in response to the determining from the neural response decay whether a locally evoked neural response is present in the neural measurements.

15. A non-transitory computer readable medium for detecting locally evoked neural responses in neural measurements obtained in the presence of distally evoked neural responses, comprising instructions which, when executed by one or more processors, causes performance of the following:

applying, by an implantable device, an electrical stimulus to a neural pathway;

obtaining, by the implantable device, a first neural measurement from a first sense electrode coupled to the implantable device;

obtaining, by the implantable device, a contemporaneous second neural measurement from a second sense electrode coupled to the implantable device and spaced apart from the first electrode along the neural pathway;

determining, by the implantable device, a neural response decay, the neural response decay being a measure of decay in a neural response from the first sense electrode to the second sense electrode, from the first neural measurement and the second neural measurement;

determining, by the implantable device, from the neural response decay whether a locally evoked neural response is present in the neural measurements; and

applying, by the implantable device, neurostimulation in response to the determining from the neural response decay whether a locally evoked neural response is present in the neural measurements.

16. The implantable device of claim 14 , wherein the processor is configured to determine the neural response decay by determining a first amplitude of the first neural measurement, determining a second amplitude of the second neural measurement, and calculating a difference between the first amplitude and the second amplitude.

17. The implantable device of claim 16 , wherein the processor is configured to divide the difference by an amplitude normalizing term comprising a sum of scalar variants of the first amplitude and second amplitude.

18. The implantable device of claim 14 , wherein the processor is configured to determine the neural response decay by determining a first width of the first neural measurement, determining a second width of the second neural measurement, and calculating a difference between the first width and second width.

19. The implantable device of claim 14 , wherein the processor is configured to determine the neural response decay as being a ratio of an amplitude or strength of the first neural measurement to an amplitude or strength of the second neural measurement.

20. The implantable device of claim 14 , wherein the processor is configured to determine the first amplitude at a first moment of the first measurement corresponding to an expected occurrence of the neural response, the first moment being determined by reference to a timing of the electrical stimulus and a distance from a stimulus site to the first sense electrode, and wherein the processor is configured to determine the second amplitude at a second moment of the second measurement corresponding to an expected occurrence of the neural response, the second moment being determined by reference to the timing of the electrical stimulus and a distance from the stimulus site to the second sense electrode.

21. The implantable device of claim 19 , wherein the processor is configured to repeatedly detect whether a locally evoked neural response is present in the neural measurement, in order to obtain a plurality of ratios resulting from repeated application of a given stimulus in order to give a probabilistic indication of the neural response decay to improve the determination of whether a locally evoked response is present.

22. The implantable device of claim 14 , further comprising a signal quality indicator to detect whether any neural activity is present to avoid false positives.

23. The implantable device of claim 14 , wherein the processor is configured to use the determined presence of the locally evoked neural response to characterize the performance of a local electrical stimulus regime.

Assignments (2)

Priority Claims (1)

Continuity (2)

References Cited (400)