Methods, systems, and apparatuses for scanning and decoding direct part marking indicia
Various embodiments described herein relate to a scanning system for scanning and decoding direct part markings (DPM) type indicia. The scanning system includes an arrangement of an illumination module, a beam splitter module, and a telecentric lens assembly. The telecentric lens assembly is adapted to direct an in-line illumination received from the illumination module as collimated light to illuminate the DPM indicia. Upon illumination, a first portion of light reflected from embossments of the DPM indicia that are incident on the telecentric lens assembly at a defined angle is decoupled from an optical path between the telecentric lens assembly and the target. An imager is exposed to a second portion of reflected light, excluding the decoupled reflected light that is reflected from a substrate on the DPM indicia, in order to capture an image of the DPM indicia for decoding.
1. A system for scanning and decoding direct part marking (DPM) indicia, the system comprising:
an illumination assembly comprising:
an illumination module configured to generate an illumination, and
a beam splitter module configured to receive the illumination and project the illumination as an in-line illumination in a first direction of a target, wherein the target comprises DPM indicia;
a telecentric lens assembly configured to:
decouple a first portion of light reflected from at least one rough surface of the target, and
couple a second portion of light reflected from at least one non-rough surface of the target;
an imaging subsystem comprising an imager, wherein the imaging subsystem is configured to capture an image of the target comprising the DPM indicia along an imaging axis of the imager; and
a decoder module configured to decode the DPM indicia.
2. The system according to claim 1 , wherein the first portion of reflected light is incident on a second surface of the telecentric lens assembly at a defined angle with respect to an optical axis of the telecentric lens assembly, and wherein the second portion of reflected light travels parallel to the optical axis of the telecentric lens assembly and is incident at the second surface of the telecentric lens assembly.
3. The system according to claim 1 , further comprising a trigger configured to actuate at least one of: the imaging subsystem, the illumination module, and the decoder module.
4. The system according to claim 1 , further comprising an output module configured to:
receive an output provided by the decoder module in response to decoding the DPM indicia; and
display the output.
5. The system according to claim 1 , wherein the imaging subsystem is further configured to capture a reverse contrast image, in response to, receiving the second portion of reflected light.
6. The system according to claim 1 , wherein the second portion of reflected light, directed in a second direction of the imager, comprises collimated light from at least one non-rough surface of the target.
7. The system according to claim 1 , wherein the beam splitter module is further configured to merge the in-line illumination in a direction of the imaging axis.
8. The system according to claim 1 , wherein the telecentric lens assembly is arranged between the target and the imager and wherein the beam splitter module is arranged between the illumination module and the telecentric lens assembly.
9. The system according to claim 1 , wherein the illumination module is positioned at a focal plane of the telecentric lens assembly.
10. The system according to claim 1 , wherein the telecentric lens assembly is positioned such that a converging beam or a diverging beam exiting the telecentric lens assembly aligns with a curvature of the target.
11. The system according to claim 1 , further comprising a housing supporting the illumination assembly and the imaging subsystem.
12. The system according to claim 11 , wherein the telecentric lens assembly comprises a telecentric lens.
13. The system according to claim 12 , wherein the illumination assembly comprising the illumination module, the beam splitter module, and the telecentric lens assembly, is mechanically engaged on the housing such that the imaging axis of the imaging subsystem is co-linear with an optical axis of the telecentric lens.
14. The system according to claim 12 , wherein the imager of the imaging subsystem is positioned at a focal plane passing through a focus of the telecentric lens.
15. The system according to claim 12 , wherein the telecentric lens is arranged within the housing and adapted to pass through at least one of: a converging beam or a diverging beam of the illumination from a second surface such that the illumination projected from the telecentric lens aligns with a curvature of the target.
16. A method for scanning and decoding direct part marking (DPM) indicia, the method comprising:
receiving, by a beam splitter, an illumination projected from an illumination source;
projecting, by the beam splitter, the illumination as an in-line illumination wherein the in-line illumination includes light rays directed along a first direction of a target, wherein the target comprises a DPM indicia;
directing, by a telecentric lens, a first portion of reflected light from at least one rough surface of the target that is incident on a second surface of the telecentric lens in a direction away from an imager;
exposing the imager to a second portion of reflected light from the target that is directed by the telecentric lens in a second direction of the imager, wherein the second portion of reflected light is directed in the second direction along an imaging axis of the imager; and
capturing, by the imager, an image of the DPM indicia based on the second portion of reflected light.
17. The method according to claim 16 , further comprising decoding the DPM indicia.
18. The method according to claim 17 , further comprising displaying an output received from the decoded DPM indicia.
19. The method according to claim 16 , further comprising capturing a reverse contrast image including a pattern of dark spots and a pattern of light spots, wherein the pattern of dark spots correspond to a surface of a substrate of the target and the pattern of light spots corresponds to embossments of the DPM on the target.
20. The method according to claim 16 , further comprising decoupling the first portion of reflected light from the target.