IP Library › Granted Patent US 11,842,916
Granted Patent B2
US 11,842,916 · App. 17/254,905 · Granted Dec 12, 2023

Semiconductor processing adhesive tape and method of manufacturing semiconductor device

Inventors: Kazuto Aizawa (Tokyo, JP); Jun Maeda (Tokyo, JP)
Assignee: Lintec Corporation
H01L21/6836C09J7/241C09J7/255C09J7/29C09J7/385C09J133/08H01L21/78C09J2423/006C09J2433/00C09J2467/006
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Quick Facts
Patent No.
US 11,842,916
App. No.
17/254,905
Granted
Dec 12, 2023
Kind
B2
Abstract

A semiconductor processing adhesive tape that includes a substrate, a buffer layer which is provided on at least one side of the substrate, and an adhesive layer which is provided on the other side of the substrate, wherein the buffer layer has an energy to break at 23° C. of 13 to 80 MJ/m 3 .

Claims (11)

1. A semiconductor processing adhesive tape comprising a base, a buffer layer provided at least on one surface of the base, and an adhesive layer provided on another surface of the base, wherein

a breaking energy at 23° C. of the buffer layer is 13 to 80 MJ/m 3 .

2. The semiconductor processing adhesive tape according to claim 1 , wherein a Young's modulus at 23° C. of the base is 1000 to 30,000 MPa.

3. The semiconductor processing adhesive tape according to claim 1 , wherein the buffer layer is a cured product of a buffer layer forming composition including an energy ray polymerizable compound.

4. The semiconductor processing adhesive tape according to claim 1 , wherein a thickness of the adhesive layer is less than 100 μm.

5. A semiconductor processing adhesive tape comprising a base and an adhesive layer provided at least to a surface of the base, wherein a breaking energy at 23° C. of the base is 13 to 80 MJ/m 3 .

6. A method for producing a semiconductor device including:

cutting the semiconductor processing adhesive tape according to claim 1 along an outer circumference of a semiconductor wafer which is adhered with the semiconductor processing adhesive tape;

forming a groove from a front surface side of the semiconductor wafer or forming a modified region inside the semiconductor wafer from the front surface or a back surface of the semiconductor wafer;

dicing the semiconductor wafer, of which the adhesive tape is adhered on the front surface and the groove or the modified region is formed, using the groove or the modified region as a starting point for forming a plurality of chips by grinding from the back surface; and

releasing the semiconductor processing adhesive tape from the plurality of chips.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2020
From: AIZAWA, KAZUTO; MAEDA, JUN
To: LINTEC CORPORATION
Reel/Frame 054718/0265 →
Priority Claims (1)
JP 2018-121127 · Jun 26, 2018 · national
Continuity (1)
Related Publication 20210265193A1 · Aug 26, 2021