IP Library Granted Patent US 11,482,466
Granted Patent B2
US 11,482,466 · App. 17/269,523 · Granted Oct 25, 2022

Method of manufacturing semiconductor device, thermally conductive sheet, and method of manufacturing thermally conductive sheet

Inventors: Mika Kobune (Tokyo, JP); Michiaki Yajima (Tokyo, JP)
Assignee: SHOWA DENKO MATERIALS CO., LTD.
H01L23/3737H01L21/4882H01L23/3675
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,482,466
App. No.
17/269,523
Granted
Oct 25, 2022
Kind
B2
Abstract

A method of manufacturing a semiconductor device includes: adhering together a heat generating body and a heat dissipating body via a thermally conductive sheet by applying a pressure on the heat generating body and the heat dissipating body in a thickness direction of the thermally conductive sheet with the thermally conductive sheet disposed therebetween, the thermally conductive sheet having a compression modulus of 1.40 MPa or less under a compressive stress of 0.10 MPa at 150° C., and a tack strength of 5.0 N·mm or more at 25° C.

Claims (9)

1. A method of manufacturing a semiconductor device, the method comprising adhering together a heat generating body and a heat dissipating body via a thermally conductive sheet, by applying pressure to the heat generating body and the heat dissipating body in a thickness direction of the thermally conductive sheet with the thermally conductive sheet disposed therebetween, the thermally conductive sheet having a compression modulus of from 0.50 to 1.40 MPa under a compressive stress of 0.10 MPa at 150° C., and a tack strength of 5.0 N·mm or more at 25° C.

2. The method of manufacturing a semiconductor device according to claim 1 , wherein the thermally conductive sheet has a thermal conductivity of 7 W/(mK) or higher, the thermal conductivity being obtained using a thermal resistance measured by a steady state method.

3. The method of manufacturing a semiconductor device according to claim 1 , wherein the pressure is from 0.05 to 10.00 MPa.

4. The method of manufacturing a semiconductor device according to claim 3 , wherein the pressure is from 0.10 to 0.50 MPa.

5. The method of manufacturing a semiconductor device according to claim 1 , wherein the heat generating body is a semiconductor chip and the heat dissipating body is a heat spreader.

6. The method of manufacturing a semiconductor device according to claim 1 , wherein an area of a face of the heat generating body that faces the thermally conductive sheet is 25 mm 2 or more.

7. The method of manufacturing a semiconductor device according to claim 1 , wherein the heat generating body is a semiconductor package provided with a heat spreader, and the heat dissipating body is a heat sink.

8. The method of manufacturing a semiconductor device according to claim 1 , wherein the heat generating body is a semiconductor module.

9. The method of manufacturing a semiconductor device according to claim 1 , wherein an area of a face of the heat generating body that faces the thermally conductive sheet is 100 mm 2 or more.

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED ON REEL 063016 FRAME 0952. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Apr 17, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 063348/0944 →
CHANGE OF NAME Recorded Mar 17, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 063016/0952 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2021
From: KOBUNE, MIKA; YAJIMA, MICHIAKI
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 055526/0211 →