Manufacturing method of semiconductor device
A manufacturing method of a semiconductor device includes the forming a first oxide over a substrate; depositing a first insulator over the first oxide; forming an opening reaching the first oxide in the first insulator; depositing a first oxide film in contact with the first oxide and the first insulator in the opening; depositing a first insulating film over the first oxide film by a PEALD method; depositing a first conductive film over the first insulating film; and removing part of the first oxide film, part of the first insulating film, and part of the first conductive film until a top surface of the first insulator is exposed to form a second oxide, a second insulator, and a first conductor. The deposition of the first insulating film is performed while the substrate is heated to higher than or equal to 300°.
1. A manufacturing method of a semiconductor device comprising a first conductor, first and second insulators, and first and second oxides, comprising:
forming the first oxide over a substrate;
depositing the first insulator over the first oxide;
forming an opening reaching the first oxide in the first insulator;
depositing a first oxide film in contact with the first oxide and the first insulator in the opening;
depositing a first insulating film over the first oxide film by a PEALD method;
depositing a first conductive film over the first insulating film; and
removing part of the first oxide film, part of the first insulating film, and part of the first conductive film until a top surface of the first insulator is exposed to form the second oxide, the second insulator, and the first conductor,
wherein the deposition of the first insulating film was performed while the substrate is heated to higher than or equal to 300° C., and
wherein a step of introducing a first gas containing silicon into a chamber and a step of introducing a second gas that contains oxygen radicals and does not contain hydrogen atoms into the chamber are included, and
wherein the first oxide, the first oxide film, and the first insulator are irradiated with a microwave before the first insulating film is deposited.
2. The manufacturing method of a semiconductor device according to claim 1 ,
wherein the first oxide, the first oxide film, and the first insulator are irradiated with a microwave in the step of introducing the second gas.
3. The manufacturing method of a semiconductor device according to claim 1 ,
wherein plasma treatment is performed on the first oxide, the first oxide film, and the first insulator in an atmosphere containing oxygen before the first insulating film is deposited.
4. The manufacturing method of a semiconductor device according to claim 1 ,
wherein after the second oxide, the second insulator, and the first conductor are formed, a third insulator is further deposited over the first insulator, the second oxide, the second insulator, and the first conductor, and
wherein a silicon nitride film is deposited over the third insulator by a PEALD method.
5. The manufacturing method of a semiconductor device according to claim 4 ,
wherein the first oxide, the second oxide, and the first insulator are irradiated with a microwave before the silicon nitride film is deposited.
6. A manufacturing method of a semiconductor device comprising a first conductor, first and second insulators, and first and second oxides, comprising:
forming the first oxide over a substrate;
depositing the first insulator over the first oxide;
forming an opening reaching the first oxide in the first insulator;
depositing a first oxide film in contact with the first oxide and the first insulator in the opening;
depositing a first insulating film over the first oxide film by a thermal ALD method;
depositing a first conductive film over the first insulating film; and
removing part of the first oxide film, part of the first insulating film, and part of the first conductive film until a top surface of the first insulator is exposed to form the second oxide, the second insulator, and the first conductor,
wherein the deposition of the first insulating film is performed while the substrate is heated to higher than or equal to 350° C., and
wherein a step of introducing a first gas containing silicon into a chamber and a step of introducing a second gas that contains at least one of ozone and oxygen and does not contain hydrogen atoms into the chamber are included, and
wherein the first oxide, the first oxide film, and the first insulator are irradiated with a microwave before the first insulating film is deposited.
7. The manufacturing method of a semiconductor device according to claim 6 ,
wherein plasma treatment is performed on the first oxide, the first oxide film, and the first insulator in an atmosphere containing oxygen before the first insulating film is deposited.
8. The manufacturing method of a semiconductor device according to claim 6 ,
wherein after the second oxide, the second insulator, and the first conductor are formed, a third insulator is further deposited over the first insulator, the second oxide, the second insulator, and the first conductor, and
wherein a silicon nitride film is deposited over the third insulator by a PEALD method.
9. The manufacturing method of a semiconductor device according to claim 8 ,
wherein the first oxide, the second oxide, and the first insulator are irradiated with a microwave before the silicon nitride film is deposited.