High resolution light valve detector for detecting x-ray
A detection system for an x-ray microscopy system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical microscope. This configuration will mitigate the loss of light in the optical system over the current scintillator-optical microscope-camera detection systems.
1. A detection system for an imaging system, comprising:
a photoconductive detector comprising a spatial light modulator and photoconductive detector layer forming a sandwich structure;
an optical microscope for reading out the photoconductive detector; and
a camera for reading out the spatial light modulator via the optical microscope, wherein a charge relaxation time of the photoconductive detector is less than a time interval between consecutive image frames captured by the camera.
2. A detection system as claimed in claim 1 , wherein the imaging system is an x-ray microscopy system.
3. A detection system as claimed in claim 1 , wherein the photoconductive detector detects x-rays.
4. A detection system as claimed in claim 1 , wherein the photoconductive detector detects charged particles of a charged particle beam.
5. The detection system as claimed in claim 1 , wherein the spatial light modulator is a liquid crystal light valve.
6. The detection system as claimed in claim 5 , wherein the photoconductive detector layer comprises bismuth, lead, thallium, mercury, tellurium, antimony, or tin.
7. The detection system as claimed in claim 1 , wherein the optical microscope is a polarization light microscope.
8. The detection system as claimed in claim 1 , wherein the optical microscope reads-out the photoconductive detector in transmission.
9. The detection system as claimed in claim 1 , wherein the optical microscope reads-out the photoconductive detector in reflection.
10. The detection system as claimed in claim 1 , wherein the optical microscope includes objective lens followed by a tube lens.
11. The detection system as claimed in claim 1 , wherein the photoconductive detector comprises a mirror layer.
12. An analysis system, comprising
a source for generating a beam;
an object stage system for holding and rotating an object in the beam; and
a detection system including:
a photoconductive detector comprising a spatial light modulator and photoconductive detector layer forming a sandwich structure,
an optical microscope for reading out the photoconductive detector; and
a camera for reading out the spatial light modulator via the optical microscope, wherein a charge relaxation time of the photoconductive detector is less than a time interval between consecutive image frames captured by the camera.
13. The analysis system as claimed in claim 12 , wherein the source is an x-ray source.
14. The analysis system as claimed in claim 12 , wherein the source in is a particle beam source.
15. The analysis system as claimed in claim 12 , wherein the spatial light modulator is a liquid crystal light valve and photoconductive detector layer.
16. The analysis system as claimed in claim 15 , wherein the photoconductive detector layer comprises bismuth, lead, thallium, mercury, tellurium, antimony, or tin.
17. The analysis system as claimed in claim 12 , wherein the optical microscope is a polarization light microscope.
18. The analysis system as claimed in claim 12 , wherein the optical microscope reads-out the photoconductive x-ray detector in transmission.
19. The analysis system as claimed in claim 12 , wherein the optical microscope reads-out the photoconductive x-ray detector in reflection.
20. The analysis system as claimed in claim 12 , wherein the optical microscope includes objective lens followed by a tube lens.