IP Library › Granted Patent US 11,776,837
Granted Patent B2
US 11,776,837 · App. 17/297,174 · Granted Oct 3, 2023

Adhesive agent composition, layered product and production method for layered product, and method for reducing thickness of semiconductor forming substrate

Inventors: Shunsuke Moriya (Toyama, JP); Kazuhiro Sawada (Toyama, JP); Tetsuya Shinjo (Toyama, JP)
Assignee: NISSAN CHEMICAL CORPORATION
H01L21/6835B32B37/12C09J7/401C09J183/04H01L21/6836B05D3/02C09J2203/326
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Quick Facts
Patent No.
US 11,776,837
App. No.
17/297,174
Granted
Oct 3, 2023
Kind
B2
Abstract

An adhesive composition for forming an adhesive layer that can bond a first substrate formed of a semiconductor-forming substrate to a second substrate formed of a support substrate in a peelable manner, the composition containing a component (A) which is cured through hydrosilylation and a peeling component (B) which contains a component containing an epoxy-modified polyorganosiloxane, wherein the component (A) contains a polysiloxane (A1) including a siloxane unit represented by SiO 2 (unit Q) and the like, and a platinum group metal catalyst (A2); and the polysiloxane (A1) contains a polyorganosiloxane (a1) including a siloxane unit represented by SiO 2 (unit Q′) and the like, and a polyorganosiloxane (a2) including a siloxane unit represented by SiO 2 (unit Q″) and the like, and having a functional group (Si—H) content of 5.0 mol/kg or greater.

Claims (26)

1. An adhesive composition for forming an adhesive layer that can bond a first substrate formed of a semiconductor-forming substrate to a second substrate formed of a support substrate in a peelable manner,

the composition comprising

a component (A) which is cured through hydrosilylation and

a peeling component (B) which contains a component containing an epoxy-modified polyorganosiloxane having an epoxy value of 0.1 to 5, wherein

the component (A) comprises

a polysiloxane (A1) having one or more units selected from the group consisting of a siloxane unit represented by SiO 2 (unit Q), a siloxane unit represented by R 1 R 2 R 3 SiO 1/2 (unit M), a siloxane unit represented by R 4 R 5 SiO 2/2 (unit D), and a siloxane unit represented by R 6 SiO 3/2 (unit T) (wherein each of R 1 to R 6 is a group or an atom bonded to a silicon atom and represents an alkyl group, an alkenyl group, or a hydrogen atom) and

a platinum group metal catalyst (A2); and

the polysiloxane (A1) comprises:

a polyorganosiloxane (a1) having one or more units selected from the group consisting of a siloxane unit represented by SiO 2 (unit Q′), a siloxane unit represented by R 1′ R 2′ R 3′ SiO 1/2 (unit M′), a siloxane unit represented by R 4′ R 5′ SiO 2/2 (unit D′), and a siloxane unit represented by R 6′ SiO 3/2 (unit T′), and at least one unit selected from the group consisting of unit M′, unit D′, and unit T′ (wherein each of R′ to R 6′ is a group bonded to a silicon atom and represents an alkyl group or an alkenyl group, and at least one of R′ to R 6′ is an alkenyl group), and

a polyorganosiloxane (a2) having one or more units selected from the group consisting of a siloxane unit represented by SiO 2 (unit Q″), a siloxane unit represented by R 1″ R 2″ R 3″ SiO 1/2 (unit M″), a siloxane unit represented by R 4″ R 5″ SiO 2/2 (unit D″), and a siloxane unit represented by R 6″ SiO 3/2 (unit T″), and at least one unit selected from the group consisting of unit M″, unit D″, and unit T″, and having a functional group (Si—H) content of 5.0 mol/kg or greater (wherein each of R 1″ to R 6″ is a group or an atom bonded to a silicon atom and represents an alkyl group or a hydrogen atom, and at least one of R 1″ to R 6″ is a hydrogen atom).

2. A laminate comprising

a first substrate formed of a semiconductor-forming substrate,

a second substrate formed of a support substrate, and

an adhesive layer which is provided between the first substrate and the second substrate and which bonds the two substrates in a peelable manner,

wherein the adhesive layer is a cured film formed by use of the adhesive composition as recited in claim 1 .

3. A method for producing a laminate, the method comprising:

applying the adhesive composition as recited in claim 1 onto a first substrate formed of a semiconductor-forming substrate or a second substrate formed of a support substrate, to thereby form an adhesive coating layer, and

adhering the first substrate to the second substrate by the mediation of the adhesive coating layer;

applying a load to the first substrate and the second substrate in a thickness direction, to thereby closely bind the first substrate, the adhesive layer, and the second substrate, while at least one of a heat treatment and a reduced pressure treatment is performed; and then

performing a post-heat treatment.

4. A method for thinning a semiconductor-forming substrate, the method comprising:

applying the adhesive composition as recited in claim 1 onto a first substrate formed of a semiconductor-forming substrate or a second substrate formed of a support substrate, to thereby form an adhesive coating layer,

adhering the first substrate to the second substrate by the mediation of the adhesive coating layer;

applying a load to the first substrate and the second substrate in a thickness direction, to thereby closely bind the first substrate, the adhesive layer, and the second substrate, while at least one of a heat treatment and a reduced pressure treatment is performed; and then

performing a post-heat treatment, to thereby form a laminate, and

performing a thinning treatment on the first substrate of the laminate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 26, 2021
From: MORIYA, SHUNSUKE; SAWADA, KAZUHIRO; SHINJO, TETSUYA
To: NISSAN CHEMICAL CORPORATION
Reel/Frame 056362/0152 →
Priority Claims (1)
JP 2018-222885 · Nov 28, 2018 · national
Continuity (1)
Related Publication 20220025236A1 · Jan 27, 2022
Cited By (2)
US 12,559,655 US 12,723,176