Semiconductor device having first heat spreader and second heat spreader and manufacturing method thereof
A semiconductor device includes a substrate, a package structure, a first heat spreader, and a second heat spreader. The package structure is disposed on the substrate. The first heat spreader is disposed on the substrate. The first heat spreader surrounds the package structure. The second heat spreader is disposed on the package structure. The second heat spreader is connected to the first heat spreader. A material of the first heat spreader is different from a material of the second heat spreader.
1. A semiconductor device, comprising:
a substrate;
a package structure disposed on the substrate;
a first heat spreader disposed on the substrate, wherein the first heat spreader surrounds the package structure, and the first heat spreader is spatially separated from the package structure; and
a second heat spreader disposed on the package structure, wherein the second heat spreader is connected to the first heat spreader, a material of the first heat spreader is different from a material of the second heat spreader, and the second heat spreader laterally surrounds sidewalls of the package structure.
2. The semiconductor device of claim 1 , wherein a coefficient of thermal expansion (CTE) and a Young's modulus of the first heat spreader are respectively different from a CTE and a Young's modulus of the second heat spreader.
3. The semiconductor device of claim 1 , wherein the second heat spreader is integrally formed, and the first heat spreader is in physical contact with the second heat spreader.
4. The semiconductor device of claim 1 , wherein one of the first heat spreader and the second heat spreader comprises protrusions and another one of the first heat spreader and the second heat spreader comprises recesses, and the protrusions are fitted into the recesses.
5. The semiconductor device of claim 1 , wherein the first heat spreader at least partially covers outer sidewalls of the second heat spreader, and the first heat spreader is attached to the substrate through an adhesive layer.
6. The semiconductor device of claim 1 , wherein the second heat spreader is attached to the package structure through a thermal interface material (TIM) layer.
7. The semiconductor device of claim 1 , wherein the package structure comprises:
an interposer;
at least one semiconductor die disposed on the interposer; and
an encapsulant disposed over the interposer to encapsulate the at least one semiconductor die.
8. A semiconductor device, comprising:
a substrate;
a lid structure disposed on the substrate, wherein the lid structure comprises:
a first heat spreader attached to the substrate, wherein the first heat spreader comprises a first body portion and recesses recessing from a top surface of the first body portion;
a second heat spreader, wherein the second heat spreader comprises a second body portion and protrusions protruding from a bottom surface of the second body portion, and the protrusions of the second heat spreader are engaged with the recesses of the first heat spreader; and
a package structure located between the substrate and the lid structure, wherein the first heat spreader is spatially separated from the package structure.
9. The semiconductor device of claim 8 , wherein each protrusion of the second heat spreader has substantially a same height.
10. The semiconductor device of claim 8 , wherein at least two of the protrusions of the second heat spreader have different heights.
11. The semiconductor device of claim 8 , wherein each recess of the first heat spreader has substantially a same depth.
12. The semiconductor device of claim 8 , wherein at least two of the recesses of the first heat spreader have different depths.
13. The semiconductor device of claim 8 , wherein a width of each protrusion of the second heat spreader is substantially the same as a width of the corresponding recess of the first heat spreader.
14. The semiconductor device of claim 13 , wherein a height of each protrusion of the second heat spreader is substantially the same as a depth of the corresponding recess of the first heat spreader.
15. The semiconductor device of claim 8 , wherein a coefficient of thermal expansion (CTE) and a Young's modulus of the first heat spreader are respectively different from a CTE and a Young's modulus of the second heat spreader.
16. The semiconductor device of claim 8 , wherein the package structure comprises:
an interposer;
at least one semiconductor die disposed on the interposer; and
an encapsulant disposed over the interposer to encapsulate the at least one semiconductor die.
17. A manufacturing method of a semiconductor device, comprising:
providing a substrate;
bonding a package structure to the substrate;
applying an adhesive layer onto the substrate;
applying a thermal interface material (TIM) layer onto the package structure;
engaging a first heat spreader and a second heat spreader to form a lid structure; and
attaching the lid structure to the substrate and the package structure through the adhesive layer and the TIM layer, wherein the first heat spreader is spatially separated from the package structure, and the second heat spreader laterally surrounds sidewalls of the package structure.
18. The method of claim 17 , wherein the second heat spreader is integrally formed, and a material of the first heat spreader is different from a material of the second heat spreader.
19. The method of claim 17 , wherein one of the first heat spreader and the second heat spreader comprises protrusions and another one of the first heat spreader and the second heat spreader comprises recesses, and engaging the first heat spreader and the second heat spreader comprises fitting the protrusions into the recesses.
20. The method of claim 17 , wherein the first heat spreader partially covers outer sidewalls of the second heat spreader, and the first heat spreader is attached to the substrate through the adhesive layer and the second heat spreader is attached to the package structure through the TIM layer.