Anisotropy reduction in coating of conductive films
Provided herein is a device for forming a conductive film. The device includes a deposition device and an air supply. The deposition device is configured to form a wet film having conductive nanostructures and a fluid carrier on a web. The web is moved in a first direction while forming the wet film. The air supply is disposed at a side of the web and configured to apply an air flow onto the wet film. The air flow is directed onto the wet film in a second direction perpendicular to the first direction to reorient a direction of some conductive nanostructures in the wet film to define reoriented conductive nanostructures.
1. A conductive film, comprising:
a plurality of conductive nanostructures, wherein:
at least some of the plurality of conductive nanostructures are reoriented,
the conductive film has a first dimension and a second dimension perpendicular to the first dimension,
both the first dimension and the second dimension are perpendicular to a normal of the conductive film,
the conductive film has an anisotropy, which is defined as a ratio (RTD/RMD) of a first sheet resistance (RMD) and a second sheet resistance (RTD),
the first sheet resistance (RMD) is measured at a given location along the first dimension and the second sheet resistance (RTD) is measured at the given location along the second dimension, and
the anisotropy is greater than 1 and less than 2 according to a reorientation of the at least some of the plurality of conductive nanostructures.
2. The conductive film of claim 1 , wherein the anisotropy is greater than 1 and less than 1.2.
3. The conductive film of claim 1 , wherein:
the conductive film has a plurality of anisotropies,
each of the plurality of anisotropies is defined as the ratio (RTD/RMD) of the first sheet resistance (RMD) and the second sheet resistance (RTD),
for each of the plurality of anisotropies, the first sheet resistance (RMD) is measured at a given location along the first dimension and the second sheet resistance (RTD) is measured at the given location along the second dimension,
the conductive film has a maximum anisotropy and a minimum anisotropy among the plurality of anisotropies, and
a difference between the maximum anisotropy and the minimum anisotropy is less than 25% of the minimum anisotropy according to the reorientation of the at least some of the plurality of conductive nanostructures.
4. The conductive film of claim 3 , wherein the difference between the maximum anisotropy and the minimum anisotropy is less than 10% of the minimum anisotropy.
5. The conductive film of claim 1 , wherein the plurality of conductive nanostructures have a hollow core.
6. The conductive film of claim 1 , wherein the plurality of conductive nanostructures have a solid core.
7. The conductive film of claim 1 , wherein the plurality of conductive nanostructures are isotropically-shaped.
8. The conductive film of claim 1 , wherein the plurality of conductive nanostructures are anisotropic ally-shaped.
9. The conductive film of claim 1 , wherein the plurality of conductive nanostructures are silver nanowires.