Logic circuit formed using unipolar transistor, and semiconductor device
A semiconductor device using unipolar transistors, in which high and low levels are expressed using high and low power supply potentials, is provided. The semiconductor device includes four transistors, two capacitors, two wirings, two input terminals, and an output terminal. A source or a drain of the first transistor and a source or a drain of the fourth transistor are electrically connected to the first wiring. A gate of the fourth transistor is electrically connected to the first input terminal, and a gate of the second transistor is electrically connected to the second input terminal. A source or a drain of the second transistor and a source or a drain of the third transistor are electrically connected to the second wiring. The first transistor, the second transistor, and the two capacitors are electrically connected to the output terminal.
1. A semiconductor device comprising:
a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, and a seventh transistor;
a first capacitor, a second capacitor, and a third capacitor;
a first wiring and a second wiring;
a first input terminal, a second input terminal, a third input terminal, and a fourth input terminal; and
an output terminal,
wherein one of a source and a drain of the sixth transistor is electrically connected to the first wiring,
wherein the other of the source and the drain of the sixth transistor is electrically connected to one of a source and a drain of the seventh transistor,
wherein the other of the source and the drain of the seventh transistor is electrically connected to one of a source and a drain of the third transistor, one of a source and a drain of the fourth transistor, one terminal of the third capacitor, and a gate of the fifth transistor,
wherein the other of the source and the drain of the third transistor and the other of the source and the drain of the fourth transistor are electrically connected to the second wiring,
wherein a gate of the sixth transistor is electrically connected to the second input terminal, one terminal of the second capacitor, and a gate of the first transistor,
wherein a gate of the seventh transistor is electrically connected to the first input terminal, one terminal of the first capacitor, and a gate of the second transistor,
wherein a gate of the third transistor is electrically connected to the third input terminal,
wherein a gate of the fourth transistor is electrically connected to the fourth input terminal,
wherein one of a source and a drain of the first transistor is electrically connected to the first wiring,
wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,
wherein the other of the source and the drain of the second transistor is electrically connected to the other terminal of the first capacitor, the other terminal of the second capacitor, the other terminal of the third capacitor, one of a source and a drain of the fifth transistor, and the output terminal, and
wherein the other of the source and the drain of the fifth transistor is electrically connected to the second wiring.
2. The semiconductor device according to claim 1 ,
wherein a first potential is supplied to the first wiring,
wherein a second potential is supplied to the second wiring,
wherein the second potential is higher than the first potential,
wherein a first signal is input to the first input terminal,
wherein a second signal is input to the second input terminal,
wherein a third signal is input to the third input terminal,
wherein a fourth signal is input to the fourth input terminal,
wherein the third signal is an inverted signal of the first signal, and
wherein the fourth signal is an inverted signal of the second signal.
3. The semiconductor device according to claim 1 ,
wherein the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, the sixth transistor, and the seventh transistor are each an n-channel transistor.
4. The semiconductor device according to claim 1 ,
wherein the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, the sixth transistor, and the seventh transistor each comprise a metal oxide in a channel formation region.
5. A semiconductor device comprising:
a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, and a seventh transistor;
a first capacitor, a second capacitor, and a third capacitor; and
a first wiring and a second wiring,
wherein one of a source and a drain of the sixth transistor is electrically connected to the first wiring,
wherein the other of the source and the drain of the sixth transistor is electrically connected to one of a source and a drain of the seventh transistor,
wherein the other of the source and the drain of the seventh transistor is electrically connected to one of a source and a drain of the third transistor, one of a source and a drain of the fourth transistor, one terminal of the third capacitor, and a gate of the fifth transistor,
wherein the other of the source and the drain of the third transistor and the other of the source and the drain of the fourth transistor are electrically connected to the second wiring,
wherein a gate of the sixth transistor is electrically connected to one terminal of the second capacitor and a gate of the first transistor,
wherein a gate of the seventh transistor is electrically connected to one terminal of the first capacitor and a gate of the second transistor,
wherein one of a source and a drain of the first transistor is electrically connected to the first wiring,
wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,
wherein the other of the source and the drain of the second transistor is electrically connected to the other terminal of the first capacitor, the other terminal of the second capacitor, the other terminal of the third capacitor, and one of a source and a drain of the fifth transistor, and
wherein the other of the source and the drain of the fifth transistor is electrically connected to the second wiring.
6. The semiconductor device according to claim 5 ,
wherein a first potential is supplied to the first wiring,
wherein a second potential is supplied to the second wiring, and
wherein the second potential is higher than the first potential.
7. The semiconductor device according to claim 5 ,
wherein the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, the sixth transistor, and the seventh transistor are each an n-channel transistor.
8. The semiconductor device according to claim 5 ,
wherein the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, the sixth transistor, and the seventh transistor each comprise a metal oxide in a channel formation region.