Bidirectional scan cells for single-path reversible scan chains
A circuit comprises a plurality of scan chains. The plurality of scan chains comprises bidirectional scan cells. Each of the bidirectional scan cells comprises two serial input-output ports serving as either a serial data input port or a serial data output port based on a control signal. Each of the plurality of scan chains is configured to perform a shift operation in either a first direction or a second direction based on the control signal. The first direction is opposite to the second direction.
1. A circuit, comprising:
a plurality of scan chains comprising bidirectional scan cells, each of the bidirectional scan cells comprising two serial input-output ports serving as either a serial data input port or a serial data output port based on a control signal, each of the plurality of scan chains configured to perform a shift operation in either a first direction or a second direction based on the control signal, the first direction being opposite to the second direction.
2. The circuit recited in claim 1 , wherein each of the bidirectional scan cells further comprises two tri-state buffers, outputs of the two tri-state buffers coupled to the two serial input-output ports of the each of the bidirectional scan cells, respectively, and the two tri-state buffers controlled by the control signal and inversion of the control signal, respectively.
3. The circuit recited in claim 2 , wherein the two tri-state buffers are in a demultiplexer.
4. The circuit recited in claim 2 , wherein each of the scan cells further comprises a multiplexer, two inputs of the multiplexer coupled to outputs of the two tri-state buffers, respectively.
5. The circuit recited in claim 2 , wherein each of the scan cells further comprises a conventional scan cell, a serial output of the conventional scan cell is coupled to inputs of the two tri-state buffers.
6. The circuit recited in claim 1 , wherein each of the scan cells further comprises a multiplexer and a demultiplexer, two outputs of the demultiplexer coupled to the two serial input-output ports, respectively, and two inputs of the multiplexer coupled to the two serial input-output ports, respectively.
7. The circuit recited in claim 1 , wherein each of the scan cells further comprises a first pair of tri-state buffers and a second pair of tri-state buffers controlled by the control signal and inversion of the control signal, respectively, an output of one tri-state buffer in the first pair of tri-state buffers coupled to one of the two serial input-output ports, an output of one tri-state buffer in the second pair of tri-state buffers coupled to another one of the two serial input-output ports.
8. One or more non-transitory computer-readable media storing computer-executable instructions for causing a computer to perform a method, the method comprising:
creating a plurality of scan chains in a circuit design for testing a chip fabricated according to the circuit design, the plurality of scan chains comprising:
bidirectional scan cells, each of the bidirectional scan cells comprising two serial input-output ports serving as either a serial data input port or a serial data output port based on a control signal, each of the plurality of scan chains configured to perform a shift operation in either a first direction or a second direction based on the control signal, the first direction being opposite to the second direction.
9. The one or more non-transitory computer-readable media recited in claim 8 , wherein each of the bidirectional scan cells further comprises two tri-state buffers, outputs of the two tri-state buffers coupled to the two serial input-output ports of the each of the bidirectional scan cells, respectively, and the two tri-state buffers controlled by the control signal and inversion of the control signal, respectively.
10. The one or more non-transitory computer-readable media recited in claim 9 , wherein the two tri-state buffers are in a demultiplexer.
11. The one or more non-transitory computer-readable media recited in claim 9 , wherein each of the scan cells further comprises a multiplexer, two inputs of the multiplexer coupled to outputs of the two tri-state buffers, respectively.
12. The one or more non-transitory computer-readable media recited in claim 9 , wherein each of the scan cells further comprises a conventional scan cell, a serial output of the conventional scan cell is coupled to inputs of the two tri-state buffers.
13. The one or more non-transitory computer-readable media recited in claim 8 , wherein each of the scan cells further comprises a multiplexer and a demultiplexer, two outputs of the demultiplexer coupled to the two serial input-output ports, respectively, and two inputs of the multiplexer coupled to the two serial input-output ports, respectively.
14. The one or more non-transitory computer-readable media recited in claim 8 , wherein each of the scan cells further comprises a first pair of tri-state buffers and a second pair of tri-state buffers controlled by the control signal and inversion of the control signal, respectively, an output of one tri-state buffer in the first pair of tri-state buffers coupled to one of the two serial input-output ports, an output of one tri-state buffer in the second pair of tri-state buffers coupled to another one of the two serial input-output ports.
15. A bidirectional scan cell, comprising:
two serial input-output ports serving as either a serial data input port or a serial data output port based on a control signal;
two tri-state buffers, outputs of the two tri-state buffers coupled to the two serial input-output ports, respectively, the two tri-state buffers controlled by the control signal and inversion of the control signal, respectively; and
a state element, an output of the state element coupled to inputs of the two tri-state buffers.
16. The bidirectional scan cell in claim 15 , wherein the two tri-state buffers are in a demultiplexer.
17. The bidirectional scan cell in claim 15 , further comprising:
a multiplexer, two inputs of the multiplexer coupled to outputs of the two tri-state buffers, respectively.
18. The bidirectional scan cell in claim 15 , further comprising:
two additional tri-state buffers, inputs of the two additional tri-state buffers coupled to the two serial input-output ports, respectively, the additional two tri-state buffers controlled by the control signal and inversion of the control signal, respectively.
19. The bidirectional scan cell in claim 15 , wherein the state element is a flip-flop.