IP Library › Granted Patent US 12,199,218
Granted Patent B2
US 12,199,218 · App. 17/428,721 · Granted Jan 14, 2025

Optoelectronic semiconductor component and method for producing an optoelectronic semiconductor component

Inventors: Ee Lian Lee (Penang, MY); Boon Liang Yap (Penang, MY); Prakash Rajah (Penang, MY)
Assignee: OSRAM Opto Semiconductors GmbH
H01L33/505H01L33/54H01L33/60H01L2933/0041H01L2933/0058
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,199,218
App. No.
17/428,721
Granted
Jan 14, 2025
Kind
B2
Abstract

In an embodiment an optoelectronic semiconductor component includes an optoelectronic semiconductor chip having a radiation exit surface and side surfaces running transversely with respect to the radiation exit surface, the optoelectronic semiconductor chip configured to emit primary radiation through the radiation exit surface, a conversion element arranged on the radiation exit surface, the conversion element configured to convert at least part of the primary radiation into secondary radiation and including a stack of at least two conversion layers and a reflective element laterally surrounding the optoelectronic semiconductor chip, wherein a lateral extent of the conversion layers decreases from a layer which is closest to the radiation exit surface to a layer which is most distant from the radiation exit surface, wherein the conversion element includes a part laterally extending beyond the radiation exit surface and being concavely curved, wherein the conversion element is partly arranged on the reflective element, and wherein the conversion element is arranged on a concavely curved surface of the reflective element.

Claims (36)

1. An optoelectronic semiconductor component comprising:

an optoelectronic semiconductor chip having a radiation exit surface and side surfaces running transversely with respect to the radiation exit surface, the optoelectronic semiconductor chip configured to emit primary radiation through the radiation exit surface;

a conversion element arranged on the radiation exit surface, the conversion element configured to convert at least part of the primary radiation into secondary radiation and comprising a stack of at least two conversion layers; and

a reflective element laterally surrounding the optoelectronic semiconductor chip,

wherein a lateral extent of the conversion layers decreases from a layer which is closest to the radiation exit surface to a layer which is most distant from the radiation exit surface,

wherein the conversion element comprises a part, which laterally extends beyond the radiation exit surface, is concavely curved, and comprises more than one of the at least two conversion layers,

wherein the conversion element is partly arranged on the reflective element,

wherein the conversion element is arranged on a concavely curved surface of the reflective element, and

wherein the optoelectronic semiconductor component is configured to emit mixed-colored radiation.

2. The optoelectronic semiconductor component according to claim 1 , wherein the conversion layers are formed from the same conversion material.

3. The optoelectronic semiconductor component according to claim 1 , wherein the conversion layers have a rectangular shape in plan view of the optoelectronic semiconductor component.

4. The optoelectronic semiconductor component according to claim 1 , wherein the conversion layers are symmetrically arranged with respect to a main axis of the radiation exit surface.

5. The optoelectronic semiconductor component according to claim 1 , further comprising a carrier on which the optoelectronic semiconductor chip is arranged, wherein the carrier comprises a first and a second contact structure, and wherein the reflective element fills a respective interspace between the optoelectronic semiconductor chip and the first and second contact structures.

6. The optoelectronic semiconductor component according to claim 1 , wherein each of the conversion layers has a thickness of 10 μm to 15 μm.

7. The optoelectronic semiconductor component according to claim 1 , further comprising a dome-like encapsulant covering the conversion element.

8. A method for producing an optoelectronic semiconductor component, the method comprising:

providing an optoelectronic semiconductor chip having a radiation exit surface and at least one side surface running transversely with respect to the radiation exit surface, the optoelectronic semiconductor chip configured to emit primary radiation through the radiation exit surface;

forming a reflective element to laterally surround the optoelectronic semiconductor chip; and

applying a conversion material layer after layer to the radiation exit surface for forming a conversion element comprising at least two conversion layers,

wherein a lateral extent of the conversion layers decreases from a layer which is closest to the radiation exit surface to a layer which is most distant from the radiation exit surface,

wherein the conversion element comprises a part, which laterally extends beyond the radiation exit surface, is concavely curved, and comprises more than one of the at least two conversion layers,

wherein the conversion element is partly arranged on the reflective element, and

wherein the conversion element is arranged on a concavely curved surface of the reflective element.

9. The method according to claim 8 , wherein applying the conversion material layer comprises spray coating the conversion material layer.

10. The method according to claim 8 , wherein the conversion layers are produced by masks having different sizes of mask openings.

11. The method according to claim 8 , wherein the reflective element is formed from a reflective material.

12. An optoelectronic semiconductor component comprising:

an optoelectronic semiconductor chip having a radiation exit surface and side surfaces running transversely with respect to the radiation exit surface, the optoelectronic semiconductor chip configured to emit primary radiation through the radiation exit surface;

a conversion element arranged on the radiation exit surface, the conversion element configured to convert at least part of the primary radiation into secondary radiation and comprising a stack of at least two conversion layers; and

a reflective element laterally surrounding the optoelectronic semiconductor chip,

wherein a lateral extent of the conversion layers decreases from a layer which is closest to the radiation exit surface to a layer which is most distant from the radiation exit surface,

wherein the conversion element comprises a part, which laterally extends beyond the radiation exit surface, is concavely curved, and comprises more than one of the at least two conversion layers,

wherein the conversion element is partly arranged on the reflective element,

wherein the conversion element is arranged on a concavely curved surface of the reflective element,

wherein each of the conversion layers of the conversion element is continuous and at least one of the conversion layers of the conversion element comprises a lateral extent smaller than a lateral extent of the radiation exit surface of the optoelectronic semiconductor chip, and

wherein the optoelectronic semiconductor component is configured to emit mixed-colored radiation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 5, 2021
From: LEE, EE LIAN; YAP, BOON LIANG; RAJAH, PRAKASH
To: OSRAM OPTO SEMICONDUCTORS GMBH
Reel/Frame 057090/0410 →
Continuity (1)
Related Publication 20220131052A1 · Apr 28, 2022
References Cited (9)
US 10043953B2 · Kim · 2018 [cited by examiner]
US 20100237775A1 · Chao · 2010 [cited by applicant]
US 20110018016A1 · Bierhuizen · 2011 [cited by examiner]
US 20110316017A1 · Liu et al. · 2011 [cited by applicant]
US 20130062648A1 · Nishimura · 2013 [cited by applicant]
US 20140071689A1 · Yoon · 2014 [cited by examiner]
US 20190207071A1 · Grötsch · 2019 [cited by examiner]
EP 3511981A1 · 2019 [cited by applicant]
WO 2018162076A1 · 2018 [cited by applicant]