IP Library Granted Patent US 12,220,784
Granted Patent B2
US 12,220,784 · App. 17/500,630 · Granted Feb 11, 2025

Chemical mechanical polishing pad and preparation thereof

Inventors: Bainian Qian (Newark, DE); Robert M. Blomquist (River Edge, NJ); Lyla M. El-Sayed (Boonton, NJ); Michael E. Mills (Bear, DE); Kancharla-Arun Reddy (Wilmington, DE); Bradley K. Taylor (West Chester, PA); Shijing Xia (Hockessin, DE)
Assignee: Rohm and Haas Electronic Materials CMP Holdings, Inc.
B24B37/22B24B37/24B24B37/26B24D3/28H01L21/30625
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Quick Facts
Patent No.
US 12,220,784
App. No.
17/500,630
Granted
Feb 11, 2025
Kind
B2
Abstract

The present invention concerns a chemical mechanical polishing pad having a polishing layer. The polishing layer contains an extruded sheet. The extruded sheet is a photopolymerizable composition containing a block copolymer, a UV curable acrylate, and a photoinitiator.

Claims (8)

1. A chemical mechanical polishing pad suitable for polishing at least one of a semiconductor substrate, an optical substrate and a magnetic substrate, the polishing pad having a polishing layer, the polishing layer being cured from an extruded sheet, the extruded sheet comprising a photopolymerizable composition comprising a styrenic block copolymer, a UV curable acrylate, polybutadiene oil and a photoinitiator, wherein said styrenic block copolymer is one or more members selected from the group consisting of a styrene-butadiene styrene (SBS) block copolymer, a styrene-isoprene-styrene (SIS) block copolymer, a styrene-ethylene-butene-styrene (SEBS) block copolymer a styrene-ethylene-propylene-styrene (SEPS) block copolymer, and mixtures thereof and the styrenic block copolymer is present at an amount of greater than 50 wt %, based on the total weight of the extruded sheet, and wherein upon UV curing, the extruded sheet having a Shore D hardness in the range of 40 to 70.

2. The chemical mechanical polishing pad of claim 1 , wherein said photopolymerizable composition further comprising an oil.

3. The chemical mechanical polishing pad of claim 1 , wherein said styrenic block copolymer is a triblock copolymer.

4. The chemical mechanical polishing pad of claim 1 , wherein said styrenic block copolymer is present at an amount of greater than 65%.

5. The chemical mechanical polishing pad of claim 1 , wherein said acrylate is one or more members selected from the group consisting of 1,3-butylene glycol diacrylate, 1,4-butanediol diacrylate, 1,4-butanediol dimethacrylate, 1,6-hexanediol diacrylate, and mixtures thereof.

6. The chemical mechanical polishing pad of claim 1 , wherein the extruded sheet after UV curing having a Shore D hardness in the range of 45 to 55.

7. The chemical mechanical polishing pad of claim 1 , wherein said photopolymerizable composition does not contain any organic solvent.

8. The chemical mechanical polishing pad of claim 1 , wherein said photopolymerizable composition further comprising a plasticizer.

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC.
To: DUPONT ELECTRONIC MATERIALS HOLDING, INC.
Reel/Frame 069274/0160 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2022
From: QIAN, BAINIAN; BLOMQUIST, ROBERT M.; EL-SAYED, LYLA M.; MILLS, MICHAEL E.; REDDY, KANCHARLA-ARUN; TAYLOR, BRADLEY K.; XIA, SHIJING
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.; DUPONT ELECTRONICS, INC.
Reel/Frame 058751/0219 →
Continuity (1)
Related Publication 20230112228A1 · Apr 13, 2023
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