IP Library › Granted Patent US 12,388,059
Granted Patent B2
US 12,388,059 · App. 17/531,133 · Granted Aug 12, 2025

Chip package structure and chip packaging method

Inventors: Tonglong Zhang (Shenzhen, CN); Xiaodong Zhang (Shenzhen, CN); Yong Guan (Shanghai, CN); Heng Li (Shanghai, CN)
Assignee: HUAWEI TECHNOLOGIES CO., LTD.
H01L25/105H01L21/568H01L23/29H01L23/5386H01L24/16H01L24/73H01L25/50H01L2224/16145H01L2224/16227H01L2224/73204
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,388,059
App. No.
17/531,133
Granted
Aug 12, 2025
Kind
B2
Abstract

A chip package structure includes a first chip, a second chip, and a carrier board. The first chip is disposed between the second chip and the carrier board. An active layer of the first chip is opposite to an active layer of the second chip. A first interconnection structure is disposed between the first chip and the second chip and is configured to couple the active layer of the first chip to the active layer of the second chip. A first conductor pillar is disposed in the first chip. One end of the first conductor pillar is coupled to the active layer of the first chip, and the other end of the first conductor passes through the first chip to be coupled to a circuit in the carrier board.

Claims (55)

1. A chip package structure comprising:

a carrier board comprising a first circuit;

a second chip comprising a second active layer;

a first chip disposed between the second chip and the carrier board and comprising a first active layer, wherein the first active layer is opposite to the second active layer;

a first interconnection structure disposed between the first chip and the second chip and configured to directly couple the first active layer to the second active layer, wherein the first interconnection structure is formed on a first surface of the first active layer or the second active layer;

a first conductor pillar disposed in the first chip and comprising:

a first end coupled to the first active layer; and

a second end passing through the first chip to couple to the first circuit; a second conductor pillar coupled to the second active layer and the first circuit; and

a dielectric insulating layer disposed on a second surface that is of the first chip and that is facing away from the second chip.

2. The chip package structure of claim 1 , wherein the second conductor pillar comprises:

a third end coupled to the second active layer; and

a fourth end coupled to the first circuit.

3. The chip package structure of claim 1 , wherein the first conductor pillar passes through the dielectric insulating layer.

4. The chip package structure of claim 1 , further comprising a plastic packaging layer disposed between the carrier board and the second chip, wherein the first conductor pillar passes through the plastic packaging layer, and wherein the second conductor pillar passes through the plastic packaging layer.

5. The chip package structure of claim 1 , wherein an end face that is of the first conductor pillar and that is facing away from the second chip and an end face that is of the second conductor pillar and that is facing away from the second chip are flush with each other.

6. The chip package structure of claim 1 , wherein the first interconnection structure comprises at least one solder ball, at least one metal bump, or at least one metal pillar.

7. The chip package structure of claim 1 , further comprising:

a second interconnection structure;

a first redistribution layer disposed on a surface that is of the second chip and that is facing away from the first chip, wherein the first redistribution layer comprises a second circuit;

a third chip disposed on a surface that is of the first redistribution layer and that is facing away from the first chip, wherein the third chip is coupled to the first redistribution layer using the second interconnection structure; and

a third conductor pillar comprising:

a third end coupled to the first circuit; and

a fourth end coupled to the second circuit.

8. The chip package structure of claim 7 , wherein an end face that is of the first conductor pillar and that is facing away from the second chip, an end face that is of the second conductor pillar and that is facing away from the second chip, and an end face of the third conductor pillar are flush with each other.

9. The chip package structure of claim 1 , further comprising a third interconnection structure disposed on a surface that is of the carrier board and that is facing away from the first chip, wherein the third interconnection structure is configured to couple the first circuit to a second circuit in a printed circuit board (PCB).

10. An integrated circuit comprising:

a printed circuit board (PCB); and

a chip package structure comprising:

a carrier board coupled to the PCB and comprising a first circuit;

a second chip comprising a second active layer;

a first chip disposed between the second chip and the carrier board and comprising a first active layer, wherein the first active layer is opposite to the second active layer;

a first interconnection structure disposed between the first chip and the second chip and configured to directly couple the first active layer to the second active layer, wherein the first interconnection structure is formed on a first surface of the first active layer or the second active layer;

a first conductor pillar disposed in the first chip and comprising:

a first end coupled to the first active layer; and

a second end passing through the first chip to couple to the first circuit;

a second conductor pillar coupled to the second active layer and the first circuit; and

a dielectric insulating layer disposed on a second surface that is of the first chip and that is facing away from the second chip.

11. The integrated circuit of claim 10 , wherein the second conductor pillar comprises:

a third end coupled to the second active layer; and

a fourth end coupled to the first circuit.

12. The integrated circuit of claim 10 , wherein the first conductor pillar passes through the dielectric insulating layer.

13. The integrated circuit of claim 10 , wherein the chip package structure further comprises a plastic packaging layer disposed between the carrier board and the second chip, wherein the first conductor pillar passes through the plastic packaging layer, and wherein the second conductor pillar passes through the plastic packaging layer.

14. The integrated circuit of claim 10 , wherein an end face that is of the first conductor pillar and that is facing away from the second chip and an end face that is of the second conductor pillar and that is facing away from the second chip are flush with each other.

15. The integrated circuit of claim 10 , wherein the first interconnection structure comprises a solder ball.

16. The integrated circuit of claim 10 , wherein the first interconnection structure comprises a metal bump.

17. The integrated circuit of claim 10 , wherein the first interconnection structure comprises one metal pillar.

18. The integrated circuit of claim 10 , wherein the chip package structure further comprises:

a second interconnection structure;

a first redistribution layer disposed on a surface that is of the second chip and that is facing away from the first chip, wherein the first redistribution layer comprises a second circuit;

a third chip disposed on a surface that is of the first redistribution layer and that is facing away from the first chip, wherein the third chip is coupled to the first redistribution layer using the second interconnection structure; and

a third conductor pillar comprising:

a third end coupled to the first circuit; and

a fourth end coupled to the second circuit.

19. The integrated circuit of claim 18 , wherein an end face that is of the first conductor pillar and that is facing away from the second chip, an end face that is of the second conductor pillar and that is facing away from the second chip, and an end face of the third conductor pillar are flush with each other.

20. The integrated circuit of claim 10 , wherein the chip package structure further comprises a third interconnection structure disposed on a surface that is of the carrier board and that is facing away from the first chip, and wherein the third interconnection structure is configured to couple the first circuit to a second circuit in the PCB.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2022
From: ZHANG, TONGLONG; ZHANG, XIAODONG; GUAN, YONG; LI, HENG
To: HUAWEI TECHNOLOGIES CO., LTD.
Reel/Frame 058617/0364 →
Continuity (2)
Continuation PCTCN2019087659 · May 20, 2019
Related Publication 20220077123A1 · Mar 10, 2022
References Cited (22)
US 20110068427A1 · Paek et al. · 2011 [cited by applicant]
US 20110285007A1 · Chi et al. · 2011 [cited by applicant]
US 20130203215A1 · Hung et al. · 2013 [cited by applicant]
US 20130241057A1 · Yu et al. · 2013 [cited by applicant]
US 20150001685A1 · Chung et al. · 2015 [cited by applicant]
US 20170005027A1 · Yu et al. · 2017 [cited by applicant]
US 20170207197A1 · Yu et al. · 2017 [cited by applicant]
US 20170287874A1 · Fang · 2017 [cited by examiner]
US 20170365580A1 · Shih et al. · 2017 [cited by applicant]
US 20180076179A1 · Hsu et al. · 2018 [cited by applicant]
US 20190035767A1 · Yu et al. · 2019 [cited by applicant]
CN 2636411Y · 2004 [cited by applicant]
CN 103890940A · 2014 [cited by applicant]
CN 104143526A · 2014 [cited by applicant]
CN 104253056A · 2014 [cited by applicant]
CN 105374793A · 2016 [cited by applicant]
CN 107731761A · 2018 [cited by applicant]
CN 107808878A · 2018 [cited by applicant]
CN 109309074A · 2019 [cited by applicant]
DE 102018116750A1 · 2019 [cited by applicant]
DE 102018102086A1 · 2019 [cited by applicant]
EP 3007225A1 · 2016 [cited by applicant]