Infra-red spectroscopy system
A sample slide ( 100 ) for use in a spectrometer ( 501 ), wherein the sample slide comprises a plurality of sample-receiving portions ( 111 - 114 ) provided on a sample side ( 115 ) of the slide, and a plurality of beam-receiving portions ( 121 - 124 ) provided on a beam-receiving side ( 125 ) of the slide, each beam-receiving portion being arranged opposite a respective sample-receiving portion, and wherein each beam-receiving portion is configured to act as an internal reflection element (IRE). A device ( 300 ) for use with a spectrometer ( 501 ) comprises a stage ( 330 ) configured to receive a sample slide ( 100 ); and a moving mechanism ( 360 ) configured to move the sample slide relative to a sample-measuring location ( 320 ) of the device. Associated methods for preparing a sample and measuring a sample are also disclosed.
1. A slide, comprising:
a) a ample-receiving portion provided on a sample side of a slide;
b) a beam-receiving portion provided on a beam side of said slide, said beam-receiving portion being arranged opposite said sample-receiving portion, wherein said beam-receiving portion comprises an internal reflection element (IRE); and
c) a thickness between said beam-receiving portions and said opposite sample-receiving portion selected from the group consisting of 380 μm and 675 μm.
2. The slide according to claim 1 , wherein said sample-receiving portion comprises a recessed portion surrounded by a raised portion.
3. The slide according to claim 1 , wherein said sample-receiving portion is configured to receive or support a dry sample.
4. The slide according to claim 1 , wherein said internal reflection element comprises adjacent grooves that are aligned or parallel and adjacent prisms that are aligned or parallel.
5. The slide according to claim 4 , wherein each of said adjacent groove has a width in the range of 50-500 μm.
6. The slide according to claim 1 , wherein each of said adjacent groove are spaced apart in the range of 0-200 μm.
7. The slide according to claim 1 , wherein said slide further comprises silicon.
8. The slide according to claim 1 , further comprising a slide holder, wherein said slide is on, within, or attached to said slide holder.
9. The slide of claim 1 , wherein said slide is configured to interface with a FTIR spectrometer.
10. The slide of claim 1 , wherein said slide is configured to interface with an ATR-FTIR spectrometer.
11. The slide of claim 1 , wherein said internal reflection element comprises an infra-red transmissible material.
12. The slide of claim 11 , wherein said infra-red transmissible material is selected from the group consisting of diamond, germanium, zinc selenide and silicon.
13. A method of preparing a sample for IR spectral analysis, the method comprising:
drying one or more samples on a slide at a temperature of approximately 30-36° C. and/or under a gas flow rate of at least 50 m 3 /h, wherein said slide comprises:
a) a sample-receiving portion provided on a sample side of said slide;
b) a beam-receiving portion provided on a beam side of said slide, said beam-receiving portion, wherein said beam-receiving portion comprises an internal reflection element (IRE), and
c) a thickness between said beam-receiving portion and said opposite sample-receiving portion selected from the group consisting of 380 μm and 675 μm.
14. The method of claim 13 , wherein said temperature ranges between 34.5 to 35.5° C.
15. The method of claim 13 , wherein said gas flow rate is at least 90 m 3 /h.
16. The method of claim 13 , wherein said internal reflection element comprises an infra-red transmissible material.
17. The method of claim 16 , wherein said infra-red transmissible material is selected from the group consisting of diamond, germanium, zinc selenide and silicon.