High electron mobility transistor and method for fabricating the same
A method for fabricating high electron mobility transistor (HEMT) includes the steps of: forming a buffer layer on a substrate; forming a barrier layer on the buffer layer; forming a hard mask on the barrier layer; performing an implantation process through the hard mask to form a doped region in the barrier layer and the buffer layer; removing the hard mask and the barrier layer to form a first trench; forming a gate dielectric layer on the hard mask and into the first trench; forming a gate electrode on the gate dielectric layer; and forming a source electrode and a drain electrode adjacent to two sides of the gate electrode.
1. A method for fabricating high electron mobility transistor (HEMT), comprising:
forming a buffer layer on a substrate;
forming a barrier layer on the buffer layer;
forming a hard mask on the barrier layer;
performing an ion implantation process through the hard mask to form a doped region in the barrier layer and the buffer layer;
removing the hard mask, the doped region, and the barrier layer to form a first trench, wherein a thickness of the doped region in the barrier layer is less than a thickness of the doped region in the buffer layer;
forming a gate dielectric layer on the hard mask and into the first trench; and
forming a gate electrode on the gate dielectric layer.
2. The method of claim 1 , further comprising:
forming a source electrode and a drain electrode adjacent to two sides of the gate electrode.
3. The method of claim 2 , further comprising:
removing the gate dielectric layer, the hard mask, and the barrier layer to form a second trench and a third trench adjacent to two sides of the gate electrode; and
forming the source electrode in the second trench and the drain electrode in the third trench.
4. The method of claim 1 , wherein the buffer layer comprises a group III-V semiconductor.
5. The method of claim 4 , wherein the buffer layer comprises gallium nitride (GaN).
6. The method of claim 1 , wherein the barrier layer comprises Al x Ga 1-x N.
7. The method of claim 1 , wherein the doped region comprises fluorine.
8. The method of claim 7 , wherein a concentration of fluorine decreases from the barrier layer to the buffer layer.
9. A method for fabricating high electron mobility transistor (HEMT), comprising:
forming a buffer layer on a substrate;
forming a barrier layer on the buffer layer;
forming a hard mask on the barrier layer;
performing an ion implantation process through the hard mask to form a doped region in the barrier layer and the buffer layer;
removing the hard mask, the doped region, and the barrier layer to form a first trench, wherein a bottom surface of the first trench is even with a bottom surface of the barrier layer;
forming a gate dielectric layer on the hard mask and into the first trench; and
forming a gate electrode on the gate dielectric layer.