IP Library Granted Patent US 12,310,145
Granted Patent B2
US 12,310,145 · App. 17/582,263 · Granted May 20, 2025

Image display device manufacturing method and image display device

Inventor: Hajime Akimoto (Anan, JP)
Assignee: NICHIA CORPORATION
H10H20/01335H10H20/856H10H20/857H10H20/0361H10H20/0363H10H20/0364
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Quick Facts
Patent No.
US 12,310,145
App. No.
17/582,263
Filed
Jan 24, 2022
Granted
May 20, 2025
Kind
B2
Art Unit
2897
USPC
257/618
Abstract

A method for manufacturing an image display device includes: providing a second substrate that includes a first substrate, and a semiconductor layer grown on the first substrate, the semiconductor layer including a light-emitting layer; providing a third substrate including: a light-transmitting substrate, a circuit element formed on the light-transmitting substrate, a wiring layer connectable to the circuit element, and a first insulating film covering the circuit element and the wiring layer; bonding the semiconductor layer to the third substrate; forming a light-emitting element from the semiconductor layer; forming a second insulating film covering the light-emitting element; forming a via extending through the first and second insulating films; and electrically connecting the light-emitting element and the circuit element by the via. The wiring layer includes a light-reflective part. The light-emitting element is located on the light-reflective part.

Claims (39)

1. A method for manufacturing an image display device, the method comprising:

providing a second substrate that comprises a first substrate, and a semiconductor layer grown on the first substrate, the semiconductor layer comprising a light-emitting layer;

providing a third substrate comprising:

a light-transmitting substrate,

a circuit element formed on the light-transmitting substrate,

a wiring layer connectable to the circuit element, and

a first insulating film covering the circuit element and the wiring layer;

bonding the semiconductor layer to the third substrate;

forming a light-emitting element from the semiconductor layer;

forming a second insulating film covering the light-emitting element;

forming a via extending through the first and second insulating films; and

electrically connecting the light-emitting element and the circuit element by the via; wherein:

the wiring layer comprises a light-reflective part;

the light-emitting element is located on the light-reflective part such that a portion of the first insulating film is located between the light emitting element and the light-reflective part; and

in a plan view, an outer perimeter of the light-emitting element, when projected onto the light-reflective part, is located within an outer perimeter of the light-reflective part.

2. The method according to claim 1 , wherein:

the step of providing the third substrate comprises:

providing a mask on the light-transmitting substrate, wherein the mask has an opening at a location at which the light-reflective part is formed, and performing isotropic etching, and

subsequently forming the wiring layer.

3. The method according to claim 1 , wherein:

the third substrate further comprises a fourth substrate located between the light-transmitting substrate and the circuit element;

the third substrate is flexible; and

the method further comprises, after the step of bonding the semiconductor layer to the third substrate, removing the light-transmitting substrate.

4. The method according to claim 3 , wherein:

the light-transmitting substrate is a glass substrate.

5. The method according to claim 1 , further comprising:

before the step of bonding the semiconductor layer to the third substrate, removing the first substrate.

6. The method according to claim 1 , further comprising:

after the step of bonding the semiconductor layer to the third substrate, removing the first substrate.

7. The method according to claim 1 , further comprising:

exposing, from under the second insulating film, a light-emitting surface of the light-emitting element opposite to a surface of the light-emitting element at the first insulating film side.

8. The method according to claim 7 , further comprising:

forming a light-transmitting electrode at the exposed light-emitting surface.

9. The method according to claim 1 , wherein:

the first substrate comprises silicon or sapphire.

10. The method according to claim 1 , wherein:

the semiconductor layer comprises a gallium nitride compound semiconductor.

11. The method according to claim 1 , further comprising:

forming a wavelength conversion member on the light-emitting element.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2022
From: AKIMOTO, HAJIME
To: NICHIA CORPORATION
Reel/Frame 058740/0995 →
Priority Claims (1)
JP 2019-136949 · Jul 25, 2019 · national
Continuity (2)
Continuation PCTJP2020026658 · Jul 8, 2020
Related Publication 20220149228A1 · May 12, 2022
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