Voltage waveform generator for plasma processing apparatuses
View Patent ↗Methods and devices for generating a voltage waveform at an output may include providing four DC voltages of different magnitudes. The first (V 1 ) magnitude is higher than the third (V 3 ) and fourth (V 4 ) magnitude. The fourth DC voltage is coupled to the output followed by coupling the first DC voltage to the output, to bring an output voltage (V P ) at the output to a high level. The first DC voltage is decoupled from the output, followed by coupling the third DC voltage to the output, to obtain a drop of the output voltage (V P ). A ground potential (V 0 ) is coupled to the output following coupling the third DC voltage and the second DC current (I 2 ) is coupled to the output following coupling the ground potential, wherein the second DC current ramps down the output voltage (V P ).
1. A method of generating a voltage waveform at an output, the method comprising:
providing a first DC voltage having a first magnitude (V 1 ), a second DC current (I) having a second magnitude, a third DC voltage having a third magnitude (V 3 ), and a fourth DC voltage having a fourth magnitude (V 4 ), wherein the first (V 1 ) magnitude is higher than the third (V 3 ) and the fourth (V 4 ) magnitude,
coupling the fourth DC voltage to the output followed by coupling the first DC voltage to the output, to bring an output voltage (V p ) at the output to a high level,
decoupling the first DC voltage from the output, followed by coupling the third DC voltage to the output, to obtain a drop of the output voltage (V p ),
coupling a ground potential (V 0 ) to the output following coupling the third DC voltage, and
coupling the second DC current (I 2 ) to the output following coupling the ground potential, wherein the second DC current ramps down the output voltage (V p ).
2. The method of claim 1 , wherein the first (V 1 ), third (V 3 ) and fourth (V 4 ) magnitudes are constant during coupling of the respective DC voltage to the output.
3. The method of claim 1 , wherein one or both of: the third magnitude (V 3 ) and the fourth magnitude (V 4 ) are higher than the ground potential (V 0 ).
4. The method of claim 1 , wherein the third magnitude (V 3 ) and the fourth magnitude (V 4 ) are different.
5. The method of to claim 1 , further comprising coupling the output to a processing platform supporting a substrate which is plasma processed, wherein the voltage waveform causes a positive voltage peak followed by a negative voltage at an exposed surface of the substrate.
6. The method of claim 5 , further comprising one or a combination of: selecting a commutation time (T COMMUTATION ) between the step of coupling the fourth DC voltage and the step of coupling the first DC voltage and selecting a commutation time between the step of coupling the third DC voltage and the step of coupling the ground potential (V 0 ) to obtain a zero current between the output and the processing platform at an instant (T SW1 ) of coupling the first DC voltage and an instant of coupling the ground potential (V 0 ) respectively.
7. The method of claim 5 , further comprising one or a combination of: selecting a commutation time (T COMMUTATION ) between the step of coupling the fourth DC voltage and the step of coupling the first DC voltage and selecting a commutation time between the step of coupling the third DC voltage and the step of coupling the ground potential (V 0 ),
wherein the commutation time is representative of 0 . 5 /f 0 , wherein f 0 is a natural frequency of an electrical system of a plasma processing system as seen by the output.
8. The method of any claim 5 , further comprising measuring a current between the output and the processing platform, and adapting one or more of:
a commutation time (T COMMUTATION ) between the step of coupling the fourth DC voltage and the step of coupling the first DC voltage,
a commutation time between the step of coupling the third DC voltage and the step of coupling the ground potential (V 0 ),
the third magnitude (V 3 ), and
the fourth magnitude (V 4 ).
9. The method of claim 1 , comprising one or a combination of:
selecting the fourth magnitude (V 4 ) to be representative of an average of:
the output voltage (V p ) at an instant (T 0 ) of coupling the fourth DC voltage to the output and
the output voltage (V p ) at an instant (T 1 ) of coupling the first DC voltage to the output, and
selecting the third magnitude (V 3 ) to be representative of an average of:
the output voltage (V p ) at an instant (T 3 ) of coupling the third DC voltage to the output and
the output voltage (V p ) at an instant (T 4 ) of coupling the ground potential (V 0 ) to the output.
10. The method of claim 1 , comprising one or a combination of: uncoupling the fourth DC voltage following the coupling of the first DC voltage and uncoupling the third DC voltage following the coupling of the second DC current.
11. A voltage waveform generator for a plasma processing apparatus, the voltage waveform generator comprising a power stage and a controller, wherein the power stage comprises:
an output node,
a first DC power supply coupled to the output node through a first switch (SW 1 ), wherein the first DC power supply is configured to output a voltage of a first magnitude (V 1 ),
a second DC power supply coupled to the output node and configured to provide a current (I 2 ) of second magnitude, and
a ground terminal coupled to the output node through a second switch (SW 2 , SW 5 ),
wherein the power stage further comprises:
a third DC power supply coupled to the output node through a third switch (SW 3 ), wherein the third DC power supply is configured to output a voltage of a third magnitude (V 3 ), and
a fourth DC power supply coupled to the output node through a fourth switch (SW 4 ), wherein the fourth DC power supply is configured to output a voltage of a fourth magnitude (V 4 ),
wherein the first, third and fourth DC power supplies are coupled in parallel to the output node,
wherein the first magnitude (V 1 ) is larger than the third magnitude (V 3 ) and the fourth magnitude (V 4 ),
wherein the controller is configured to control actuation of the first (SW 1 ), second (SW 2 , SW 5 ), third (SW 3 ) and fourth (SW 4 ) switches to obtain a predetermined voltage waveform at the output node.
12. The voltage waveform generator of claim 11 , wherein the controller is configured to consecutively close the fourth switch (SW 4 ), the first switch (SW 1 ), the third switch (SW 3 ), and the second switch (SW 2 , SW 5 ) in that order, to obtain a voltage pulse at the output node.
13. The voltage waveform generator of claim 12 , wherein the controller is configured to open the first switch (SW 1 ) prior to closing the third switch (SW 3 ).
14. The voltage waveform generator of any claim 11 , wherein the second DC power supply is configured to draw the current (I 2 ) having a positive second magnitude from the output node.
15. The voltage waveform generator of any claim 11 , wherein the second DC power supply is coupled to the output node through a fifth switch (SW 2 , SW 5 ), the controller being configured to operate the fifth switch.
16. The voltage waveform generator of claim 15 , wherein the controller is configured to close the fifth switch following closing of the second switch.
17. The voltage waveform generator of claim 15 , comprising a bypass switch (SW 5 ) and a process switch (SW 2 ) connected in series between the ground terminal and the output node, wherein the second DC power source is coupled to a node between the bypass switch and the process switch, wherein the controller is configured to operate the bypass switch and the process switch such that when the bypass switch (SW 5 ) is closed, the process switch (SW 2 ) forms the second switch, and when the bypass switch (SW 5 ) is open, the process switch (SW 2 ) forms the fifth switch.
18. The voltage waveform generator of any claim 11 , comprising a current control loop coupled to the controller, wherein the current control loop comprises a current measurement sensor operable to measure a current at output node, and wherein the controller is configured to adjust one or more of:
a switching time of one or more of the first (SW 1 ), second (SW 2 , SW 5 ), third (SW 3 ) and fourth (SW 4 ) switches, and
a setpoint of one or more of the third (V 3 ) and fourth (V 4 ) magnitudes, on the basis of a value determined by current measurement sensor.
19. The voltage waveform generator of any claim 11 , comprising one or a combination of: a commutation inductor (L 3 , L 4 ) coupled between the third switch (SW 3 ) and the output node and a commutation inductor coupled between the fourth switch (SW 4 ) and the output node.
20. An apparatus for plasma processing, comprising:
an arrangement for configured to generate a plasma;
a processing platform for configured to support a substrate to be processed by the plasma; and
the voltage waveform generator of claim 11 , wherein the output node is electrically connected to the processing platform.