Memory array structure with dynamic differential-reference based readout scheme for computing-in-memory applications, dynamic differential-reference time-to-digital converter for computing-in-memory applications and computing method thereof
A dynamic differential-reference time-to-digital converter for computing-in-memory applications is controlled by a bias reference and a predetermined setting parameter, and includes a configurable main-reference selector and a plurality of time-to-digital converters. The configurable main-reference selector is configured to receive a plurality of edge-output signals, select one of the edge-output signals as a main reference and select others of the edge-output signals as a plurality of edge selected signals according to the predetermined setting parameter. One of the time-to-digital converters is configured to compare the bias reference with the main reference to output a bias multiplication-and-accumulation value, and others of the time-to-digital converters are configured to compare the main reference with the edge selected signals to output a plurality of differential multiplication-and-accumulation values. The bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values are dynamically adjusted according to the bias reference and the predetermined setting parameter.
1. A dynamic differential-reference time-to-digital converter for computing-in-memory applications, which is controlled by a bias reference and a predetermined setting parameter, the dynamic differential-reference time-to-digital converter for computing-in-memory applications comprising:
a configurable main-reference selector configured to receive a plurality of edge-output signals, wherein the configurable main-reference selector is configured to select one of the edge-output signals as a main reference and select others of the edge-output signals as a plurality of edge selected signals according to the predetermined setting parameter; and
a plurality of time-to-digital converters connected to the configurable main-reference selector and configured to receive the bias reference, the main reference and the edge selected signals, wherein one of the time-to-digital converters is configured to compare the bias reference with the main reference to output a bias multiplication-and-accumulation value, and others of the time-to-digital converters are configured to compare the main reference with the edge selected signals to output a plurality of differential multiplication-and-accumulation values;
wherein the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values are dynamically adjusted according to the bias reference and the predetermined setting parameter.
2. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 1 , further comprising:
a bias reference selector configured to receive a bias control signal and generate a bias value and a bias selecting signal according to the bias control signal;
wherein the bias reference is generated according to the bias selecting signal and corresponding to the bias value.
3. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 1 , wherein the configurable main-reference selector comprises:
a first node electrically connected to the one of the edge-output signals;
a second node electrically connected to the time-to-digital converters and corresponding to the main reference; and
a buffer module electrically connected between the first node and the second node.
4. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 3 , wherein,
the edge-output signals comprise a first edge-output signal, a second edge-output signal, a third edge-output signal and a fourth edge-output signal;
the others of the time-to-digital converters comprise a first time-to-digital converter, a second time-to-digital converter and a third time-to-digital converter; and
the configurable main-reference selector further comprises:
a first switch electrically connected to the first edge-output signal and one of the first node and the first time-to-digital converter according to the predetermined setting parameter;
a second switch electrically connected to the second edge-output signal and one of the first time-to-digital converter, the first node and the second time-to-digital converter according to the predetermined setting parameter;
a third switch electrically connected to the third edge-output signal and one of the second time-to-digital converter, the first node and the third time-to-digital converter according to the predetermined setting parameter; and
a fourth switch electrically connected to the fourth edge-output signal and one of the third time-to-digital converter and the first node according to the predetermined setting parameter.
5. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 4 , wherein,
in response to determining that the first edge-output signal is electrically connected to the first node via the first switch, the first edge-output signal is corresponding to the main reference, the second edge-output signal is transmitted to the first time-to-digital converter via the second switch, the third edge-output signal is transmitted to the second time-to-digital converter via the third switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch;
in response to determining that the second edge-output signal is electrically connected to the first node via the second switch, the second edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the third edge-output signal is transmitted to the second time-to-digital converter via the third switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch;
in response to determining that the third edge-output signal is electrically connected to the first node via the third switch, the third edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the second edge-output signal is transmitted to the second time-to-digital converter via the second switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch; and
in response to determining that the fourth edge-output signal is electrically connected to the first node via the fourth switch, the fourth edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the second edge-output signal is transmitted to the second time-to-digital converter via the second switch, and the third edge-output signal is transmitted to the third time-to-digital converter via the third switch.
6. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 1 , wherein each of the time-to-digital converters comprises:
a first flip-flop connected to a reference clock;
a second flip-flop connected to the reference clock;
an AND gate connected to the first flip-flop and the second flip-flop; and
a counter connected to the AND gate and the reference clock;
wherein the first flip-flop is configured to receive one of the bias reference and the edge selected signals, the second flip-flop is configured to receive the main reference, and the counter is configured to generate one of the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values.
7. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 1 , wherein,
the one of the time-to-digital converters is configured to compare a time difference of rising edges between the bias reference and the main reference to output the bias multiplication-and-accumulation value; and
the others of the time-to-digital converters are configured to compare a plurality of time differences of rising edges between the main reference and the others of the edge-output signals to output the differential multiplication-and-accumulation values.
8. The dynamic differential-reference time-to-digital converter for computing-in-memory applications of claim 1 , wherein a sum of absolute values of the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values is corresponding to a sampling period of the time-to-digital converters and dynamically adjusted according to the bias reference and the predetermined setting parameter.
9. A memory array structure with a dynamic differential-reference based readout scheme for computing-in-memory applications, which is controlled by a bias reference and a predetermined setting parameter, the memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications comprising:
a delay computing block configured to receive a plurality of multi-bit analog input voltages, a plurality of edge-input signals and a weight, wherein the delay computing block is configured to generate a plurality of edge-output signals having a plurality of delay times according to the multi-bit analog input voltages, the edge-input signals and the weight; and
a dynamic differential-reference time-to-digital converter connected to the delay computing block and comprising:
a configurable main-reference selector configured to receive the edge-output signals, wherein the configurable main-reference selector is configured to select one of the edge-output signals as a main reference and select others of the edge-output signals as a plurality of edge selected signals according to the predetermined setting parameter; and
a plurality of time-to-digital converters connected to the configurable main-reference selector and configured to receive the bias reference, the main reference and the edge selected signals, wherein one of the time-to-digital converters is configured to compare the bias reference with the main reference to output a bias multiplication-and-accumulation value, and others of the time-to-digital converters are configured to compare the main reference with the edge selected signals to output a plurality of differential multiplication-and-accumulation values;
wherein the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values are dynamically adjusted according to the bias reference and the predetermined setting parameter.
10. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 9 , wherein the dynamic differential-reference time-to-digital converter further comprises:
a bias reference selector configured to receive a bias control signal and generate a bias value and a bias selecting signal according to the bias control signal;
wherein the bias reference is generated according to the bias selecting signal and corresponding to the bias value.
11. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 9 , wherein the configurable main-reference selector comprises:
a first node electrically connected to the one of the edge-output signals;
a second node electrically connected to the time-to-digital converters and corresponding to the main reference; and
a buffer module electrically connected between the first node and the second node.
12. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 11 , wherein,
the edge-output signals comprise a first edge-output signal, a second edge-output signal, a third edge-output signal and a fourth edge-output signal;
the others of the time-to-digital converters comprise a first time-to-digital converter, a second time-to-digital converter and a third time-to-digital converter; and
the configurable main-reference selector further comprises:
a first switch electrically connected to the first edge-output signal and one of the first node and the first time-to-digital converter according to the predetermined setting parameter;
a second switch electrically connected to the second edge-output signal and one of the first time-to-digital converter, the first node and the second time-to-digital converter according to the predetermined setting parameter;
a third switch electrically connected to the third edge-output signal and one of the second time-to-digital converter, the first node and the third time-to-digital converter according to the predetermined setting parameter; and
a fourth switch electrically connected to the fourth edge-output signal and one of the third time-to-digital converter and the first node according to the predetermined setting parameter.
13. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 12 , wherein,
in response to determining that the first edge-output signal is electrically connected to the first node via the first switch, the first edge-output signal is corresponding to the main reference, the second edge-output signal is transmitted to the first time-to-digital converter via the second switch, the third edge-output signal is transmitted to the second time-to-digital converter via the third switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch;
in response to determining that the second edge-output signal is electrically connected to the first node via the second switch, the second edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the third edge-output signal is transmitted to the second time-to-digital converter via the third switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch;
in response to determining that the third edge-output signal is electrically connected to the first node via the third switch, the third edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the second edge-output signal is transmitted to the second time-to-digital converter via the second switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch; and
in response to determining that the fourth edge-output signal is electrically connected to the first node via the fourth switch, the fourth edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the second edge-output signal is transmitted to the second time-to-digital converter via the second switch, and the third edge-output signal is transmitted to the third time-to-digital converter via the third switch.
14. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 9 , wherein each of the time-to-digital converters comprises:
a first flip-flop connected to a reference clock;
a second flip-flop connected to the reference clock;
an AND gate connected to the first flip-flop and the second flip-flop; and
a counter connected to the AND gate and the reference clock;
wherein the first flip-flop is configured to receive one of the bias reference and the edge selected signals, the second flip-flop is configured to receive the main reference, and the counter is configured to generate one of the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values.
15. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 9 , wherein,
the one of the time-to-digital converters is configured to compare a time difference of rising edges between the bias reference and the main reference to output the bias multiplication-and-accumulation value; and
the others of the time-to-digital converters are configured to compare a plurality of time differences of rising edges between the main reference and the others of the edge-output signals to output the differential multiplication-and-accumulation values.
16. The memory array structure with the dynamic differential-reference based readout scheme for computing-in-memory applications of claim 9 , wherein a sum of absolute values of the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values is corresponding to a sampling period of the time-to-digital converters and dynamically adjusted according to the bias reference and the predetermined setting parameter.
17. A computing method of a dynamic differential-reference time-to-digital converter for computing-in-memory applications, which is controlled by a bias reference and a predetermined setting parameter, the computing method comprising:
performing a voltage level applying step, wherein the voltage level applying step comprises applying a plurality of voltage levels to the bias reference, the predetermined setting parameter and a plurality of edge-output signals, respectively; and
performing a computing step, wherein the computing step comprises:
performing a selecting step, wherein the selecting step comprises configuring a configurable main-reference selector to select one of the edge-output signals as a main reference and select others of the edge-output signals as a plurality of edge selected signals according to the predetermined setting parameter; and
performing a converting step, wherein the converting step comprises configuring one of a plurality of time-to-digital converters to compare the bias reference with the main reference to output a bias multiplication-and-accumulation value, and configuring others of the time-to-digital converters to compare the main reference with the edge selected signals to output a plurality of differential multiplication-and-accumulation values;
wherein the bias multiplication-and-accumulation value and the differential multiplication-and-accumulation values are dynamically adjusted according to the bias reference and the predetermined setting parameter.
18. The computing method of claim 17 , wherein the selecting step further comprises:
configuring a buffer module of the configurable main-reference selector to electrically connect between a first node and a second node, wherein the first node is electrically connected to the one of the edge-output signals, and the second node is electrically connected to the time-to-digital converters and corresponding to the main reference.
19. The computing method of claim 18 , wherein,
the edge-output signals comprise a first edge-output signal, a second edge-output signal, a third edge-output signal and a fourth edge-output signal;
the others of the time-to-digital converters comprise a first time-to-digital converter, a second time-to-digital converter and a third time-to-digital converter; and
the selecting step further comprises:
configuring a first switch of the configurable main-reference selector to electrically connect to the first edge-output signal and one of the first node and the first time-to-digital converter according to the predetermined setting parameter;
configuring a second switch of the configurable main-reference selector to electrically connect to the second edge-output signal and one of the first time-to-digital converter, the first node and the second time-to-digital converter according to the predetermined setting parameter;
configuring a third switch of the configurable main-reference selector to electrically connect to the third edge-output signal and one of the second time-to-digital converter, the first node and the third time-to-digital converter according to the predetermined setting parameter; and
configuring a fourth switch of the configurable main-reference selector to electrically connect to the fourth edge-output signal and one of the third time-to-digital converter and the first node according to the predetermined setting parameter.
20. The computing method of claim 19 , wherein,
in response to determining that the first edge-output signal is electrically connected to the first node via the first switch, the first edge-output signal is corresponding to the main reference, the second edge-output signal is transmitted to the first time-to-digital converter via the second switch, the third edge-output signal is transmitted to the second time-to-digital converter via the third switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch;
in response to determining that the second edge-output signal is electrically connected to the first node via the second switch, the second edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the third edge-output signal is transmitted to the second time-to-digital converter via the third switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch;
in response to determining that the third edge-output signal is electrically connected to the first node via the third switch, the third edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the second edge-output signal is transmitted to the second time-to-digital converter via the second switch, and the fourth edge-output signal is transmitted to the third time-to-digital converter via the fourth switch; and
in response to determining that the fourth edge-output signal is electrically connected to the first node via the fourth switch, the fourth edge-output signal is corresponding to the main reference, the first edge-output signal is transmitted to the first time-to-digital converter via the first switch, the second edge-output signal is transmitted to the second time-to-digital converter via the second switch, and the third edge-output signal is transmitted to the third time-to-digital converter via the third switch.