IP Library Granted Patent US 12,180,577
Granted Patent B2
US 12,180,577 · App. 17/666,703 · Granted Dec 31, 2024

Titanium sputtering target, production method therefor, and method for producing titanium-containing thin film

Inventors: Shuhei Murata (Ibaraki, JP); Daiki Shono (Ibaraki, JP)
Assignee: JX Advanced Metals Corporation
C23C14/3414
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Quick Facts
Patent No.
US 12,180,577
App. No.
17/666,703
Granted
Dec 31, 2024
Kind
B2
Abstract

Provided is a titanium sputtering target having a recrystallized structure having an average crystal grain diameter of 1 μm or less. Also provided is a method for producing a titanium sputtering target, the method comprising the steps of: subjecting a cut titanium ingot to large strain processing to provide a processed sheet; subjecting the processed sheet to cold rolling at a rolling ratio of 30% or more to provide a rolled sheet; and subjecting the rolled sheet to a heat treatment at a temperature of 320° C. or less.

Claims (23)

1. A method for producing a titanium sputtering target, the method comprising the steps of:

subjecting a cut titanium ingot having a purity of 4N (99.99% by mass) or more to strain processing to provide a processed sheet having a total strain amount of 2 or more;

subjecting the processed sheet to cold rolling at a rolling ratio of 30% or more to provide a rolled sheet; and

subjecting the rolled sheet to a heat treatment at a temperature of 320° C. or less, wherein the titanium sputtering target produced has an average crystal grain diameter of 1 μm or less.

2. The method for producing the titanium sputtering target according to claim 1 , wherein a processing temperature in the strain processing is 500° C. or less.

3. The method for producing the titanium sputtering target according to claim 1 , wherein the strain processing is multidirectional forging.

4. The method for producing the titanium sputtering target according to claim 1 , wherein a rolling ratio in the cold rolling is more than 70%.

5. The method for producing the titanium sputtering target according to claim 1 , wherein a total strain amount of the processed sheet is more than 3.

6. The titanium sputtering target produced using the method according to claim 1 .

7. A method for producing a titanium-containing thin film, the method comprising using the titanium sputtering target according to claim 6 as a sputtering source.

8. The method for producing the titanium sputtering target according to claim 2 , wherein the strain processing is multidirectional forging.

9. The method for producing the titanium sputtering target according to claim 2 , wherein a rolling ratio in the cold rolling is more than 70%.

10. The method for producing the titanium sputtering target according to claim 3 , wherein a rolling ratio in the cold rolling is more than 70%.

11. He method for producing the titanium sputtering target according to claim 8 , wherein a rolling ratio in the cold rolling is more than 70%.

12. The method for producing the titanium sputtering target according to claim 2 , wherein a total strain amount of the processed sheet is more than 3.

13. The method for producing the titanium sputtering target according to claim 3 , wherein a total strain amount of the processed sheet is more than 3.

14. The method for producing the titanium sputtering target according to claim 4 , wherein a total strain amount of the processed sheet is more than 3.

15. The method for producing the titanium sputtering target according to claim 8 , wherein a total strain amount of the processed sheet is more than 3.

16. The method for producing the titanium sputtering target according to claim 9 , wherein a total strain amount of the processed sheet is more than 3.

17. The method for producing the titanium sputtering target according to claim 10 , wherein a total strain amount of the processed sheet is more than 3.

18. The method for producing the titanium sputtering target according to claim 11 , wherein a total strain amount of the processed sheet is more than 3.

19. The method for producing the titanium sputtering target according to claim 1 , wherein the average crystal grain diameter is 0.9 μm or less.

20. The method for producing the titanium sputtering target according to claim 1 , wherein the average crystal grain diameter is from 0.1 μm to 0.8 μm.

Assignments (2)
CHANGE OF NAME Recorded Oct 22, 2024
From: JX NIPPON MINING & METALS CORPORATION
To: JX METALS CORPORATION
Reel/Frame 069217/0903 →
CHANGE OF NAME Recorded Oct 22, 2024
From: JX METALS CORPORATION
To: JX ADVANCED METALS CORPORATION
Reel/Frame 069230/0608 →
Priority Claims (1)
JP 2017-181694 · Sep 21, 2017 · national
Continuity (2)
Division 16648042
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