IP Library › Granted Patent US 12,317,666
Granted Patent B2
US 12,317,666 · App. 17/678,453 · Granted May 27, 2025

Organic thin film transistor and method of manufacturing the same and thin film transistor array panel and electronic device

Inventors: Yasutaka Kuzumoto (Suwon-si, KR); Suk Gyu Hahm (Gyungju-si, KR); Jong Won Chung (Hwaseong-si, KR); Youngjun Yun (Seongnam-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H10K10/481H10K71/233H10K77/111H10D86/471H10D86/60H10K2102/00
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Quick Facts
Patent No.
US 12,317,666
App. No.
17/678,453
Granted
May 27, 2025
Kind
B2
Abstract

An organic thin film transistor includes a gate electrode, an organic semiconductor layer overlapped with the gate electrode, a hydrophilic nanolayer on the organic semiconductor layer, and a source electrode and a drain electrode electrically connected to the organic semiconductor layer.

Claims (27)

1. A method of manufacturing an organic thin film transistor, the method comprising:

forming a gate electrode,

forming an organic semiconductor layer overlapped with the gate electrode, and

forming a source electrode and a drain electrode electrically connected to the organic semiconductor layer,

wherein the forming of the organic semiconductor layer includes

forming an organic semiconductor thin film,

forming a hydrophilic nanolayer on the organic semiconductor thin film,

forming a protective interlayer on the hydrophilic nanolayer,

performing a photolithography of the protective interlayer, the hydrophilic nanolayer, and the organic semiconductor thin film, and

removing the protective interlayer.

2. The method of claim 1 , wherein

the performing the photolithography of the protective interlayer, the hydrophilic nanolayer, and the organic semiconductor thin film comprises:

applying a photoresist film on the protective interlayer,

disposing a mask on the photoresist film and exposing a portion of the photoresist film,

developing the exposed portion of the photoresist film to form a photoresist pattern,

patterning the protective interlayer, the hydrophilic nanolayer and the organic semiconductor thin film using the photoresist pattern, and

removing the photoresist pattern.

3. The method of claim 2 , wherein the photoresist film comprises a fluorine-containing photoresist.

4. The method of claim 1 , wherein the protective interlayer comprises a material different from that of the hydrophilic nanolayer.

5. The method of claim 4 , wherein the protective interlayer comprises a water-soluble organic compound.

6. The method of claim 5 , wherein

the hydrophilic nanolayer comprises a hydrophilic metal oxide, a hydrophilic low molecular weight compound having a molecular weight of less than or equal to about 3,000, or any combination thereof, and

the hydrophilic metal oxide and the hydrophilic low molecular weight compound are insoluble in water.

7. The method of claim 1 , wherein

the hydrophilic nanolayer is formed by vapor deposition, and

the protective interlayer is formed by a solution process.

8. The method of claim 1 , wherein the removing of the protective interlayer comprises supplying water to the protective interlayer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 1, 2022
From: KUZUMOTO, YASUTAKA; HAHM, SUK GYU; CHUNG, JONG WON; YUN, YOUNGJUN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 059128/0657 →
Priority Claims (1)
KR 10-2021-0140946 · Oct 21, 2021 · national
Continuity (1)
Related Publication 20230131263A1 · Apr 27, 2023
References Cited (31)
US 7939453B2 · Kano et al. · 2011 [cited by applicant]
US 9401487B2 · Im et al. · 2016 [cited by applicant]
US 9478727B2 · Bose et al. · 2016 [cited by applicant]
US 9799708B2 · Hong et al. · 2017 [cited by applicant]
US 9887373B2 · Lee et al. · 2018 [cited by applicant]
US 9945739B2 · Jeon et al. · 2018 [cited by applicant]
US 10417948B2 · Choi · 2019 [cited by applicant]
US 20030157432A1 · Rottstegge · 2003 [cited by examiner]
US 20100200844A1 · Chen · 2010 [cited by examiner]
US 20100264408A1 · Bale · 2010 [cited by examiner]
US 20120273786A1 · Yahagi · 2012 [cited by applicant]
US 20150070422A1 · Sumikawa · 2015 [cited by examiner]
US 20160365247A1 · Jin · 2016 [cited by examiner]
US 20170224257A1 · Rogers · 2017 [cited by applicant]
US 20170331045A1 · Chung et al. · 2017 [cited by applicant]
US 20190244064A1 · Mahto · 2019 [cited by examiner]
US 20190333942A1 · Yamazaki · 2019 [cited by examiner]
US 20190372037A1 · Kim · 2019 [cited by examiner]
US 20200044089A1 · Zhang · 2020 [cited by examiner]
US 20210036229A1 · Lee et al. · 2021 [cited by applicant]
US 20210151680A1 · Yokoi · 2021 [cited by examiner]
US 20210184165A1 · Pan · 2021 [cited by examiner]
US 20210225660A1 · Lian · 2021 [cited by examiner]
US 20210296599A1 · Kim et al. · 2021 [cited by applicant]
US 20210305286A1 · Li · 2021 [cited by examiner]
JP 2008071781A · 2008 [cited by applicant]
JP 5360737B2 · 2013 [cited by applicant]
KR 1020100068749A · 2010 [cited by applicant]
KR 1020150052763A · 2015 [cited by applicant]
KR 1020210014566A · 2021 [cited by applicant]
KR 1020210116061A · 2021 [cited by applicant]