IP Library Granted Patent US 12,470,231
Granted Patent B2
US 12,470,231 · App. 17/688,125 · Granted Nov 11, 2025

Method and apparatus to perform cyclic redundancy check training in a memory module

Inventors: Tonia M. Rose (Wendell, NC); Saravanan Sethuraman (Bayan Lepas, MY)
Assignee: Intel Corporation
H03M13/09G06F13/1673G06F13/1684H03M13/611
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Quick Facts
Patent No.
US 12,470,231
App. No.
17/688,125
Granted
Nov 11, 2025
Kind
B2
Abstract

A differential Data Strobe (DQS) signal is used to transmit and receive Cyclic Redundancy Check (CRC) between a host memory controller and a memory module. The differential DQS strobe signal is trained before it is used for transactions. The training is performed by sending and receiving a CRC pattern on the differential DQS strobe signal between the host memory controller and a buffer in the memory module.

Claims (31)

1 . A memory module comprising:

a hardware interface to interface with a command bus and a data bus having multiple data (DQ) signal lines and a CRC signal line, the hardware interface to receive a command on the command bus to trigger training of signaling on the multiple data (DQ) signal lines and the CRC signal line that includes testing and setting of electrical parameters or timing parameters that control respective data signal eyes for signaling on each of the multiple data (DO) signal lines and on the CRC signal line; and

a data buffer to include pattern generation and checking circuitry for each of the multiple data (DQ) signal lines and the CRC signal line to perform the training of signaling on the multiple data (DQ) signal lines and the CRC signal line, wherein the testing and setting of electrical parameters or timing parameters that control respective data signal eyes for the signaling on each of the multiple data (DO) signal lines and on the CRC signal line occurs without interfering with data stored in a memory integrated circuit.

2 . The memory module of claim 1 , wherein the memory integrated circuit is included in the memory module and coupled with the data buffer.

3 . The memory module of claim 1 , wherein the training of signaling is performed during normal operation of the memory module.

4 . The memory module of claim 2 , wherein the training of signaling performed prior to enabling normal operation of the memory integrated circuit.

5 . The memory module of claim 1 , wherein the training of the CRC signal line and the training of the multiple data (DQ) signal lines are performed in parallel.

6 . The memory module of claim 1 , wherein the CRC signal line is a differential data strobe (DQS) signal line.

7 . The memory module of claim 1 , wherein a number of data signal lines is 8.

8 . The memory module of claim 2 , wherein the memory integrated circuit is a Dynamic Random Access Memory (DRAM) and the memory module is a Load Reduced Double Data Rate Dual In-Line Memory Module (LR-DIMM).

9 . A memory controller comprising:

command logic to generate a command to train signaling on a data bus of a memory module, the data bus having multiple data (DQ) signal lines and a CRC signal line; and

a hardware interface to interface with a command bus, the hardware interface to send the command to the memory module, the memory module comprising a data buffer, the data buffer to include pattern generation and checking circuitry for each of the multiple data (DQ) signal lines and the CRC signal line to perform training of signaling on the multiple data (DQ) signal lines and the CRC signal line that includes testing and setting of electrical parameters or timing parameters that control respective data signal eyes for signaling on each of the multiple data (DQ) signal lines and on the CRC signal line, wherein the testing and setting of electrical or timing parameters occurs without interfering with data stored in a memory integrated circuit.

10 . The memory controller of claim 9 , wherein the memory module comprising the memory integrated circuit to store data.

11 . The memory controller of claim 9 , wherein training of signaling is performed during normal operation of the memory module.

12 . The memory controller of claim 10 , wherein training of signaling performed prior to enabling normal operation of the memory integrated circuit.

13 . The memory controller of claim 9 , wherein training of the CRC signal line and training of the multiple data (DQ) signal lines are performed in parallel.

14 . The memory controller of claim 9 , wherein the CRC signal line is a differential data strobe (DQS) signal line.

15 . The memory controller of claim 9 , wherein a number of data signal lines is 8.

16 . The memory controller of claim 9 , wherein the memory integrated circuit is a Dynamic Random Access Memory (DRAM) and the memory module is an Load Reduced Double Data Rate Dual In-Line Memory Module (LR-DIMM).

17 . A system comprising:

a memory controller; and

a memory module, the memory module comprising:

a hardware interface to interface with a command bus and a data bus having multiple data (DQ) signal lines and a CRC signal line, the hardware interface to receive a command from the memory controller on the command bus to trigger training of signaling on the multiple data (DQ) signal lines and the CRC signal line that includes testing and setting of electrical parameters or timing parameters that control respective data signal eyes for signaling on each of the multiple data (DQ) signal lines and on the CRC signal line; and

a data buffer to include pattern generation and checking circuitry for each of the multiple data (DQ) signal lines and the CRC signal line to perform the training of signaling on the multiple data (DQ) signal lines and the CRC signal line, wherein the testing and setting of electrical parameters or timing parameters that control respective data signal eyes for the signaling on each of the multiple data (DQ) signal lines and on the CRC signal line occurs without interfering with data stored in a memory integrated circuit.

18 . The system of claim 17 , wherein the training of the CRC signal line and the training of the multiple data (DQ) signal lines are performed in parallel and the CRC signal line is a differential data strobe (DQS) signal line.

19 . The system of claim 17 , wherein the memory integrated circuit is included in the memory module and coupled with the data buffer, the training of signaling performed prior to enabling normal operation of the memory integrated circuit.

20 . The system of claim 17 , further comprising one or more of:

at least one processor communicatively coupled to the memory controller;

a display communicatively coupled to at least one processor; or

a battery to power the system.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2022
From: ROSE, TONIA M.; SETHURAMAN, SARAVANAN
To: INTEL CORPORATION
Reel/Frame 059293/0480 →
Continuity (1)
Related Publication 20220190844A1 · Jun 16, 2022
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