Electrostatic discharge protection circuit
An ESD protection circuit includes a buffer circuit, a driving circuit, and a power-clamping circuit. The buffer circuit includes first and second transistors having a first conductivity type coupled in a cascade configuration between a first node and a first power supply node. A bonding pad is coupled to the first node. The drive circuit determines a state of at least one of the first and second transistors according to a control voltage. The drive circuit includes a third transistor having a second conductivity type, which is coupled between a second power supply node and a gate of the first transistor and is controlled by the control signal. The power-clamping circuit is coupled to the bonding pad and a gate of the third transistor at a second node. The control voltage is generated at the second node and determined by a voltage at the bonding pad.
1. An electrostatic discharge protection circuit coupled to a bonding pad, comprising:
a buffer circuit comprising a first transistor and a second transistor having a first conductivity type, which are coupled in a cascade configuration between a first node and a first power supply node, wherein the bonding pad is coupled to the first node;
a drive circuit receiving a first control voltage and determining a state of at least one of the first transistor and the second transistor according to the first control voltage, wherein the drive circuit comprises:
a third transistor having a second conductivity type, wherein the third transistor is coupled between a second power supply node and a gate of the first transistor and is controlled by the first control voltage; and
a fourth transistor having the second conductivity type, wherein the fourth transistor is coupled between a second node and a third node and is controlled by a second control voltage; and
a power-clamping circuit coupled to the bonding pad through the first node and coupled to a gate of the third transistor at the second node, wherein the power-clamping circuit comprises:
a pull-up transistor having the second conductivity type, wherein the pull-up transistor is coupled between the second power supply node and the second node and is controlled by the second control voltage,
wherein the first control voltage is generated at the second node, and the power-clamping circuit determines a level of the first control voltage according to a voltage on the bonding pad.
2. The electrostatic discharge protection circuit as claimed in claim 1 , wherein in response to an electrostatic discharge event occurring on the bonding pad, the drive circuit turns off at least one of the first transistor and the second transistor according to the first control voltage.
3. The electrostatic discharge protection circuit as claimed in claim 1 ,
wherein the buffer circuit further comprises:
a fifth transistor having the second conductivity type and coupled between the second power supply node and the first node, and
wherein the drive circuit further comprises:
a voltage-lowering circuit coupled between the bonding pad and the third node;
a sixth transistor having the first conductivity type, wherein the sixth transistor is coupled between the gate of the first transistor and the first power supply node and is controlled by the first control voltage; and
a seventh transistor having the first conductivity type, wherein the seventh transistor is coupled between a gate of the second transistor and the first power supply node and is controlled by the first control voltage,
wherein the power-clamping circuit generates the second control voltage in response to the voltage on the bonding pad and determines the level of the first control voltage according to the second control voltage.
4. The electrostatic discharge protection circuit as claimed in claim 3 , wherein the power clamping circuit comprises:
a resistor and a capacitor connected in series between the second power supply node and the first power supply node, wherein the second control voltage is generated at a common node between the resistor and the capacitor;
and
a pull-down transistor having the first conductivity type, wherein the pull-down transistor is coupled between the second node and the first power supply node and is controlled by the second control voltage.
5. The electrostatic discharge protection circuit as claimed in claim 1 ,
wherein the buffer circuit further comprises:
a fifth transistor having the second conductivity type and coupled between the second power supply node and the first node, and
wherein the drive circuit further comprises:
a voltage-lowering circuit coupled between the bonding pad and the third node;
and
a sixth transistor having the first conductivity type, wherein the sixth transistor is coupled between a gate of the second transistor and the first power supply node and is controlled by the first control voltage,
wherein the power-clamping circuit generates the second control voltage in response to the voltage on the bonding pad and determines the level of the first control voltage according to the second control voltage.
6. The electrostatic discharge protection circuit as claimed in claim 5 , wherein the power clamping circuit comprises:
a resistor and a capacitor connected in series between the second power supply node and the first power supply node, wherein the second control voltage is generated at a common node between the resistor and the capacitor;
and
a pull-down transistor having the first conductivity type, wherein the pull-down transistor is coupled between the second node and the first power supply node and is controlled by the second control voltage.
7. The electrostatic discharge protection circuit as claimed in claim 1 ,
wherein the buffer circuit further comprises:
a fifth transistor having the second conductivity type and coupled between the second power supply node and the first node, and
wherein the drive circuit further comprises:
a voltage-lowering circuit coupled between the bonding pad and the third node;
and
a sixth transistor having the first conductivity type, wherein the sixth transistor is coupled between the gate of the first transistor and the first power supply node and is controlled by the first control voltage,
wherein the power-clamping circuit generates the second control voltage in response to the voltage on the bonding pad and determines the level of the first control voltage according to the second control voltage.
8. The electrostatic discharge protection circuit as claimed in claim 7 , wherein the power clamping circuit comprises:
a resistor and a capacitor connected in series between the second power supply node and the first power supply node, wherein the second control voltage is generated at a common node between the resistor and the capacitor;
and
a pull-down transistor having the first conductivity type, wherein the pull-down transistor is coupled between the second node and the first power supply node and is controlled by the second control voltage.
9. The electrostatic discharge protection circuit as claimed in claim 8 ,
wherein in an input mode, there is a first operation voltage on the first power supply node, the second power supply node receives a second operation voltage higher than the first operating voltage, the gate of the second transistor receives a first signal voltage, and a gate of the fourth transistor receives a second signal voltage, and
wherein in the input mode, a level of the second signal voltage is higher than a level of the first signal voltage.
10. The electrostatic discharge protection circuit as claimed in claim 8 ,
wherein in an output mode, there is a first operation voltage on the first power supply node, the second power supply node receives a second operation voltage that is higher than the first operating voltage, the gate of the second transistor receives a first signal voltage, and a gate of the fourth transistor receives a second signal voltage, and
wherein in the output mode, a level of the second signal voltage is higher than a level of the first signal voltage.
11. The electrostatic discharge protection circuit as claimed in claim 8 , wherein the second power node does not receive any operation voltage and an electrostatic discharge event occurs on the bonding pad, the drive circuit turns off at least one the first transistor and the second transistor according to at least one of the first control voltage and the second control voltage.
12. An electrostatic discharge protection circuit coupled to a bonding pad, comprising:
a buffer circuit comprising:
a first transistor having a first conductivity type and coupled between a first node and a second node, wherein the bonding pad is coupled to the first node; and
a second transistor having the first conductivity type and coupled between the second node and a first power supply node;
a drive circuit receiving a first control voltage and determining a state of at least one of the first transistor and the second transistor according to the first control voltage, wherein the drive circuit further comprises:
a third transistor having a second conductivity type, wherein the third transistor is coupled between a third node and a fourth node and is controlled by a second control voltage; and
a fourth transistor having the second conductivity type, wherein the fourth transistor is coupled between a second power supply node and a gate of the first transistor and is controlled by the first control voltage; and
a power-clamping circuit coupled to the bonding pad through the first node and coupled to the drive circuit at the third node,
wherein the first control voltage is generated at the third node, and the power-clamping circuit determines a level of the first control voltage according to a voltage on the bonding pad, and
wherein in response to an electrostatic discharge event occurring on the bonding pad, the drive circuit turns off the first transistor according to the first control voltage.
13. The electrostatic discharge protection circuit as claimed in claim 12 , wherein in response to the electrostatic discharge event occurring on the bonding pad, the drive circuit further turns off the second transistor according to the first control voltage.
14. The electrostatic discharge protection circuit as claimed in claim 12 ,
wherein the buffer circuit further comprises:
a fifth transistor having the second conductivity type and coupled between the second power supply node and the first node, and
wherein the drive circuit further comprises:
a voltage-lowering circuit coupled between the bonding pad and the fourth node;
a sixth transistor having the first conductivity type, wherein the sixth transistor is coupled between the gate of the first transistor and the first power supply node and is controlled by the first control voltage; and
a seventh transistor having the first conductivity type, wherein the seventh transistor is coupled between a gate of the second transistor and the first power supply node and is controlled by the first control voltage,
wherein the power-clamping circuit generates the second control voltage in response to the voltage on the bonding pad and determines the level of the first control voltage according to the second control voltage.
15. The electrostatic discharge protection circuit as claimed in claim 12 ,
wherein the buffer circuit further comprises:
a fifth transistor having the second conductivity type and coupled between the second power supply node and the first node, and
wherein the drive circuit further comprises:
a voltage-lowering circuit coupled between the bonding pad and the fourth node;
and
a sixth transistor having the first conductivity type, wherein the sixth transistor is coupled between the gate of the first transistor and the first power supply node and is controlled by the first control voltage,
wherein the power-clamping circuit generates the second control voltage in response to the voltage on the bonding pad and determines the level of the first control voltage according to the second control voltage.