Method for reading data of a first memory cell transistor of a nonvolatile semiconductor memory device
A nonvolatile semiconductor memory device that have a new structure are provided, in which memory cells are laminated in a three dimensional state so that the chip area may be reduced. The nonvolatile semiconductor memory device of the present invention is a nonvolatile semiconductor memory device that has a plurality of the memory strings, in which a plurality of electrically programmable memory cells is connected in series. The memory strings comprise a pillar shaped semiconductor; a first insulation film formed around the pillar shaped semiconductor; a charge storage layer formed around the first insulation film; the second insulation film formed around the charge storage layer; and first or nth electrodes formed around the second insulation film (n is natural number more than 1). The first or nth electrodes of the memory strings and the other first or nth electrodes of the memory strings are respectively the first or nth conductor layers that are spread in a two dimensional state.
1. A method for reading data of a first memory cell transistor of a nonvolatile semiconductor memory device comprising:
applying a first voltage to a gate of a first select transistor, the first select transistor being coupled between a first bit line and a first memory unit having the first memory cell transistor and a second memory cell transistor coupled in series, the first memory cell transistor and the second memory cell transistor being arranged in a first direction crossing a surface of a substrate;
applying a second voltage lower than the first voltage to a gate of a second select transistor, the second select transistor being coupled between the first bit line and a second memory unit having a third memory cell transistor and a fourth memory cell transistor coupled in series, the third memory cell transistor and the fourth memory cell transistor being arranged in the first direction, a gate of the first memory cell transistor being coupled with a gate of the third memory cell transistor, a gate of the second memory cell transistor being coupled with a gate of the fourth memory cell transistor, the gate of the first select transistor not being coupled with the gate of the second select transistor; and
applying a read voltage to the gate of the first memory cell transistor for reading data of the first memory cell transistor and applying a pass voltage to the gate of the second memory cell transistor, the pass voltage being higher than the read voltage.
2. The method according to claim 1 , further comprising:
applying a third voltage to the first bit line; and
applying a fourth voltage lower than the third voltage to a source line coupled with the first memory unit and the second memory unit.
3. The method according to claim 1 , further comprising:
applying a third voltage lower than the first voltage to the first bit line.
4. The method according to claim 3 wherein the third voltage is larger than the second voltage.
5. The method according to claim 2 , further comprising:
applying a fifth voltage larger than the fourth voltage to a gate of a third select transistor, the third select transistor being coupled between the first memory unit and the source line.
6. The method according to claim 5 further comprising:
applying the fifth voltage to a gate of a fourth select transistor, the fourth select transistor being coupled between the second memory unit and the source line.
7. The method according to claim 4 , further comprising:
applying a fourth voltage lower than the third voltage to a source line coupled with the first memory unit and the second memory unit; and
applying a fifth voltage larger than the fourth voltage to a gate of a third select transistor, the third select transistor being coupled between the first memory unit and the source line.
8. The method according to claim 7 , further comprising:
applying the fifth voltage to a gate of a fourth select transistor, the fourth select transistor being coupled between the second memory unit and the source line.
9. A method for reading data of a first memory cell transistor of a nonvolatile semiconductor memory device comprising:
turning on a first select transistor, the first select transistor being coupled between a first bit line and a first memory unit having the first memory cell transistor and a second memory cell transistor coupled in series, the first memory cell transistor and the second memory cell transistor being arranged in a first direction crossing a surface of a substrate;
turning off a second select transistor, the second select transistor being coupled between the first bit line and a second memory unit having a third memory cell transistor and a fourth memory cell transistor coupled in series, the third memory cell transistor and the fourth memory cell transistor being arranged in the first direction, a gate of the first memory cell transistor being coupled with a gate of the third memory cell transistor, a gate of the second memory cell transistor being coupled with a gate of the fourth memory cell transistor, a gate of the first select transistor not being coupled with a gate of the second select transistor; and
applying a read voltage to the gate of the first memory cell transistor for reading data of the first memory cell transistor and applying a pass voltage to the gate of the second memory cell transistor, the pass voltage being higher than the read voltage.
10. The method according to claim 9 , further comprising:
turning on a third select transistor, the third select transistor being coupled between the first memory unit and a source line.
11. The method according to claim 10 further comprising:
applying a first voltage to a gate a fourth select transistor while the turning on the third select transistor, a gate of the third select transistor being coupled with the gate of the fourth select transistor, the fourth select transistor being coupled between the second memory unit and the source line.
12. The method according to claim 10 , further comprising:
turning off a fifth select transistor, the fifth select transistor being coupled between a second bit line and a third memory unit having a fifth memory cell transistor and a sixth memory cell transistor coupled in series, the fifth memory cell transistor and the sixth memory cell transistor being arranged in the first direction, the gate of the first memory cell transistor being coupled with a gate of the fifth memory cell transistor, the gate of the first select transistor being coupled with a gate of the fifth select transistor.
13. A method for reading data of a first memory cell transistor of a nonvolatile semiconductor memory device, comprising:
applying a first voltage to a gate of a first select transistor of the nonvolatile semiconductor memory device; and
applying a second voltage lower than the first voltage to a gate of a second select transistor of the nonvolatile semiconductor memory device,
wherein the nonvolatile semiconductor memory device has a substrate, a first bit line, a first memory string and a second memory string, the first memory string being coupled with the first bit line, the first memory string extending in a first direction crossing a surface of the substrate, the first memory string having the first select transistor, the first memory cell transistor and a second memory cell transistor coupled in series, the first select transistor being between the first bit line and the first memory cell transistor, the second memory string being coupled with the first bit line, the second memory string having the second select transistor, a third memory cell transistor and a fourth memory cell transistor coupled in series, the second select transistor being between the first bit line and the third memory cell transistor, a gate of the first memory cell transistor being coupled with a gate of the third memory cell transistor, a gate of the second memory cell transistor being coupled with a gate of the fourth memory cell transistor, the gate of the first select transistor not being coupled with the gate of the second select transistor,
wherein the method for reading data of a first memory cell transistor of a nonvolatile semiconductor memory device includes applying a read voltage to the gate of the first memory cell transistor for reading data of the first memory cell transistor and applying a pass voltage to the gate of the second memory cell transistor, the pass voltage being higher than the read voltage.
14. The method according to claim 13 , further comprising:
applying a third voltage to the first bit line; and
applying a fourth voltage lower than the third voltage to a source line coupled with the first memory string and the second memory string.
15. The method according to claim 13 , further comprising:
applying the third voltage lower than the first voltage to the first bit line.
16. The method according to claim 15 , further comprising:
applying the third voltage larger than the second voltage to the first bit line.
17. The method according to claim 14 , further comprising:
applying a fifth voltage larger than the fourth voltage to a gate of a third select transistor, the third select transistor being coupled between the second memory cell transistor and the source line.
18. The method according to claim 17 further comprising:
applying the fifth voltage to a gate of a fourth select transistor, the fourth select transistor being coupled between the fourth memory cell transistor and the source line.
19. The method according to claim 16 , further comprising:
applying a fourth voltage lower than the third voltage to a source line coupled with the first memory string and the second memory string; and
applying a fifth voltage larger than the fourth voltage to a gate of a third select transistor, the third select transistor being coupled between the second memory cell transistor and the source line.
20. The method according to claim 19 , further comprising:
applying the fifth voltage to a gate of a fourth select transistor, the fourth select transistor being coupled between the fourth memory cell transistor and the source line.