IP Library › Granted Patent US 12,436,159
Granted Patent B2
US 12,436,159 · App. 17/775,701 · Granted Oct 7, 2025

Automatic analysis device

Inventors: Takahiro Ando (Tokyo, JP); Sakuichiro Adachi (Tokyo, JP); Yasuhiro Keta (Tokyo, JP); Yuya Matsuoka (Tokyo, JP); Hiromitsu Mori (Tokyo, JP); Shin Imamura (Tokyo, JP); Eiichiro Takada (Tokyo, JP); Makoto Arai (Tokyo, JP)
Assignee: HITACHI HIGH-TECH CORPORATION
G01N35/00584G01N21/33H05B45/10
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Quick Facts
Patent No.
US 12,436,159
App. No.
17/775,701
Granted
Oct 7, 2025
Kind
B2
Abstract

Provided is an automatic analysis device capable of obtaining a stable light intensity over a wide wavelength band by multiplexing a plurality of LED lights and adjusting the temperature characteristics of each LED element. The automatic analysis device according to the present disclosure is configured such that light emitted from a second LED is reflected to be multiplexed on the same optical axis as the light emitted from a first LED, and the first LED and the second LED are in contact with the same temperature adjustment member.

Claims (52)

1. An automatic analyzer for measuring a sample, comprising:

a light source for irradiating a reaction vessel storing the sample with light, and

a temperature adjustment mechanism for adjusting the temperature of the light source,

wherein the light source includes a first LED and a second LED,

wherein the light source is configured such that light emitted from the second LED is reflected on a reflective element to change an optical path, thereby the light emitted from the second LED is multiplexed with light emitted from the first LED on a same optical axis as that of light emitted from the first LED, and

wherein the temperature adjustment mechanism is configured by a member that is in contact with the first LED and the second LED respectively,

wherein a light intensity of the second LED is larger than a light intensity of the first LED,

wherein the light source further includes:

a first optical element that allows at least a part of first light emitted from the first LED to pass; and

a second optical element that reflects second light emitted from the second LED,

wherein the first optical element is configured to reflect at least a part of the second light,

wherein the first optical element and the second optical element are arranged such that the first light having passed through the first optical element and the second light reflected by the first optical element are configured to be multiplexed on a same optical axis to become multiplexed light,

wherein the first LED is a white LED that generates white light in a wavelength range of 350 nm to 800 nm, and

wherein the second LED is an ultraviolet LED that generates ultraviolet light having a central wavelength of 350 nm or less.

2. The automatic analyzer according to claim 1 , wherein the temperature adjustment mechanism is configured by:

one LED mounting substrate for mounting the first LED and the second LED; and

a temperature adjustment unit that adjusts a temperature of the LED mounting substrate to keep a temperature difference between the first LED and the second LED within a predetermined range.

3. The automatic analyzer according to claim 1 , further comprising:

a diffusion member for diffusing the second light.

4. The automatic analyzer according to claim 3 ,

wherein the first light is diffused within a first diffusion range on a light receiving surface of a light receiver that receives the multiplexed light,

wherein the second light is diffused within a second diffusion range on the light receiving surface, and

wherein the diffusion member diffuses the second light such that the first diffusion range is included in the second diffusion range.

5. An automatic analyzer for measuring a sample, comprising:

a light source for irradiating a reaction vessel storing the sample with light, and

a temperature adjustment mechanism for adjusting the temperature of the light source,

wherein the light source includes a first LED and a second LED,

wherein the light source is configured such that light emitted from the second LED is reflected on a reflective element to change an optical path, thereby the light emitted from the second LED is multiplexed with light emitted from the first LED on a same optical axis as that of light emitted from the first LED,

wherein the temperature adjustment mechanism is configured by a member that is in contact with the first LED and the second LED respectively,

wherein a light intensity of the second LED is larger than a light intensity of the first LED,

wherein the light source further includes:

a first optical element that allows at least a part of first light emitted from the first LED to pass; and

a second optical element that reflects second light emitted from the second LED,

wherein the first optical element is configured to reflect at least a part of the second light,

wherein the first optical element and the second optical element are arranged such that the first light having passed through the first optical element and the second light reflected by the first optical element are multiplexed on a same optical axis to become multiplexed light,

wherein the automatic analyzer further includes a diffusion member for diffusing the second light, and

wherein the diffusion member is configured by a diffusion plate that is arranged between the second LED and the second optical element and that diffuses the second light.

6. The automatic analyzer according to claim 5 , wherein

the diffusion member is formed on a reflection surface of the second optical element by processing the reflection surface of the second optical element so as to diffuse the second light.

7. The automatic analyzer according to claim 1 ,

wherein a transmittance at which the first optical element allows the first light to pass is configured such that, on a wavelength spectrum of the multiplexed light:

a first wavelength component has a first light intensity;

a second wavelength component has a second light intensity; and

a third wavelength component has a third light intensity, and

wherein when on a wavelength spectrum of light emitted from a halogen lamp, the first wavelength component has a fourth light intensity, the second wavelength component has a fifth light intensity, and the third wavelength component has a sixth light intensity, the first optical element is configured such that:

a difference between a first ratio of the second light intensity to the first light intensity and a second ratio of the fifth light intensity to the fourth light intensity is within an allowable range; and

a difference between a third ratio of the third light intensity to the second light intensity and a fourth ratio of the sixth light intensity to the fifth light intensity is within the allowable range.

8. The automatic analyzer according to claim 1 , further comprising:

a control unit for adjusting an intensity of light emitted by the light source by adjusting a drive current of the light source and a temperature of the temperature adjustment mechanism.

9. The automatic analyzer according to claim 8 ,

wherein the control unit acquires temperature changes over time in an environment in which the automatic analyzer is installed, and

wherein the control unit sets a target temperature of the temperature adjustment mechanism according to the temperature changes over time.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2022
From: ANDO, TAKAHIRO; ADACHI, SAKUICHIRO; KETA, YASUHIRO; MATSUOKA, YUYA; MORI, HIROMITSU; IMAMURA, SHIN; TAKADA, EIICHIRO; ARAI, MAKOTO
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 059884/0483 →
Priority Claims (1)
JP 2019-209249 · Nov 20, 2019 · national
Continuity (1)
Related Publication 20220397581A1 · Dec 15, 2022
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