IP Library Granted Patent US 12,528,152
Granted Patent B2
US 12,528,152 · App. 17/805,037 · Granted Jan 20, 2026

CMP pad having ultra expanded polymer microspheres

Inventor: Nan-Rong Chiou (Wilmington, DE)
Assignee: Rohm and Haas Electronic Materials CMP Holdings, Inc.
B24B37/24B24D3/28B24D3/32C08G18/10C08G18/3237C08G18/40
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,528,152
App. No.
17/805,037
Granted
Jan 20, 2026
Kind
B2
Abstract

A polishing pad for chemical mechanical polishing comprises a polishing layer which comprises a polymer matrix which is the reaction product of an isocyanate terminated oligomer or polymer, with a curative blend comprising two or more polyamine curatives wherein pores are present in the polymer matrix, such pores being formed by expansion of pre-expanded fluid filled polymeric microspheres such expansion occurring during reaction of the isocyanate terminated oligomer or polymer with the two or more curatives, wherein the polishing layer is characterized by one or more of a ratio of shear loss modulus (G″) at 104° C. to shear loss modulus (G″) at 150° C. of at least 5:1; and a specific gravity of the polishing layer is less than or equal to 95% of a calculated specific gravity for the isocyanate terminated oligomer or polymer, the curative blend and the pre-expanded fluid filled polymeric microspheres.

Claims (13)

1 . A polishing pad for chemical mechanical polishing comprising:

a polishing layer which comprises a polyurethane matrix and 1.63 to 3.9 weight percent of pre-expanded fluid filled polymeric microspheres, the polyurethane matrix is the reaction product of an isocyanate-terminated oligomer or polymer with a curative blend comprising two or more polyamine curatives, wherein pores are present in the polyurethane matrix, such pores being formed by expansion of the pre-expanded fluid filled polymeric microspheres, wherein such expansion occurring during the reaction of the isocyanate-terminated oligomer or polymer with the two or more curatives, wherein

the curative blend comprises a mono-aromatic polyamine curative and a polyamine curative having two or more aromatic rings and wherein the mono-aromatic polyamine curative comprises, dimethylthiotoluenediamine, monomethylthiotoluenediamine, or both, and the polyamine curative having two or more aromatic rings comprises 4,4′-methylene-bis-o-chloroaniline, 4,4′-methylenebis-(3-chloro-2,6-diethylaniline), or both, wherein the mole ratio of the mono-aromatic polyamine curative to the polyamine curative having two or more aromatic rings is 25:75 to 75:25 and

wherein the polishing layer is characterized by

a ratio of shear loss modulus (G″) at 104° C. to shear loss modulus (G″) at 150° C. of about 9:1 to 22:1; and

an actual specific gravity of the polishing layer is less than or equal to 95% of a calculated specific gravity for the isocyanate-terminated oligomer or polymer, the curative blend and the pre-expanded fluid filled polymeric microspheres, and the actual specific gravity of the polishing layer is 0.55 to 0.9 g/cm 3 .

2 . The polishing pad of claim 1 wherein the polyurethane matrix has polyurethane soft segment domains and polyurea-polyurethane hard segment domains.

3 . The polishing pad of claim 1 wherein the polyamine curative having two or more aromatic rings is the 4,4′-methylene-bis-o-chloroaniline.

4 . The polishing pad of claim 1 wherein the isocyanate terminated oligomer or polymer includes a polyether, polyester, polyethylene glycol, polypropylene glycol, polycaprolactone, polycarbonate, or a combination thereof.

5 . The polishing pad of claim 1 wherein the mole ratio of the monoaromatic polyamine curative to the polyamine curative having two or more aromatic rings is 30:70 to 70:30.

6 . The polishing pad of claim 1 wherein the polishing layer has the actual specific gravity of 0.55 to 0.72 g/cm 3 .

7 . The polishing pad of claim 1 wherein the polishing layer has an average pore size is 10% greater than the pore size of the pre-expanded fluid filled polymeric microspheres.

8 . A method comprising providing a substrate comprising Tungsten, polishing the substrate using the polishing pad of claim 1 .

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC.
To: DUPONT ELECTRONIC MATERIALS HOLDING, INC.
Reel/Frame 069274/0160 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2022
From: CHIOU, NAN-RONG
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.
Reel/Frame 060580/0798 →
Continuity (1)
Related Publication 20230390888A1 · Dec 7, 2023
References Cited (22)
US 5578362A · Reinhardt et al. · 1996 [cited by applicant]
US 5811506A · Slagel · 1998 [cited by examiner]
US 7445847B2 · Kulp · 2008 [cited by applicant]
US 9586304B2 · Qian et al. · 2017 [cited by applicant]
US 10391606B2 · Weis et al. · 2019 [cited by applicant]
US 20060089095A1 · Swisher · 2006 [cited by applicant]
US 20090094900A1 · Swisher · 2009 [cited by examiner]
US 20090137120A1 · Huang · 2009 [cited by applicant]
US 20140120809A1 · Qian · 2014 [cited by applicant]
US 20150065014A1 · Jensen · 2015 [cited by applicant]
US 20150273652A1 · Qian · 2015 [cited by applicant]
US 20160176022A1 · Qian · 2016 [cited by applicant]
US 20180281149A1 · Qian · 2018 [cited by applicant]
US 20180345448A1 · Weis · 2018 [cited by applicant]
US 20180345449A1 · Weis · 2018 [cited by applicant]
US 20190061097A1 · Seo · 2019 [cited by examiner]
US 20190168356A1 · Qian · 2019 [cited by applicant]
US 20200215661A1 · Zhu · 2020 [cited by applicant]
US 20210122007A1 · Yun et al. · 2021 [cited by applicant]
US 20230390889A1 · Chiou · 2023 [cited by examiner]
Copending U.S. Appl. No. 17/805,040. [cited by applicant]
Copending U.S. Appl. No. 17/805,044. [cited by applicant]