Electronic device package and fabricating method thereof
Various aspects of the present disclosure provide a semiconductor device, for example comprising a finger print sensor, and a method for manufacturing thereof. Various aspects of the present disclosure may, for example, provide an ultra-slim finger print sensor having a thickness of 500 μm or less that does not include a separate printed circuit board (PCB), and a method for manufacturing thereof.
1. An electronic device comprising:
a semiconductor die comprising a first die side, a second die side opposite the first die side, and a plurality of lateral die sides extending between the first and second die sides, where the first die side comprises an integrated circuit and a bond pad;
an encapsulant that laterally covers the lateral die sides, where the encapsulant comprises a first encapsulant side, a second encapsulant side, and a plurality of lateral encapsulant sides extending between the first and second encapsulant sides;
a vertical interconnect structure passing through the encapsulant, the vertical interconnect structure comprising a first end and a second end;
a first conductor extending over the first die side and over the first encapsulant side, where the first conductor is coupled to the bond pad and to the first end of the vertical interconnect structure;
a second conductor coupled to the second end of the vertical interconnect structure;
a protection structure over the first die side and spaced apart from the first die side, wherein the protection structure forms a first exterior side of the electronic device with no conductive material exposed at the first exterior side;
a first dielectric material between the protection structure and the first die side, the first dielectric material configured to expose an area of the integrated circuit that is free of bond pads;
a second dielectric material on the second encapsulant side and laterally surrounding the second conductor, the second dielectric material forming a second exterior side of the electronic device, opposite the first exterior side; and
an external interconnect coupled to the second end of the vertical interconnect structure by the second conductor, wherein the external interconnect extends beyond the second exterior side formed by the second dielectric layer.
2. The electronic device of claim 1 , wherein the protection structure extends laterally over the vertical interconnect structure.
3. The electronic device of claim 1 , wherein the protection structure extends laterally beyond the plurality of lateral die sides.
4. The electronic device of claim 1 , wherein the protection structure extends laterally to the outermost of the plurality of lateral encapsulant sides.
5. The electronic device of claim 1 , wherein the second encapsulant side is coplanar with the second die side.
6. The electronic device of claim 1 , wherein the second encapsulant side extends beyond the second die side.
7. The electronic device of claim 1 , wherein the external interconnect comprises a solder ball.
8. The electronic device of claim 1 , wherein the external interconnect comprises a land.
9. The electronic device of claim 1 , wherein the first dielectric material contacts at least a portion of the first die side and at least a portion of the first encapsulant side.
10. The electronic device of claim 1 , wherein:
the encapsulant comprises molding compound, and
the encapsulant contacts at least the plurality of lateral die sides.
11. An electronic device comprising:
a semiconductor die comprising a first die side, a second die side opposite the first die side, and a plurality of lateral die sides extending between the first and second die sides, where the first die side comprises a sensor and a bond pad;
a molding compound (MC) that laterally covers the lateral die sides, where the molding compound comprises a first MC side, a second MC side, and a plurality of lateral MC sides extending between the first and second MC sides, wherein the second MC side extends beyond the second die side;
a vertical interconnect structure passing through the molding compound, the vertical interconnect structure comprising a first end and a second end;
a first conductor extending over the first die side and over the first MC side, where the first conductor is coupled to the bond pad and to the first end of the vertical interconnect structure; and
a protection structure over the first die side and spaced apart from the first die side.
12. The electronic device of claim 11 , comprising a dielectric material between the protection structure and the first die side, wherein:
the dielectric material contacts at least a portion of the first die side and at least a portion of the first MC side, and
the dielectric material is configured to expose the sensor to light.
13. The electronic device of claim 11 , comprising a second conductor coupled to the second end of the vertical interconnect structure.
14. The electronic device of claim 13 , comprising a solder ball coupled to the second end of the vertical interconnect structure by the second conductor.
15. The electronic device of claim 13 , comprising a land coupled to the second end of the vertical interconnect structure by the second conductor.
16. The electronic device of claim 11 , wherein the protection structure extends laterally over the vertical interconnect structure.
17. The electronic device of claim 11 , wherein the protection structure extends laterally beyond the plurality of lateral die sides.
18. The electronic device of claim 11 , wherein the protection structure extends laterally to the outermost of the plurality of lateral MC sides.
19. The electronic device of claim 11 , wherein the protection structure forms a first exterior side of the electronic device with no conductive material exposed at the first exterior side.
20. The electronic device of claim 19 , comprising: a second conductor coupled to the second end of the vertical interconnect structure; and a dielectric material on the second MC side and laterally surrounding the second conductor, the dielectric material forming a second exterior side of the electronic device, opposite the first exterior side.