Impedance measurement system
An impedance measurement system configured to measure impedance of a measurement target capable of supplying power to an electrical load device includes one or more processors and one or more memories. The one or more processors are configured to perform a process including: acquiring data about output power from the measurement target when an alternating current signal of at least one frequency is superimposed on the output power; calculating impedance at the at least one frequency with data about an exclusion period when waveform distortion of the output power is detected being excluded; and in a case where how many times the data about the exclusion period is excluded at a certain frequency is greater than or equal to a predetermined threshold value, changing of a setting of an operating condition of an electronic device coupled to the measurement target or the electrical load device.
1. An impedance measurement system configured to measure impedance of a measurement target capable of supplying power to an electrical load device, the impedance measurement system comprising:
one or more processors; and
one or more memories coupled to the one or more processors so as to be capable of communicating with the one or more processors, wherein
the one or more processors are configured to perform a process comprising
acquiring data about output power from the measurement target when an alternating current signal of at least one frequency is superimposed on the output power,
calculating impedance at the at least one frequency with data about an exclusion period in which waveform distortion of the output power is detected being excluded, and
in a case where how many times the data about the exclusion period is excluded at a certain frequency is greater than or equal to a predetermined threshold value, changing a setting of an operating condition of an electronic device coupled to the measurement target or the electrical load device to measure the impedance.
2. The impedance measurement system according to claim 1 , wherein
in the case where how many times the data about the exclusion period is excluded at the certain frequency is greater than or equal to the predetermined threshold value, the processor changes the setting of the operating condition of the electronic device so as to suppress variation in power consumption in the electronic device to measure the impedance.
3. The impedance measurement system according to claim 1 , wherein
the one or more processors identify a frequency of noise included in the data about the exclusion period which is acquired while the alternating current signal is superimposed, to select the electronic device the setting of the operating condition of which is to be changed in accordance with the frequency of the noise.
4. The impedance measurement system according to claim 1 , wherein
the at least one frequency comprises multiple frequencies, and
the one or more processors acquire data about the output power when the alternating current signals of each of the frequencies is superimposed on the output power from the measurement target, sets a weight for the impedance at each of the frequencies based on how many times the data about the exclusion period is excluded at each of the frequencies to calculate an approximate expression indicating relationship between each of the frequencies and the impedance, and diagnoses a state of the measurement target based on the approximate expression.
5. An impedance measurement system configured to measure impedance of a measurement target capable of supplying power to an electrical load device based on output power from the measurement target, the output power being measured when an alternating current signal of at least one frequency is superimposed on the output power, the impedance measurement system comprising:
a superimposed signal generator configured to superimpose the alternating current signal;
an impedance calculator configured to calculate the impedance of the at least one frequency with data about an exclusion period in which waveform distortion of the output power is detected being excluded; and
an auxiliary machine controller configured to, in a case where how many times the data about the exclusion period is excluded at a certain frequency is greater than or equal to a predetermined threshold value, change a setting of an operating condition of an electronic device coupled to the measurement target or the electrical load device.