State identification device, state identification method, and state identification program
There are provided a state determination device, a state determination method, and a state determination program capable of determining a state of an object to be inspected. A state determination device 10 includes an irradiation unit 12 which irradiates an object to be inspected with excitation light under a predetermined irradiation condition, a measurement unit 13 which measures light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light, and a determination unit 15 which determines a state of the object to be inspected by checking the light emission data against light emission data of light emission from the object to be inspected, which is measured in the case where the excitation light is emitted under an irradiation condition common to the light emission data for each state of a substance constituting the object to be inspected.
1. A state determination device comprising:
an irradiation device which irradiates an object to be inspected with excitation light under a predetermined irradiation condition;
a measurement device which measures a first light emission data as light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light; and
a processor which determines a state of the object to be inspected by checking the first light emission data against second light emission data as light emission data of light emission from the object to be inspected, which is measured in a case where the excitation light is emitted under an irradiation condition common to the first light emission data for each state of a substance constituting the object to be inspected, wherein
when the first light emission data is acquired from the object to be inspected in a new or unprocessed state, the second light emission data is acquired from the object to be inspected in a state changed by applying an external factor,
when the first light emission data is acquired from the object to be inspected in the state changed by applying the external factor, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, and
when the first light emission data is acquired from the object to be inspected to which an external factor is being applied, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, or acquired previously from the object to be inspected in the state changed by applying the external factor.
2. The state determination device according to claim 1 , wherein the light emission data of the light emission from the object to be inspected is light emission data of delayed fluorescence and/or phosphorescence from the object to be inspected, which is generated according to the irradiation with the excitation light.
3. The state determination device according to claim 1 , wherein the measurement device includes a high speed camera which photographs the light emission at a frame rate of not less than 100 fps.
4. The state determination device according to claim 1 , wherein the processor reads reference light emission data of the object to be inspected, which is stored in advance in a storage, and determines the state of the object to be inspected by using the reference light emission data that has been read and the first light emission data measured by the measurement device, wherein
when the first light emission data is acquired from the object to be inspected in the new or unprocessed state, the reference light emission data is acquired from the object to be inspected in the state changed by applying the external factor,
when the first light emission data is acquired from the object to be inspected in the state changed by applying the external factor, the reference light emission data is acquired from the object to be inspected in the new or unprocessed state, and
when the first light emission data is acquired from the object to be inspected to which the external factor is being applied, the reference light emission data is acquired from the object to be inspected in the new or unprocessed state, or acquired previously from the object to be inspected in the state changed by applying the external factor.
5. The state determination device according to claim 1 , wherein the processor determines, as the state of the object to be inspected, a degree of deterioration of the object to be inspected by checking light emission data of each deterioration degree of the object to be inspected, which is stored in advance in a storage, against the light emission data measured by the measurement device.
6. The state determination device according to claim 1 , wherein a wavelength of the excitation light is not less than 10 nm.
7. The state determination device according to claim 1 , wherein the light emission data includes light emission data of light emission from the object to be inspected, which is generated after the irradiation with the excitation light is stopped.
8. A state determination device comprising:
an irradiation device which irradiates an object to be inspected with excitation light under a predetermined irradiation condition;
a measurement device which measures light emission data before change as light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light, and measures light emission data after change as light emission data of light emission from the object to be inspected, which is generated according to the irradiation with the excitation light after an external factor of the object to be inspected is changed; and
a processor which determines a state of the object to be inspected based on the change of the external factor of the object to be inspected on a basis of a change degree of the light emission data after change relative to the light emission data before change,
wherein the state of the object to be inspected changed by applying the external factor is any one of, or a combination of, a state in which water serving is added to the object to be inspected, a state in which a pH is different, a state in which an electromagnetic wave is applied to the object to be inspected, a state in which the object to be inspected is heated, a state in which the object to be inspected is exposed to air and various gases, and a state in which mechanical stress is applied to the object to be inspected.
9. The state determination device according to claim 8 , wherein the processor determines, as the state of the object to be inspected, a degree of deterioration of the object to be inspected by checking light emission data of each deterioration degree of the object to be inspected, which is stored in advance in a storage, against the light emission data measured by the measurement device.
10. The state determination device according to claim 8 , wherein a wavelength of the excitation light is not less than 10 nm.
11. The state determination device according to claim 8 , wherein the light emission data includes light emission data of light emission from the object to be inspected, which is generated after the irradiation with the excitation light is stopped.
12. A state determination method comprising:
an irradiation step of irradiating an object to be inspected with excitation light under a predetermined irradiation condition;
a measurement step of measuring first light emission data as light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light; and
a determination step of determining a state of the object to be inspected by checking the first light emission data against second light emission data as light emission data of light emission from the object to be inspected which is measured in a case where the excitation light is emitted under an irradiation condition common to the first light emission data for each state of a substance constituting the object to be inspected, wherein
when the first light emission data is acquired from the object to be inspected in a new or unprocessed state, the second light emission data is acquired from the object to be inspected in a state changed by applying an external factor,
when the first light emission data is acquired from the object to be inspected in the state changed by applying the external factor, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, and
when the first light emission data is acquired from the object to be inspected to which the external factor is being applied, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, or acquired previously from the object to be inspected in the state changed by applying the external factor.
13. The state determination method according to claim 12 , wherein, in the determination step, reference light emission data of the object to be inspected, which is stored in advance in a storage, is read and the state of the object to be inspected is determined by using the reference light emission data that has been read and the first light emission data that has been measured, wherein
when the first light emission data is acquired from the object to be inspected in the new or unprocessed state, the reference light emission data is acquired from the object to be inspected in the state changed by applying the external factor,
when the first light emission data is acquired from the object to be inspected in the state changed by applying the external factor, the reference light emission data is acquired from the object to be inspected in the new or unprocessed state, and
when the first light emission data is acquired from the object to be inspected to which an external factor is being applied, the reference light emission data is acquired from the object to be inspected in the new or unprocessed state, or acquired previously from the object to be inspected in the state changed by applying the external factor.
14. A state determination program causing a computer to execute:
processing of irradiating an object to be inspected with excitation light under a predetermined irradiation condition;
processing of measuring first light emission data as light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light; and
processing of determining a state of the object to be inspected by checking the first light emission data against second light emission data as light emission data of light emission from the object to be inspected, which is measured in a case where the excitation light is emitted under an irradiation condition common to the first light emission data for each state of a substance constituting the object to be inspected, wherein
when the first light emission data is acquired from the object to be inspected in a new or unprocessed state, the second light emission data is acquired from the object to be inspected in a state changed by applying an external factor,
when the first light emission data is acquired from the object to be inspected in the state changed by applying the external factor, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, and
when the first light emission data is acquired from the object to be inspected to which the external factor is being applied, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, or acquired previously from the object to be inspected in the state changed by applying the external factor.
15. A state determination device comprising:
an irradiation device which irradiates an object to be inspected with excitation light under a predetermined irradiation condition;
a measurement device which measures first light emission data as light emission data related to light emission of the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light; and
a processor which determines a state of the object to be inspected based on the first light emission data and second light emission data as light emission data related to light emission, which is generated with a delay in a case where the excitation light is emitted under the predetermined irradiation condition for each state of a substance constituting the object to be inspected, wherein
when the first light emission data is acquired from the object to be inspected in a new or unprocessed state, the second light emission data is acquired from the object to be inspected in a state changed by applying an external factor,
when the first light emission data is acquired from the object to be inspected in the state changed by applying the external factor, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, and
when the first light emission data is acquired from the object to be inspected to which the external factor is being applied, the second light emission data is acquired from the object to be inspected in the new or unprocessed state, or acquired previously from the object to be inspected in the state changed by applying the external factor.