Non-contact angle measuring apparatus
A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.
1. A non-contact angle measuring apparatus, comprising:
a matter-wave and energy (MWE) particle source for generating boson or fermion particles; and
a detector for detecting a plurality peaks or valleys of an interference pattern generated by the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and matter waves associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit, the bump, or the hole are used for deciding an angle between the first plane and the second plane;
wherein the slit, the bump, or the hole has a short side length dimension with a third distance, the energy particle source is associated with one or more equivalent wavelengths, and the more equivalent wavelengths are less than 1/10- 1/20 of the first distance or less than ⅕- 1/10 of the third distance.
2. The non-contact angle measuring apparatus of claim 1 , wherein the second plane is composed of transparent materials, dark materials, dielectric materials, semi-conductive materials, or conductive materials.
3. The non-contact angle measuring apparatus of claim 1 , wherein the angle is defined by the joint region of the first plane and the second plane.
4. The non-contact angle measuring apparatus of claim 1 , wherein the boson or fermion particles emitted by the matter-wave and energy particle source are associated with one or more equivalent MW wavelengths, wherein the one equivalent wavelength is in between 0.1 to 400 nm.
5. The non-contact angle measuring apparatus of claim 4 , wherein the slit, the bump, or the hole has a short side length dimension with a third distance, and the one equivalent wave length is less than 1/10- 1/20 of the first distance or less than ⅕- 1/10 of the third distance.
6. The non-contact angle measuring apparatus of claim 1 , wherein the matter-wave and energy particle source placed at a first side of the first plane, the detector placed at a second side of the first plane, and the second side of the first plane is opposite to the first side of the first plane.
7. The non-contact angle measuring apparatus of claim 1 , wherein the angle is between 15 to 165 degrees, and the detector is located on a third plane or along an arc line directions.
8. The non-contact angle measuring apparatus of claim 1 , wherein the non-contact angle measuring apparatus operates in a partial vacuum and low humidity environment.
9. The non-contact angle measuring apparatus of claim 1 , wherein the first plane is placed along a first direction and the second plan is placed along a second direction, wherein the second direction is different from the first direction.