IP Library Granted Patent US 12,709,699
Granted Patent B2
US 12,709,699 · App. 17/918,193 · Granted Aug 18, 2026

Polishing liquid and polishing method

Inventors: Daisuke Iikura (Tokyo, JP); Masako Aoki (Tokyo, JP)
Assignee: Resonac Corporation
C09G1/02H10P52/403
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Quick Facts
Patent No.
US 12,709,699
App. No.
17/918,193
Granted
Aug 18, 2026
Kind
B2
Abstract

A polishing liquid containing: abrasive grains containing a hydroxide of a tetravalent metal element; a monovalent acid component having no carboxy group; and a non-ionic polymer, in which a pH is 4.5 or less. A polishing method including a step of polishing a surface to be polished by using this polishing liquid.

Claims (22)

1 . A polishing liquid comprising: abrasive grains containing a hydroxide of a tetravalent metal element; a monovalent acid component having no carboxy group;

and a non-ionic polymer, wherein

a mass ratio of a content of the acid component to a content of the hydroxide of the tetravalent metal element is 0.3 or more and 5 or less,

the non-ionic polymer contains a glycerin-based polymer and a polyoxyalkylene compound other than a glycerin-based polymer,

a mass ratio of a content of the glycerin-based polymer to a content of the polyoxyalkylene compound other than a glycerin-based polymer is 10 or more and 100 or less, and

a pH is 4.5 or less.

2 . The polishing liquid according to claim 1 , wherein a pKa of the acid component is 4.50 or less.

3 . The polishing liquid according to claim 1 , wherein the acid component contains a sulfonic acid compound.

4 . The polishing liquid according to claim 1 , further comprising a base component.

5 . The polishing liquid according to claim 4 , wherein the base component contains a pyrazole compound.

6 . The polishing liquid according to claim 1 , wherein the abrasive grains contain cerium hydroxide.

7 . The polishing liquid according to claim 1 , wherein the pH is 3.5 or more.

8 . The polishing liquid according to claim 1 , wherein the polishing liquid is used in polishing of a surface to be polished containing silicon oxide and silicon nitride.

9 . A polishing method comprising a step of polishing a surface to be polished by using the polishing liquid according to claim 1 .

10 . The polishing method according to claim 9 , wherein the surface to be polished contains silicon oxide and silicon nitride.

11 . The polishing liquid according to claim 1 , wherein the acid component contains an aminosulfonic acid compound.

12 . The polishing liquid according to claim 11 , wherein the aminosulfonic acid compound contains at least one selected from the group consisting of aromatic aminosulfonic acid, aliphatic aminosulfonic acid, sulfamic acid, and salts of these.

13 . The polishing liquid according to claim 1 , wherein the acid component contains at least one selected from the group consisting of sulfanilic acid, metanilic acid, sulfamic acid, and salts of these.

14 . The polishing liquid according to claim 1 , wherein the content of the acid component is 0.001 to 1% by mass on the basis of the total mass of the polishing liquid.

15 . The polishing liquid according to claim 1 , comprising no acid component containing a carboxy group.

16 . The polishing liquid according to claim 4 , wherein the base component contains a heterocyclic amine.

17 . The polishing liquid according to claim 1 , wherein the pH is 3.8 or less.

Assignments (3)
CHANGE OF ADDRESS Recorded Feb 9, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066547/0677 →
CHANGE OF NAME Recorded Mar 8, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062992/0805 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 17, 2022
From: IIKURA, DAISUKE; AOKI, MASAKO
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 061439/0967 →
Continuity (1)
Related Publication 20230145080A1 · May 11, 2023
References Cited (31)
US 8728341B2 · Ryuzaki · 2014 [cited by examiner]
US 20120299158A1 · Shinoda · 2012 [cited by examiner]
US 20130143397A1 · Fuller · 2013 [cited by examiner]
US 20130244432A1 · Reiss · 2013 [cited by examiner]
US 20150024596A1 · Minami · 2015 [cited by examiner]
US 20160319159A1 · Minami · 2016 [cited by examiner]
US 20180072917A1 · Kobayashi · 2018 [cited by examiner]
US 20180258319A1 · Akutsu · 2018 [cited by examiner]
US 20190367777A1 · Komatsu · 2019 [cited by examiner]
US 20200032106A1 · Iwano · 2020 [cited by examiner]
US 20200283659A1 · Takahashi · 2020 [cited by examiner]
US 20210017422A1 · Iwano · 2021 [cited by examiner]
US 20210054233A1 · Matsumoto · 2021 [cited by examiner]
US 20210071037A1 · Iwano · 2021 [cited by examiner]
CN 111868202A · 2020 [cited by applicant]
JP H08022970A · 1996 [cited by applicant]
JP H10106994A · 1998 [cited by applicant]
JP 2006249129A · 2006 [cited by applicant]
JP 2010141288A · 2010 [cited by applicant]
JP 2012084906A · 2012 [cited by applicant]
JP 2019153678A · 2019 [cited by applicant]
KR 1020160054466A · 2016 [cited by applicant]
TW 201116614A · 2011 [cited by applicant]
TW 201938747A · 2019 [cited by applicant]
TW 201940652A · 2019 [cited by applicant]
TW 202009286A · 2020 [cited by examiner]
WO 02067309A1 · 2002 [cited by applicant]
WO 2012070541A1 · 2012 [cited by applicant]
WO 2012070542A1 · 2012 [cited by applicant]
WO 2012070544A1 · 2012 [cited by applicant]
TW-202009286-A, Machine Translation. (Year: 2025). [cited by examiner]