Circuit and method for testing a circuit
According to various embodiments, a circuit is described including a plurality of scan flip-flops including a sequence of input wrapper scan flip-flops and including, for each input wrapper scan flip-flop of at least a subset of the input wrapper scan flip-flops, at the input wrapper scan flip-flop's test input a respective test input circuit configured to, when supplied with a mode control signal having a first value, connect the test input to the output of the preceding input wrapper scan flip-flop such that the test input of the flip-flop is supplied with the content of the preceding input wrapper scan flip-flop and when supplied with the mode control signal having a second value, connect the test input to an output of a part of the circuit such that the test input of the flip-flop is supplied with a value depending on a test result.
1. A circuit, comprising:
a plurality of scan flip-flops including a sequence of test flip-flops, each test flip-flop having a D input, a test enable input, a test input and a Q data output,
wherein the circuit comprises, for each test flip-flop of at least a subset of the test flip-flops of the sequence, at the test flip-flop's test input a respective test input circuit having a mode control input, a shift data input, and a capture data input, the test input circuit comprises a combination of logic gates configured to,
when supplied with a mode control signal having a first value indicating a shift mode, pass from the shift data input to the test input of a respective test flip-flop the Q data output of a test flip-flop preceding the respective test flip-flop in the sequence such that the test input of the respective test flip-flop is supplied with a data content of the test flip-flop preceding the respective test flip-flop in the sequence so as to provide a test pattern to the subset of the test flip-flops of the sequence, and
when supplied with the mode control signal having a second value indicating a capture mode, pass from the capture data input to the test input of the respective test flip-flop an output of a part of the circuit to be observed such that the test input of the respective test flip-flop is supplied with a value provided by the part of the circuit so as to capture a test result to the subset of the test flip-flops of the sequence.
2. The circuit of claim 1 , wherein the test input circuit is configured to, in the shift mode, mask the test result provided by the part of the circuit by the second value of the mode control signal.
3. The circuit of claim 1 , wherein the test input circuit is configured to, in the capture mode, combine the test result provided by the part of the circuit with the content of the test flip-flop preceding the respective test flip-flop in the sequence.
4. A method for testing a circuit according to claim 1 comprising:
generating a test pattern;
supplying the test pattern to the circuit;
supplying the mode control signal with the second value to the test input circuits of the test flip-flops of the sub set;
capturing test results generated by the circuit in response to the test pattern by the sequence of test flip-flops;
supplying the mode control signal with the first value to the test input circuits of the test flip-flops of the sub set;
shifting the captured test results through the sequence of test flip-flops to a test output pin of the circuit; and
evaluating the test results generated by the circuit in response to the test pattern.
5. The method of claim 4 , comprising supplying the test pattern to the circuit by supplying the mode control signal with the first value to the test input circuits of the test flip-flops of the sub set and shifting the test pattern into the sequence of test flip-flops.
6. The method of claim 4 , comprising supplying another test pattern to the circuit by the mode control signal with the first value the test input circuits of the test flip-flops of the sub set and shifting the other test pattern into the sequence of test flip-flops;
receiving test results generated by the circuit in response to the other test pattern; and
evaluating the test results generated by the circuit in response to the other test pattern.
7. The method of claim 4 , wherein the part of the circuit is a sub-circuit of the circuit and wherein the circuit comprises a further sequence of test flip-flops, each test flip-flop having a D input, a test enable input, a test input and a data output,
wherein the circuit comprises, for each test flip-flop of at least a subset of the test flip-flops of the further sequence, at the test flip-flop's test input a respective test input circuit comprising a combination of logic gates configured to,
when supplied with a mode control signal having a first value, pass from the shift data input to the test input the output of the test flip-flop preceding the test flip-flop in the sequence such that the test input of the test flip-flop is supplied with the content of the test flip-flop preceding the test flip-flop in the sequence;
when supplied with a mode control signal having a second value, pass from the capture data input to the test input an output of a further sub-circuit of the circuit such that the test input of the test flip-flop is supplied with a value depending on a test result provided by the further sub-circuit;
wherein the test pattern is supplied to the circuit by supplying the first value to the test input circuits of the test flip-flops of the subset of the test flip-flops of the further sequence and shifting the test pattern into the further sequence of test flip-flops.
8. The circuit of claim 1 , wherein the Q data output of the test flip-flop preceding the respective test flip-flop is connected to the shift data input of the test input circuit of the respective test flip-flop, and
wherein the output of the part of the circuit to be observed is connected to the capture data input of the test input circuit of the respective test flip-flop.
9. The circuit of claim 1 , wherein the Q data output of each test flip-flop of the subset is coupled to a sub-circuit which includes the part of the circuit to be observed.
10. The circuit of claim 8 , wherein the combination of logic gates of the test input circuit comprises an OR gate and an NXOR gate, wherein an output of the OR gate is connected to one of the inputs of the NXOR gate.
11. The circuit of claim 10 , wherein another one of the inputs of the NXOR gate comprises the shift data input and one of the inputs of the OR gate comprises the capture data input, and another one of the inputs of the OR gate comprises a mode control input.
12. The circuit of claim 8 , wherein the subset of the test flip-flops of the sequence is configured to shift out the values provided by the part of the circuit to be observed and captured as the test result in the subset of the test flip-flops of the sequence.
13. The circuit of claim 12 , wherein the part of the circuit to be observed is external to the sequence of test flip-flops.
14. The circuit of claim 8 , the respective values provided by the part of the circuit to be observed and captured as the test result in the subset of the test flip-flops of the sequence are generated by the part of the circuit to be observed in response the test pattern to the subset of the test flip-flops of the sequence.
15. The circuit of claim 8 , wherein inputs of a part of the circuit to be tested are configured to be coupled to Q data outputs of the subset of the test flip-flops of the sequence.
16. The circuit of claim 15 , wherein outputs of the part of the circuit to be observed are configured to be coupled to capture data inputs of the subset of the test flip-flops of the sequence.
17. The circuit of claim 16 , wherein the part of the circuit to be tested and the part of the circuit to be observed are the same circuit portion.
18. The circuit of claim 8 , wherein the capture data input is coupled to an XOR tree.