Tester, parallel scan paths, and comparators in same functional circuits
An integrated circuit includes combinational logic with flip-flops, parallel scan paths with a scan input for receiving test stimulus data to be applied to the combinational logic, combinational connections with the combinational logic for applying stimulus data to the combinational logic and receiving response data from the combinational logic, a scan output for transmitting test response data obtained from the combinational logic, and control inputs having an enable input and a select input for operating the parallel scan paths, each scan path includes flip-flops of the combinational logic that, in a test mode, are connected in series, compare circuitry indicates the result of a comparison of the received test response data and the expected data at a fail flag output, and one of the scan paths includes a scan cell having an input coupled to the fail flag output.
1. An integrated circuit comprising:
(a) a test input bus including a stimulus lead and control leads;
(b) a scan input lead;
(c) a scan output lead;
(d) a first core that includes:
(i) first functional logic that includes first functional flip-flops;
(ii) first parallel scan paths, each first parallel scan path including a part of the first functional flip-flops connected in series, a first stimulus input coupled to the stimulus lead, a first response output, and a first control input coupled to the control leads; and
(iii) first compare circuits, there being one first compare circuit for each first parallel scan path, each first compare circuit including the first response input coupled to a first response output, a first scan input coupled to the scan input lead, a first scan output, and a first compare control input coupled to the control leads;
(e) a second core that includes:
(i) second functional logic the same as the first functional logic, the second core including second functional flip-flops;
(ii) second parallel scan paths, each second parallel scan path including a part of the second functional flip-flops connected in series, a second stimulus input coupled to the stimulus lead, a second response output, and a second control input coupled to the control leads; and
(iii) second compare circuits, there being one second compare circuit for each second parallel scan path, each second compare circuit including a second response input coupled to a second response output, a second scan input coupled to the first scan output, a second scan output coupled to the scan output lead, and a second compare control input coupled to the control leads; and
(f) a tester circuitry having inputs connected to the control leads, a first control output connected to the first control input, a first compare control output connected to the first compare control input, a second control output connected to the second control input, and a second compare control output connected to the second compare control input.
2. The integrated circuit of claim 1 in which the first compare circuits each include a
first scan cell connected between the first scan input and the first scan output, and the second compare circuits each include a second scan cell connected between the second scan input and the second scan output, the first and second scan cells being separate from the first and second parallel scan paths.