Semiconductor device

1. A semiconductor device comprising:

a signal pad;

a GND pad;

a plurality of drive transistors electrically connected between a power supply line and a GND line via a signal node that is electrically connected to the signal pad; and

an electrostatic protection mechanism for forming a discharge path from the signal pad to the GND pad when an electrical signal is applied to the signal pad,

wherein the plurality of drive transistors include a transistor to be protected including a drain electrically connected to the signal pad,

wherein the electrostatic protection mechanism includes a gate switch circuit for controlling an electrical connection destination of a gate of the transistor to be protected at the time of the application of the electrical signal, and

wherein the gate switch circuit, at the time of the application of the electrical signal, electrically connects the gate to a first node at a potential that is higher than a potential of the GND line at the time of the formation of the discharge path.

2. The semiconductor device according to claim 1 ,

wherein a first power supply voltage higher than an operating voltage of each of the drive transistors is supplied to the power supply line,

wherein the semiconductor device further comprising a voltage dividing circuit resistively dividing the first power supply voltage, and outputting a second power supply voltage equivalent to the operating voltage to the reference voltage line, and

wherein the first node includes the reference voltage line.

3. The semiconductor device according to claim 1 ,

wherein the power supply line is supplied with a power supply voltage equivalent to the operating voltage of each of the drive transistors, and

wherein the first node includes the power supply line.

4. The semiconductor device according to claim 1 ,

wherein the first node includes the signal node, or, a node electrically connected to the signal node via a resistive element or a diode in a conducting state.

5. The semiconductor device according to claim 1 ,

wherein the electrostatic protection mechanism includes a switch control mechanism for outputting a predetermined voltage to the gate switch circuit in response to the formation of the discharge path, and

wherein the gate switch circuit is operated to electrically connect the gate of the transistor to be protected to the first node when the predetermined voltage is input.

6. The semiconductor device according to claim 5 ,

wherein the switch control mechanism includes:

a current sensing diode arranged to be conductive when a current is generated in the discharge path; and

a control transistor arranged to transmit the predetermined voltage to the gate switch circuit by being turned on in response to conduction of the current sensing diode.

7. The semiconductor device according to claim 6 ,

wherein the predetermined voltage is a ground voltage.

8. The semiconductor device according to claim 6 ,

wherein the predetermined voltage is a power supply voltage that is equal to or higher than an operating voltage of each of the drive transistors.

9. The semiconductor device according to claim 1 ,

wherein the plurality of drive transistors include a plurality of first transistors electrically connected in series between the power supply line and the signal node, and a plurality of second transistors electrically connected in series between the signal node and the GND line, and

wherein the gate switch circuit electrically connects the gate to a second node that supplies a gate voltage for turning on the transistor to be protected when the semiconductor device is operated.

10. The semiconductor device according to claim 9 ,

wherein the gate switch circuit is arranged corresponding to each of a first transistor to be protected including a drain electrically connected to the signal pad among the plurality of first transistors, and a second transistor to be protected including a drain electrically connected to the signal pad among the plurality of second transistors.

11. The semiconductor device according to claim 9 further comprising a plurality of input-output circuits,

wherein each of the plurality of input/output circuits includes a set of the plurality of drive transistors and the signal pad,

the gate switch circuit is shared among N pieces of the plurality of input/output circuits, N being an integer larger than or equal to two, and

wherein, in the N pieces of input/output circuits, the gates of the N pieces of transistors to be protected sharing the gate switch circuit are electrically connected to each other.

12. The semiconductor device according to claim 11 further comprising a switch control mechanism for outputting a predetermined voltage to the gate switch circuit in response to the formation of the discharge path,

wherein the gate switch circuit is operated to electrically connect the gate of the transistor to be protected to the first node when the predetermined voltage is input, and

wherein the gate switch circuit and the switch control mechanism are shared among the N pieces of input/output circuits.

13. The semiconductor device according to claim 1 ,

wherein the plurality of drive transistors include a first transistor electrically connected between the power supply line and the signal node, and a second transistor electrically connected between the signal node and the GND line,

wherein the semiconductor device further comprises an output buffer for generating an output signal from the signal pad at the time of the operation of the semiconductor device, and

wherein the gate switch circuit electrically connects an output node of the output buffer to the gate during operation of the semiconductor device.

14. The semiconductor device according to claim 13 ,

wherein the gate switch circuit is arranged corresponding to each of the first and second transistors.

15. The semiconductor device according to claim 1 ,

wherein the electrical signal is electrical disturbance noise.

16. The semiconductor device according to claim 15 ,

wherein the electrical disturbance noise is an electrostatic discharge, and

wherein the electrostatic discharge includes a test electrical signal simulating the electrostatic discharge.

17. The semiconductor device according to claim 1 ,

wherein the discharge path includes the power supply line and the GND line.