IP Library › Granted Patent US 12,628,693
Granted Patent B2
US 12,628,693 · App. 18/010,378 · Granted May 12, 2026

Semiconductor package and method of manufacturing semiconductor package

Inventors: Dong Woo Park (Seoul, KR); Seong Wook Choi (Seoul, KR)
Assignee: LIPAC CO., LTD.
H01L25/167H01L25/165
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Quick Facts
Patent No.
US 12,628,693
App. No.
18/010,378
Granted
May 12, 2026
Kind
B2
Abstract

A method for forming a package includes: molding a semiconductor chip and a light-emitting element; forming a redistribution layer (RDL) which electrically connects the semiconductor chip to the light-emitting element; and arranging a light-receiving element on the redistribution layer to be electrically connected thereto. The light-receiving element is arranged such that at least a portion thereof is located directly above the semiconductor chip.

Claims (57)

1 . A method of manufacturing a package, comprising operations of:

molding a semiconductor chip and a light-emitting element within a mold;

forming a redistribution layer (RDL) configured to electrically connect the semiconductor chip and the light-emitting element; and

arranging a light-receiving element on the redistribution layer to electrically connect the light-receiving element and the redistribution layer,

wherein the light-receiving element is arranged outside the mold such that at least a portion of the light-receiving element is located directly above the semiconductor chip, wherein the method further comprises:

an operation of attaching a conductive metal pattern to a back surface of the light- emitting element before the molding,

wherein the molding is performed by molding the light-emitting element and the conductive metal pattern attached to the light-emitting element together.

2 . The method of claim 1 , further comprising an operation of attaching a conductive metal pattern to a back surface of the semiconductor chip before the molding,

wherein the molding is performed by molding the semiconductor chip and the conductive metal pattern attached to the semiconductor chip together.

3 . The method of claim 2 , further comprising an operation of exposing the conductive metal pattern attached to the light-emitting element and the conductive metal pattern attached to the semiconductor chip.

4 . The method of claim 1 , wherein the molding is performed by further molding a conductive rod having an external connection terminal formed thereon together with a conductive metal pattern attached to the semiconductor chip and a conductive metal pattern attached to the light-emitting element.

5 . The method of claim 4 , further comprising an operation of exposing the external connection terminal.

6 . The method of claim 4 , wherein the external connection terminal is one of a solder ball, a conductive bump, and a pad.

7 . The method of claim 1 , wherein the molding includes an operation of further molding a sacrificial member having a lower hardness than the mold, and

the method of manufacturing a package further comprises operations of:

perforating the sacrificial member to form a through hole; and

forming a conductive material in the through hole.

8 . The method of claim 1 , wherein the operation of forming the redistribution layer includes operations of:

forming a wire pattern configured to electrically connect the semiconductor chip and the light-emitting element; and

forming an insulating layer configured to passivate the wire pattern, the semiconductor chip, and the light-emitting element.

9 . The method of claim 8 , wherein:

the operation of forming the redistribution layer further includes an operation of forming a pad electrically connected to the wire pattern; and

the operation of forming the pad includes operations of removing the insulating layer to expose the wire pattern, performing plating so that the pad electrically connected to the exposed wire pattern is formed, and coating the pad.

10 . The method of claim 1 , further comprising an operation of forming one of an optical member and a diffuser on an optical path of light provided by the light-emitting element.

11 . The method of claim 10 , further comprising an operation of removing at least a portion of the redistribution layer located on the optical path before forming one of the optical member and the diffuser.

12 . A package comprising:

a light-emitting element;

a light-receiving element;

a semiconductor chip on which a semiconductor circuit is formed;

a mold configured to encapsulate the semiconductor chip and the light-emitting element;

a redistribution layer configured to electrically connect the light-emitting element, the light-receiving element, and the semiconductor chip;

a through via electrically connected to the redistribution layer and passing through the mold; and

an external connection terminal electrically connected to the through via,

wherein at least a portion of the light-receiving element is located directly above the semiconductor chip,

wherein the light-emitting element has a conductive metal pattern attached to a back surface of the light-emitting element,

wherein the mold encapsulates the light-emitting element and the conductive metal pattern attached to the light-emitting element together,

wherein the through via includes a conductive rod that electrically connects the redistribution layer to the external connection terminal, and a shell that is molded together with the conductive rod and encapsulates the conductive rod, and

wherein the light-receiving element is disposed outside the mold.

13 . The package of claim 12 , wherein:

the light-emitting element is one of a vertical cavity surface emitting laser (VCSEL) and a light-emitting diode (LED); and

the light-receiving element is one of a photodiode (PD), a CMOS image sensor (CIS), and a single photon avalanche diode (SPAD).

14 . The package of claim 12 , wherein the semiconductor circuit includes one or more of a light-emitting element driving circuit, a light-receiving element driving circuit, and a time of flight (TOF) arithmetic circuit.

15 . The package of claim 12 , wherein the redistribution layer includes an insulating layer configured to passivate the semiconductor package, and a wire pattern configured to electrically connect the light-emitting element, the light-receiving element, and the semiconductor chip.

16 . The package of claim 12 , wherein an insulating layer is formed as one of a polyimide layer, a polymer layer, and an oxide layer.

17 . The package of claim 12 , wherein the external connection terminal is one of a solder ball, a conductive bump, and a pad.

18 . The package of claim 12 , further comprising one of an optical member and a diffusion member formed on an optical path of the light-emitting element.

19 . The package of claim 18 , wherein:

at least a portion of an insulating layer is removed on the optical path; and

one of a light-emitting element lens unit and a diffusion unit is formed on the optical path.

20 . The package of claim 18 , further comprising:

one of the light-emitting element lens unit and a diffusion unit; and

a holder in which a light-receiving element lens unit formed on an optical path of the light-receiving element is located.

21 . The package of claim 20 , wherein the holder is fixed to the package, a mother substrate on which the package is mounted, or both.

22 . The package of claim 12 , wherein:

the light-emitting element is stacked and located on the conductive metal pattern; and

the light-receiving element is stacked and located on a conductive metal pattern.

23 . The package of claim 12 , wherein the light-receiving element is located above the semiconductor chip.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2022
From: PARK, DONG WOO; CHOI, SEONG WOOK
To: LIPAC CO., LTD.
Reel/Frame 062092/0042 →
Priority Claims (1)
KR 10-2020-0072530 · Jun 15, 2020 · national
Continuity (1)
Related Publication 20230268331A1 · Aug 24, 2023
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