All-reflective microscopy
View Patent ↗Devices, systems and methods related to all-reflective microscopes are described. The microscopes include an all-reflective off-axis optical system and is characterized with substantially zero chromatic aberration, low group delay dispersion and no central obscuration. One reflective microscope configuration includes a reflective objective subsection with at least three mirrors, where at least one mirror is off-axis and non-spherical. The reflective microscope also includes a reflective relay subsection with at least two minors having freeform surfaces and positioned to receive light from the reflective objective subsection. The reflective relay subsystem is configured to produce a magnification to allow coupling of light between two planes having differing beam sizes. The reflective microscope further includes an imaging subsection with at least one mirror having a freeform surface and positioned to receive light from the reflective relay subsection and to direct light received thereon in reflection in a direction of a sensor.
1 . A reflective microscope, comprising:
a reflective objective subsection comprising at least three mirrors, wherein at least one mirror is off-axis and non-spherical;
a reflective relay subsection including at least two mirrors having freeform surfaces and positioned to receive light from the reflective objective subsection, the reflective relay subsection configured to produce a magnification to allow coupling of light between two planes having differing beam sizes; and
an imaging subsection including at least one mirror having a freeform surface and positioned to receive light from the reflective relay subsection and to direct light received thereon in reflection in a direction of a sensor.
2 . The reflective microscope of claim 1 , wherein all components in each of the reflective objective subsection and the reflective relay subsection are configured to direct light in reflection.
3 . The reflective microscope of claim 1 , further including a detector, wherein the detector is either part of the imaging subsection or is a component separate from the imaging subsection, the detector positioned to receive light associated with a sample from one or more reflective surfaces of the imaging subsection, and to produce a signal representative of an image of the sample.
4 . The reflective microscope of claim 1 , wherein the reflective relay subsection includes at least three mirrors, wherein two or more of the at least three mirrors have freeform surfaces.
5 . The reflective microscope of claim 1 , wherein the imaging subsection includes at least two mirrors, wherein one or more of the at least two mirrors has a freeform surface, wherein each of the at least two mirrors are positioned at an angle with respect to an axis associated with light incident on that mirror to allow light received from the reflective relay subsection to undergo at least two reflections in order to be directed in the direction of the sensor.
6 . The reflective microscope of claim 1 , wherein the imaging subsection includes at least three mirrors, wherein two or more of the at least three mirrors have freeform surfaces, wherein each of the at least three mirrors are positioned at an angle with respect to an axis associated with light incident on that mirror to allow light received from the reflective relay subsection to undergo at least three reflections in order to be directed in the direction of the sensor.
7 . The reflective microscope of claim 1 , wherein each of the reflective objective subsection, the reflective relay subsection and the imaging subsection is designed to introduce a peak-valley (P-V) error less than a quarter wave to wavefronts that travel therethrough.
8 . The reflective microscope of claim 1 , wherein at least one reflective surface in each of the reflective objective subsection, the reflective relay subsection and the imaging subsection is a freeform optical surface designed to reduce aberrations in wavefronts that travel through the corresponding subsection.
9 . The reflective microscope of claim 1 , wherein the reflective microscope is operable in a range of wavelengths including ultraviolet to far infrared range of wavelengths with a peak-valley (P-V) error less than a quarter wave imparted on wavefronts that travel therethrough.
10 . The reflective microscope of claim 1 , wherein the reflective microscope is configured to receive an illumination light from a light source for illuminating a sample.
11 . The reflective microscope of claim 10 , wherein the reflective microscope is a point scanning microscope including a scanner to receive the illumination light and to produce a scanning light beam for illumination of the sample, wherein the reflective relay subsection is configured to image the scanner to an entrance pupil of the reflective objective subsection.
12 . The reflective microscope of claim 1 , wherein the reflective objective subsection does not have a central obscuration.