IP Library › Granted Patent US 12,188,877
Granted Patent B2
US 12,188,877 · App. 18/069,954 · Granted Jan 7, 2025

Automated optical double-sided inspection apparatus

Inventors: Yee Siang Gan (Taichung, TW); Sze-Teng Liong (Taichung, TW); Shih-Kai Fan (Taichung, TW); Che-Ming Li (Taichung, TW); Yu-Hsien Lin (Taichung, TW)
Assignee: FENG CHIA UNIVERSITY
G01N21/8851G06T7/0004G01N2021/8841G01N2021/888
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Quick Facts
Patent No.
US 12,188,877
App. No.
18/069,954
Granted
Jan 7, 2025
Kind
B2
Abstract

An automated optical double-sided inspection apparatus includes a first image-capturing portion, a second image-capturing portion, a platform, a first light-blocking portion, a second light-blocking portion, and a processing portion. The platform carries an external object. When the processing portion operates in a first capturing mode, the second light-blocking portion blocks visible light from passing therethrough, while the first light-blocking portion allows visible light to pass therethrough, so that the first image-capturing portion shoots a first side of the external object through the first light-blocking portion to obtain a first image. When the processing portion operates in a second capturing mode, the first light-blocking portion blocks visible light from passing therethrough, while the second light-blocking portion allows visible light to pass therethrough, so that the second image-capturing portion shoots a second side of the external object through the second light-blocking portion to obtain a second image.

Claims (14)

1. An automated optical double-sided inspection apparatus, for inspecting an external object, the external object having a first side and a second side opposite to each other, and the automated optical double-sided inspection apparatus comprising:

a first image-capturing portion;

a second image-capturing portion, separated from the first image-capturing portion;

a platform, located between the first image-capturing portion and the second image-capturing portion, for carrying the external object, in which the first image-capturing portion having a shooting direction pointing to the first side of the external object, and the second image-capturing portion having a shooting direction pointing to the second side of the external object;

a first light-blocking portion, located between the first image-capturing portion and the platform;

a second light-blocking portion, located between the second image-capturing portion and the platform; and

a processing portion, for operating in a first capturing mode or a second capturing mode;

wherein, when the processing portion operates in the first capturing mode, the second light-blocking portion blocks visible light from passing therethrough, while the first light-blocking portion allows visible light to pass therethrough, so that the first image-capturing portion captures the first side of the external object through the first light-blocking portion to obtain a first image; and

when the processing portion operates in the second capturing mode, the first light-blocking portion blocks visible light from passing therethrough, while the second light-blocking portion allows visible light to pass therethrough, so that the second image-capturing portion captures the second side of the external object through the second light-blocking portion to obtain a second image.

2. The automated optical double-sided inspection apparatus of claim 1 , wherein the first image-capturing portion, the first light-blocking portion, the platform, the second light-blocking portion, and the second image-capturing portion are all located on an identical imaginary gravitational benchmark plumb line.

3. The automated optical double-sided inspection apparatus of claim 1 , wherein the first light-blocking portion and the second light-blocking portion each comprise a respective electrochromic material.

4. The automated optical double-sided inspection apparatus of claim 3 , wherein the processing portion adjusts voltages applied to the first light-blocking portion and the second light-blocking portion in terms of magnitude, respectively, so as to make the first light-blocking portion and the second light-blocking portion enter or exit a light-transmitting state or a light-blocking state, respectively, so that the light-blocking portions, when in the light-transmitting state, allows visible light to pass therethrough and when in the light-blocking state, blocks visible light from passing therethrough.

5. The automated optical double-sided inspection apparatus of claim 1 , further comprising an inspection portion, which extracting parts showing the external object from the first image and/or the second image, and inputting the parts to a predetermined training model where the parts are processed using machine learning algorithms, so as to obtain an inspection result.

6. The automated optical double-sided inspection apparatus of claim 5 , wherein the training model is used to recognize whether the external object has any defect, and for any inspected defect, the inspection result contains information of details and a location of the defect.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2022
From: GAN, YEE SIANG; LIONG, SZE-TENG; FAN, SHIH-KAI; LI, CHE-MING; LIN, YU-HSIEN
To: FENG CHIA UNIVERSITY
Reel/Frame 062177/0871 →
Priority Claims (1)
TW 111100174 · Jan 4, 2022 · national
Continuity (1)
Related Publication 20230213457A1 · Jul 6, 2023
References Cited (5)
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US 20200043765A1 · Huang · 2020 [cited by examiner]
CN 209250745U · 2019 [cited by applicant]
TW M616950 · 2021 [cited by applicant]